Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 389 | 2 | MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//AMORPHOUS SILICON | 17376 |
| 35449 | 1 | SOURCE GATED TRANSISTOR SGT//SOURCE GATED TRANSISTOR//MIPLAZA | 112 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SOURCE GATED TRANSISTOR SGT | authKW | 1172508 | 4% | 83% | 5 |
| 2 | SOURCE GATED TRANSISTOR | authKW | 1125609 | 4% | 100% | 4 |
| 3 | MIPLAZA | address | 316574 | 3% | 38% | 3 |
| 4 | AMORPHOUS METAL OXIDE SEMICONDUCTOR | authKW | 281402 | 1% | 100% | 1 |
| 5 | ANALOGUE SWITCHING | authKW | 281402 | 1% | 100% | 1 |
| 6 | BUILT IN DRIVER LSI | authKW | 281402 | 1% | 100% | 1 |
| 7 | COMPLEMENTARY LOGIC GATE | authKW | 281402 | 1% | 100% | 1 |
| 8 | CONSTANT CURRENT STRESSING | authKW | 281402 | 1% | 100% | 1 |
| 9 | CR A SI H V | authKW | 281402 | 1% | 100% | 1 |
| 10 | CR PA SI H V | authKW | 281402 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Materials Science, Ceramics | 719 | 16% | 0% | 18 |
| 2 | Physics, Applied | 678 | 50% | 0% | 56 |
| 3 | COMPUTER APPLICATIONS & CYBERNETICS | 425 | 2% | 0% | 2 |
| 4 | Engineering, Electrical & Electronic | 274 | 30% | 0% | 34 |
| 5 | Physics, Condensed Matter | 196 | 23% | 0% | 26 |
| 6 | Materials Science, Multidisciplinary | 184 | 30% | 0% | 34 |
| 7 | Materials Science, Coatings & Films | 74 | 6% | 0% | 7 |
| 8 | Microscopy | 6 | 1% | 0% | 1 |
| 9 | Mechanics | 6 | 4% | 0% | 4 |
| 10 | Telecommunications | 2 | 2% | 0% | 2 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MIPLAZA | 316574 | 3% | 38% | 3 |
| 2 | ELECT TECHNOL MATH | 281402 | 1% | 100% | 1 |
| 3 | ENGN TFT LCD MAT TECCHNOL | 281402 | 1% | 100% | 1 |
| 4 | MIPLAZA IL | 281402 | 1% | 100% | 1 |
| 5 | SEPS | 281396 | 4% | 25% | 4 |
| 6 | GREMAN UMR 7347 | 166750 | 4% | 15% | 4 |
| 7 | PL PHYS ELECT MFG ENGN | 160794 | 4% | 14% | 4 |
| 8 | PL CHEM PHYS SCI | 120596 | 3% | 14% | 3 |
| 9 | INSA CVL | 71460 | 4% | 6% | 4 |
| 10 | MAGNET INNOVAT | 46899 | 1% | 17% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | NEC TECHNICAL JOURNAL | 4395 | 1% | 2% | 1 |
| 2 | PROCEEDINGS OF THE SID | 4002 | 2% | 1% | 2 |
| 3 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 3949 | 16% | 0% | 18 |
| 4 | ELECTRONICS | 2853 | 2% | 1% | 2 |
| 5 | PHYSICS IN TECHNOLOGY | 2249 | 1% | 1% | 1 |
| 6 | SOLID-STATE ELECTRONICS | 1797 | 7% | 0% | 8 |
| 7 | PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1401 | 4% | 0% | 4 |
| 8 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 1138 | 7% | 0% | 8 |
| 9 | ADVANCED ELECTRONIC MATERIALS | 569 | 1% | 0% | 1 |
| 10 | INTERNATIONAL JOURNAL OF ELECTRONICS | 510 | 3% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |