Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
596 | 3 | RESISTIVE SWITCHING//MEMRISTOR//RRAM | 14780 |
1398 | 2 | RESISTIVE SWITCHING//MEMRISTOR//RRAM | 8299 |
21567 | 1 | DEFECT TOLERANCE//NEUROMORPHIC NETWORKS//CMOL | 438 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | DEFECT TOLERANCE | authKW | 666292 | 6% | 36% | 26 |
2 | NEUROMORPHIC NETWORKS | authKW | 582836 | 2% | 90% | 9 |
3 | CMOL | authKW | 479695 | 2% | 67% | 10 |
4 | ELECTRONIC NANOTECHNOLOGY | authKW | 359776 | 1% | 100% | 5 |
5 | CROSSBAR ARCHITECTURES | authKW | 287821 | 1% | 100% | 4 |
6 | NASICS | authKW | 287821 | 1% | 100% | 4 |
7 | NANOFABRIC | authKW | 251836 | 2% | 50% | 7 |
8 | PROBABILISTIC CMOS | authKW | 230255 | 1% | 80% | 4 |
9 | EFFECTIVE YIELD | authKW | 224856 | 1% | 63% | 5 |
10 | LOGIC MAPPING | authKW | 224856 | 1% | 63% | 5 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Computer Science, Hardware & Architecture | 11189 | 29% | 0% | 125 |
2 | Nanoscience & Nanotechnology | 4849 | 36% | 0% | 159 |
3 | Engineering, Electrical & Electronic | 3919 | 55% | 0% | 242 |
4 | Physics, Applied | 1072 | 33% | 0% | 145 |
5 | Computer Science, Software Engineering | 766 | 10% | 0% | 44 |
6 | Materials Science, Multidisciplinary | 555 | 27% | 0% | 119 |
7 | Computer Science, Theory & Methods | 359 | 8% | 0% | 37 |
8 | Logic | 159 | 1% | 0% | 6 |
9 | Computer Science, Interdisciplinary Applications | 63 | 4% | 0% | 17 |
10 | Computer Science, Artificial Intelligence | 50 | 3% | 0% | 15 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | HIGH PERFORMANCE IC DESIGN GRP | 191878 | 1% | 67% | 4 |
2 | NANOSYST GRP | 76746 | 1% | 27% | 4 |
3 | ALTERNATE COMP TECHNOL | 71955 | 0% | 100% | 1 |
4 | ARCHITECTURE RELIABIL TESTING ART | 71955 | 0% | 100% | 1 |
5 | ATPG RD GRP | 71955 | 0% | 100% | 1 |
6 | CAD SYST | 71955 | 0% | 100% | 1 |
7 | COMP ENG GRP | 71955 | 0% | 100% | 1 |
8 | CS ECE STAT | 71955 | 0% | 100% | 1 |
9 | ELECT COMP SCI MATH | 71955 | 0% | 100% | 1 |
10 | ELECT SCI GRP | 71955 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | 82167 | 11% | 2% | 46 |
2 | ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS | 75171 | 4% | 6% | 18 |
3 | IEEE DESIGN & TEST OF COMPUTERS | 10474 | 3% | 1% | 12 |
4 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 6498 | 2% | 1% | 10 |
5 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 5046 | 4% | 0% | 16 |
6 | IET COMPUTERS AND DIGITAL TECHNIQUES | 3926 | 1% | 1% | 5 |
7 | NANOTECHNOLOGY | 3431 | 6% | 0% | 26 |
8 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2429 | 3% | 0% | 13 |
9 | MICROELECTRONICS RELIABILITY | 2176 | 3% | 0% | 15 |
10 | MICROELECTRONICS JOURNAL | 1816 | 2% | 0% | 10 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | DEFECT TOLERANCE | 666292 | 6% | 36% | 26 | Search DEFECT+TOLERANCE | Search DEFECT+TOLERANCE |
2 | NEUROMORPHIC NETWORKS | 582836 | 2% | 90% | 9 | Search NEUROMORPHIC+NETWORKS | Search NEUROMORPHIC+NETWORKS |
3 | CMOL | 479695 | 2% | 67% | 10 | Search CMOL | Search CMOL |
4 | ELECTRONIC NANOTECHNOLOGY | 359776 | 1% | 100% | 5 | Search ELECTRONIC+NANOTECHNOLOGY | Search ELECTRONIC+NANOTECHNOLOGY |
5 | CROSSBAR ARCHITECTURES | 287821 | 1% | 100% | 4 | Search CROSSBAR+ARCHITECTURES | Search CROSSBAR+ARCHITECTURES |
6 | NASICS | 287821 | 1% | 100% | 4 | Search NASICS | Search NASICS |
7 | NANOFABRIC | 251836 | 2% | 50% | 7 | Search NANOFABRIC | Search NANOFABRIC |
8 | PROBABILISTIC CMOS | 230255 | 1% | 80% | 4 | Search PROBABILISTIC+CMOS | Search PROBABILISTIC+CMOS |
9 | EFFECTIVE YIELD | 224856 | 1% | 63% | 5 | Search EFFECTIVE+YIELD | Search EFFECTIVE+YIELD |
10 | LOGIC MAPPING | 224856 | 1% | 63% | 5 | Search LOGIC+MAPPING | Search LOGIC+MAPPING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |