Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 197 | 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY | 20765 |
| 31010 | 1 | ANTIFUSE//LOGIC NONVOLATILE MEMORY NVM//MULTITIME PROGRAMMABLE MTP | 174 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | ANTIFUSE | authKW | 1726062 | 10% | 53% | 18 |
| 2 | LOGIC NONVOLATILE MEMORY NVM | authKW | 1086791 | 3% | 100% | 6 |
| 3 | MULTITIME PROGRAMMABLE MTP | authKW | 905659 | 3% | 100% | 5 |
| 4 | ONE TIME PROGRAMMABLE MEMORY | authKW | 754714 | 3% | 83% | 5 |
| 5 | EFUSE | authKW | 724527 | 2% | 100% | 4 |
| 6 | LOGIC NVM | authKW | 579620 | 2% | 80% | 4 |
| 7 | EMBEDDED NONVOLATILE MEMORY ENVM | authKW | 543395 | 2% | 100% | 3 |
| 8 | NITRIDE STORAGE NODE | authKW | 543395 | 2% | 100% | 3 |
| 9 | EMBEDDED FLASH | authKW | 414012 | 2% | 57% | 4 |
| 10 | ONE TIME PROGRAMMABLE OTP | authKW | 411658 | 3% | 45% | 5 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 3373 | 80% | 0% | 139 |
| 2 | Physics, Applied | 577 | 38% | 0% | 66 |
| 3 | Nanoscience & Nanotechnology | 75 | 8% | 0% | 14 |
| 4 | Materials Science, Coatings & Films | 11 | 2% | 0% | 4 |
| 5 | Computer Science, Hardware & Architecture | 11 | 2% | 0% | 3 |
| 6 | Physics, Condensed Matter | 11 | 6% | 0% | 11 |
| 7 | Metallurgy & Metallurgical Engineering | 9 | 3% | 0% | 6 |
| 8 | Materials Science, Multidisciplinary | 3 | 7% | 0% | 12 |
| 9 | Electrochemistry | 3 | 2% | 0% | 3 |
| 10 | Computer Science, Interdisciplinary Applications | 0 | 1% | 0% | 2 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | PLATFORM TECHNOL DEV TEAM | 362264 | 1% | 100% | 2 |
| 2 | CUSTOM FOUNDRY | 181132 | 1% | 100% | 1 |
| 3 | ER CAIANIELLO INFN | 181132 | 1% | 100% | 1 |
| 4 | FAB12 | 181132 | 1% | 100% | 1 |
| 5 | INTERDIPARTIMENTALE RIC NANO MATES | 181132 | 1% | 100% | 1 |
| 6 | NON VOLATILE MEMORY LIB | 181132 | 1% | 100% | 1 |
| 7 | NVM DEVICE | 181132 | 1% | 100% | 1 |
| 8 | PROC INTEGRAT FAB12 | 181132 | 1% | 100% | 1 |
| 9 | STAR GRP | 107331 | 2% | 15% | 4 |
| 10 | CORP SYST LSI | 90565 | 1% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE ELECTRON DEVICE LETTERS | 34466 | 24% | 0% | 42 |
| 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 6092 | 13% | 0% | 23 |
| 3 | ELECTRONIC ENGINEERING | 5363 | 1% | 1% | 2 |
| 4 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | 4782 | 2% | 1% | 4 |
| 5 | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2990 | 1% | 1% | 2 |
| 6 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2586 | 6% | 0% | 11 |
| 7 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2566 | 2% | 0% | 4 |
| 8 | IEICE TRANSACTIONS ON ELECTRONICS | 1455 | 4% | 0% | 7 |
| 9 | JOURNAL OF CENTRAL SOUTH UNIVERSITY | 1108 | 2% | 0% | 4 |
| 10 | MICROELECTRONICS JOURNAL | 732 | 2% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |