Class information for:
Level 1: NAND FLASH MEMORY//FLASH MEMORY//NAND FLASH

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
19176 1                   NAND FLASH MEMORY//FLASH MEMORY//NAND FLASH 541

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NAND FLASH MEMORY authKW 2138308 18% 37% 99
2 FLASH MEMORY authKW 1477843 28% 17% 149
3 NAND FLASH authKW 794682 7% 38% 36
4 FLASH DESIGN TEAM address 599195 2% 86% 12
5 CELL TO CELL INTERFERENCE authKW 529593 2% 91% 10
6 HIGH SPEED PROGRAMMING authKW 529593 2% 91% 10
7 WRITE ONCE MEMORIES authKW 524299 2% 100% 9
8 WOM CODES authKW 466044 1% 100% 8
9 ATOMISTIC DOPING authKW 448114 2% 77% 10
10 ELECTRON INJECTION STATISTICS authKW 349533 1% 100% 6

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 11093 82% 0% 444
2 Physics, Applied 1731 37% 0% 202
3 Computer Science, Hardware & Architecture 1011 8% 0% 43
4 Computer Science, Information Systems 433 8% 0% 43
5 Telecommunications 330 7% 0% 39
6 Nanoscience & Nanotechnology 179 7% 0% 39
7 Physics, Condensed Matter 39 7% 0% 36
8 Computer Science, Theory & Methods 31 3% 0% 15
9 Computer Science, Software Engineering 14 2% 0% 9
10 Engineering, Manufacturing 7 1% 0% 5

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 FLASH DESIGN TEAM 599195 2% 86% 12
2 MEMORY BUSINESS 242918 3% 30% 14
3 PROD QUAL ASSURANCE TEAM 242729 1% 83% 5
4 RD TECHNOL DEV 157277 2% 30% 9
5 MEMORY PROD GRP 129741 1% 32% 7
6 MEMORY DEVICE DESIGN GRP 116511 0% 100% 2
7 NAND DESIGN 116511 0% 100% 2
8 NONVOLATILE MEMORY TECHNOL DEV 116511 0% 100% 2
9 FLASH MEMORY 77673 0% 67% 2
10 FLASH PROD TECHNOL 77673 0% 67% 2

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 28723 16% 1% 88
2 IEEE ELECTRON DEVICE LETTERS 21076 11% 1% 58
3 IEEE JOURNAL OF SOLID-STATE CIRCUITS 17929 9% 1% 51
4 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 6238 2% 1% 11
5 IEEE TRANSACTIONS ON INFORMATION THEORY 6181 6% 0% 32
6 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 4079 3% 0% 16
7 JAPANESE JOURNAL OF APPLIED PHYSICS 2738 5% 0% 28
8 PROCEEDINGS OF THE IEEE 2599 3% 0% 14
9 AT&T BELL LABORATORIES TECHNICAL JOURNAL 2585 0% 2% 2
10 IEICE TRANSACTIONS ON ELECTRONICS 2436 3% 0% 16

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 NAND FLASH MEMORY 2138308 18% 37% 99 Search NAND+FLASH+MEMORY Search NAND+FLASH+MEMORY
2 FLASH MEMORY 1477843 28% 17% 149 Search FLASH+MEMORY Search FLASH+MEMORY
3 NAND FLASH 794682 7% 38% 36 Search NAND+FLASH Search NAND+FLASH
4 CELL TO CELL INTERFERENCE 529593 2% 91% 10 Search CELL+TO+CELL+INTERFERENCE Search CELL+TO+CELL+INTERFERENCE
5 HIGH SPEED PROGRAMMING 529593 2% 91% 10 Search HIGH+SPEED+PROGRAMMING Search HIGH+SPEED+PROGRAMMING
6 WRITE ONCE MEMORIES 524299 2% 100% 9 Search WRITE+ONCE+MEMORIES Search WRITE+ONCE+MEMORIES
7 WOM CODES 466044 1% 100% 8 Search WOM+CODES Search WOM+CODES
8 ATOMISTIC DOPING 448114 2% 77% 10 Search ATOMISTIC+DOPING Search ATOMISTIC+DOPING
9 ELECTRON INJECTION STATISTICS 349533 1% 100% 6 Search ELECTRON+INJECTION+STATISTICS Search ELECTRON+INJECTION+STATISTICS
10 NOR FLASH MEMORY 337043 2% 64% 9 Search NOR+FLASH+MEMORY Search NOR+FLASH+MEMORY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 12255 FLASH TRANSLATION LAYER//NAND FLASH MEMORY//FLASH MEMORY
2 2590 SONOS//FLASH MEMORY//NANOCRYSTAL MEMORY
3 29858 PERMUTATION CODES//PERMUTATION ARRAYS//RANK MODULATION
4 38433 VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM
5 31010 ANTIFUSE//LOGIC NONVOLATILE MEMORY NVM//MULTITIME PROGRAMMABLE MTP
6 13210 CHARGE PUMP//SWITCHED CAPACITOR CONVERTER//CHARGE PUMP CIRCUIT
7 28185 POLAR CODES//SUCCESSIVE CANCELLATION DECODING//CHANNEL POLARIZATION
8 3071 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//OXIDE BREAKDOWN
9 17844 REED SOLOMON CODES//LIST DECODING//REED SOLOMON RS CODES
10 12845 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI

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