Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
| 3805 | 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR//SELECTIVE REMOVAL OF ATOMS//SOLAR PHYS PROD CORP | 1045 |
| 24074 | 1 | SELECTIVE REMOVAL OF ATOMS//SOLAR PHYS PROD CORP//ACOUSTIC DRIVING | 348 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SELECTIVE REMOVAL OF ATOMS | authKW | 362260 | 1% | 100% | 4 |
| 2 | SOLAR PHYS PROD CORP | address | 184893 | 2% | 29% | 7 |
| 3 | ACOUSTIC DRIVING | authKW | 120752 | 1% | 67% | 2 |
| 4 | ATHERMAL DIFFUSION OF DEFECTS | authKW | 90565 | 0% | 100% | 1 |
| 5 | CDTECL MONOCRYSTALS | authKW | 90565 | 0% | 100% | 1 |
| 6 | CO NANOBITS COERCIVITY | authKW | 90565 | 0% | 100% | 1 |
| 7 | DEFECT CHARGE | authKW | 90565 | 0% | 100% | 1 |
| 8 | DYNAMIC ULTRASONIC INFLUENCE | authKW | 90565 | 0% | 100% | 1 |
| 9 | ELECTRICALLY ACTIVE IMPURITIES | authKW | 90565 | 0% | 100% | 1 |
| 10 | HIGH TEMPERATURE ULTRASONIC TREATMENT | authKW | 90565 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 2339 | 43% | 0% | 150 |
| 2 | Physics, Applied | 752 | 31% | 0% | 109 |
| 3 | Acoustics | 180 | 5% | 0% | 16 |
| 4 | Materials Science, Multidisciplinary | 162 | 18% | 0% | 63 |
| 5 | Physics, Multidisciplinary | 129 | 10% | 0% | 36 |
| 6 | Metallurgy & Metallurgical Engineering | 112 | 7% | 0% | 24 |
| 7 | Crystallography | 47 | 4% | 0% | 13 |
| 8 | Instruments & Instrumentation | 10 | 3% | 0% | 9 |
| 9 | Physics, Atomic, Molecular & Chemical | 7 | 3% | 0% | 11 |
| 10 | Materials Science, Coatings & Films | 6 | 1% | 0% | 5 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SOLAR PHYS PROD CORP | 184893 | 2% | 29% | 7 |
| 2 | NPO FIZIKA SOLNTSA | 90565 | 0% | 100% | 1 |
| 3 | SE RI MICRODEVICES STC SINGLE CRISTALS | 90565 | 0% | 100% | 1 |
| 4 | CHEM SYNERGET | 45281 | 0% | 50% | 1 |
| 5 | LV PISARZHEVSKI PHYS CHEM | 45281 | 0% | 50% | 1 |
| 6 | MOL PHYS PHYS MEASUREMENTS | 45281 | 0% | 50% | 1 |
| 7 | UZBEK SCI | 22640 | 0% | 25% | 1 |
| 8 | STARODUBTSEV PHYSICOTECH | 15092 | 0% | 17% | 1 |
| 9 | FIZ SOLNTSE PROD ASSOC | 11319 | 0% | 13% | 1 |
| 10 | CANADIAN PHOTON FABRICAT | 10061 | 0% | 11% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | RUSSIAN ULTRASONICS | 35986 | 2% | 5% | 8 |
| 2 | FIZIKA TVERDOGO TELA | 15300 | 12% | 0% | 43 |
| 3 | METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 8150 | 4% | 1% | 15 |
| 4 | UKRAINSKII FIZICHESKII ZHURNAL | 7026 | 5% | 0% | 16 |
| 5 | TECHNICAL PHYSICS LETTERS | 5415 | 6% | 0% | 20 |
| 6 | SEMICONDUCTORS | 3318 | 5% | 0% | 16 |
| 7 | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI | 3027 | 4% | 0% | 13 |
| 8 | ZHURNAL TEKHNICHESKOI FIZIKI | 2499 | 4% | 0% | 13 |
| 9 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 2321 | 3% | 0% | 12 |
| 10 | SOLID STATE PHENOMENA | 1020 | 1% | 0% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |