Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 214 | 3 | ZNO//ZINC OXIDE//GAS SENSOR | 51365 |
| 68 | 2 | ZNO//ZINC OXIDE//ZNO THIN FILMS | 28596 |
| 25433 | 1 | ZINC OXIDE ZNO THIN FILM//WIDE BANDGAP MATERIAL//ADHESION LITHOGRAPHY | 305 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ZINC OXIDE ZNO THIN FILM | authKW | 310000 | 1% | 100% | 3 |
| 2 | WIDE BANDGAP MATERIAL | authKW | 137776 | 1% | 67% | 2 |
| 3 | ADHESION LITHOGRAPHY | authKW | 103333 | 0% | 100% | 1 |
| 4 | ANGLE SENSITIVE DETECTOR | authKW | 103333 | 0% | 100% | 1 |
| 5 | ANNEALED ZNO FILM | authKW | 103333 | 0% | 100% | 1 |
| 6 | BARRIER INHOMOGENIETY | authKW | 103333 | 0% | 100% | 1 |
| 7 | CIRCULAR TLM | authKW | 103333 | 0% | 100% | 1 |
| 8 | COLOR DEPENDENT PHOTO CURRENT | authKW | 103333 | 0% | 100% | 1 |
| 9 | ELECTRICAL DETECTION TECHNIQUE | authKW | 103333 | 0% | 100% | 1 |
| 10 | FAST PHOTOVOLTAGE | authKW | 103333 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 3325 | 66% | 0% | 201 |
| 2 | Materials Science, Coatings & Films | 606 | 10% | 0% | 32 |
| 3 | Physics, Condensed Matter | 572 | 24% | 0% | 73 |
| 4 | Materials Science, Multidisciplinary | 457 | 29% | 0% | 89 |
| 5 | Engineering, Electrical & Electronic | 384 | 23% | 0% | 69 |
| 6 | Nanoscience & Nanotechnology | 257 | 11% | 0% | 33 |
| 7 | Chemistry, Physical | 40 | 11% | 0% | 33 |
| 8 | Physics, Multidisciplinary | 18 | 5% | 0% | 16 |
| 9 | Electrochemistry | 11 | 2% | 0% | 7 |
| 10 | Optics | 2 | 3% | 0% | 8 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | PHYS STEPHENSON | 103333 | 0% | 100% | 1 |
| 2 | UNIT AGRATE BRIANZA | 103333 | 0% | 100% | 1 |
| 3 | V LASHKONYOV SEMICOND PHYS | 103333 | 0% | 100% | 1 |
| 4 | UNIV ECATEPEC | 68886 | 1% | 33% | 2 |
| 5 | ELECT SEMICOND GRP | 51666 | 0% | 50% | 1 |
| 6 | MACDIARMID ADV MAT NANOTECHOL | 51666 | 0% | 50% | 1 |
| 7 | DATF | 34443 | 0% | 33% | 1 |
| 8 | MICRO CELL | 34443 | 0% | 33% | 1 |
| 9 | SEMICONDUCTOR CHEM ENGN | 34443 | 0% | 33% | 1 |
| 10 | MAT DEVICES MICROELECT | 25832 | 0% | 25% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | APPLIED PHYSICS LETTERS | 3425 | 20% | 0% | 61 |
| 2 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 1862 | 3% | 0% | 8 |
| 3 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1013 | 3% | 0% | 9 |
| 4 | JOURNAL OF ELECTRONIC MATERIALS | 991 | 3% | 0% | 10 |
| 5 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | 885 | 1% | 0% | 4 |
| 6 | APPLIED SURFACE SCIENCE | 795 | 6% | 0% | 17 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 728 | 4% | 0% | 11 |
| 8 | MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 660 | 1% | 0% | 4 |
| 9 | CURRENT APPLIED PHYSICS | 574 | 2% | 0% | 5 |
| 10 | IEEE ELECTRON DEVICE LETTERS | 534 | 2% | 0% | 7 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |