Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 389 | 2 | MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//AMORPHOUS SILICON | 17376 |
| 24905 | 1 | POSITION SENSING DETECTORS//CMS ALIGNMENT//AMORPHOUS SILICON SENSORS | 321 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | POSITION SENSING DETECTORS | authKW | 913851 | 3% | 85% | 11 |
| 2 | CMS ALIGNMENT | authKW | 392731 | 1% | 100% | 4 |
| 3 | AMORPHOUS SILICON SENSORS | authKW | 392727 | 2% | 67% | 6 |
| 4 | MULTIPOINT ALIGNMENT | authKW | 294548 | 1% | 100% | 3 |
| 5 | DIRECT AND INVERSE STAEBLER WRONSKI EFFECTS | authKW | 196365 | 1% | 100% | 2 |
| 6 | ELECTROLYTIC TILTMETERS | authKW | 196365 | 1% | 100% | 2 |
| 7 | RADIATION EFFECTS ON SILICON SENSORS | authKW | 196365 | 1% | 100% | 2 |
| 8 | 2 DIMENSIONAL SENSOR | authKW | 98183 | 0% | 100% | 1 |
| 9 | AMORPHOUS CHROMIUM SILICIDE | authKW | 98183 | 0% | 100% | 1 |
| 10 | AMORPHOUS DEVICES | authKW | 98183 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Nuclear Science & Technology | 4753 | 36% | 0% | 114 |
| 2 | Materials Science, Ceramics | 2527 | 18% | 0% | 57 |
| 3 | Instruments & Instrumentation | 2275 | 27% | 0% | 86 |
| 4 | Physics, Nuclear | 2070 | 24% | 0% | 76 |
| 5 | Spectroscopy | 2003 | 22% | 0% | 70 |
| 6 | Physics, Particles & Fields | 1482 | 23% | 0% | 73 |
| 7 | Physics, Applied | 670 | 31% | 0% | 99 |
| 8 | Materials Science, Multidisciplinary | 547 | 31% | 0% | 99 |
| 9 | Engineering, Electrical & Electronic | 347 | 21% | 0% | 68 |
| 10 | COMPUTER APPLICATIONS & CYBERNETICS | 146 | 1% | 0% | 2 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ELE DEVICE | 98183 | 0% | 100% | 1 |
| 2 | ELE ON TECH IND | 98183 | 0% | 100% | 1 |
| 3 | INVEST MEDIOAMBIENTALES TECNOL | 98183 | 0% | 100% | 1 |
| 4 | L BOLTZMANN RADIOL PHYS TUMORDIAGNOST | 98183 | 0% | 100% | 1 |
| 5 | MR EDUC SOC | 98183 | 0% | 100% | 1 |
| 6 | SHANDS HEALTHCARE SYST | 98183 | 0% | 100% | 1 |
| 7 | SSC RUSSIAN FEDERAT | 98183 | 0% | 100% | 1 |
| 8 | THINFILM SILICON PHOTOVOLTA GRP | 98183 | 0% | 100% | 1 |
| 9 | ZENTRUM RADIODIAG | 98183 | 0% | 100% | 1 |
| 10 | DEBYE NANOMAT SCI NANOPHOTON PHYS DEVICES | 49090 | 0% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 13830 | 18% | 0% | 57 |
| 2 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 10864 | 21% | 0% | 68 |
| 3 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 6699 | 11% | 0% | 34 |
| 4 | JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS | 2227 | 1% | 1% | 2 |
| 5 | SOLAR ENERGY MATERIALS AND SOLAR CELLS | 1479 | 3% | 0% | 11 |
| 6 | OPTOELECTRONICS-DEVICES AND TECHNOLOGIES | 1065 | 0% | 1% | 1 |
| 7 | ADVANCES IN X-RAY ANALYSIS | 970 | 0% | 1% | 1 |
| 8 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 678 | 1% | 0% | 3 |
| 9 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 492 | 3% | 0% | 9 |
| 10 | JOURNAL OF APPLIED PHYSICS | 412 | 7% | 0% | 22 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |