Class information for:
Level 1: NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
12845 1                   NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI 907

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI authKW 3467404 17% 64% 157
2 NEGATIVE BIAS TEMPERATURE INSTABILITY authKW 1269231 5% 83% 44
3 NBTI authKW 886045 9% 30% 86
4 BIAS TEMPERATURE INSTABILITY authKW 803089 4% 66% 35
5 REACTION DIFFUSION R D MODEL authKW 562897 2% 90% 18
6 BIAS TEMPERATURE INSTABILITY BTI authKW 469056 3% 50% 27
7 POSITIVE BIAS TEMPERATURE INSTABILITY PBTI authKW 408526 3% 44% 27
8 HOT CARRIER INJECTION HCI authKW 240393 2% 43% 16
9 CHRISTIAN DOPPLER TCAD address 222377 1% 80% 8
10 HOLE TRAPPING authKW 181764 2% 28% 19

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 14113 72% 0% 652
2 Physics, Applied 9278 64% 0% 580
3 Nanoscience & Nanotechnology 3782 23% 0% 206
4 Computer Science, Hardware & Architecture 3202 11% 0% 98
5 Computer Science, Software Engineering 38 2% 0% 18
6 Materials Science, Coatings & Films 34 2% 0% 17
7 Optics 31 4% 0% 36
8 Physics, Condensed Matter 27 5% 0% 47
9 Physics, Multidisciplinary 14 4% 0% 33
10 Computer Science, Information Systems 6 1% 0% 12

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 CHRISTIAN DOPPLER TCAD 222377 1% 80% 8
2 TU PT 138988 0% 100% 4
3 RDO PT 104241 0% 100% 3
4 DEVICE 71784 3% 8% 26
5 DEVICE RELIABIL ELECT CHARACTERIZAT GRP 69494 0% 100% 2
6 RELIABIL GRP 61768 0% 44% 4
7 CHRISTIAN DOPPLER TCAD MICROELECT 50536 0% 36% 4
8 WIDE BANDG SEMICOND MAT DEVICES 36187 1% 21% 5
9 ALLIANCE CROLLES2 34747 0% 100% 1
10 ANALOG ENGN OPERAT ORG 34747 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 159837 8% 6% 72
2 MICROELECTRONICS RELIABILITY 100622 16% 2% 146
3 IEEE ELECTRON DEVICE LETTERS 39657 11% 1% 103
4 IEEE TRANSACTIONS ON ELECTRON DEVICES 30237 13% 1% 117
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 5936 3% 1% 25
6 MICROELECTRONIC ENGINEERING 4299 4% 0% 36
7 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 3457 1% 1% 9
8 IEEE DESIGN & TEST 3098 0% 2% 4
9 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2532 1% 1% 9
10 JAPANESE JOURNAL OF APPLIED PHYSICS 1853 3% 0% 30

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI 3467404 17% 64% 157 Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY+NBTI Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY+NBTI
2 NEGATIVE BIAS TEMPERATURE INSTABILITY 1269231 5% 83% 44 Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY
3 NBTI 886045 9% 30% 86 Search NBTI Search NBTI
4 BIAS TEMPERATURE INSTABILITY 803089 4% 66% 35 Search BIAS+TEMPERATURE+INSTABILITY Search BIAS+TEMPERATURE+INSTABILITY
5 REACTION DIFFUSION R D MODEL 562897 2% 90% 18 Search REACTION+DIFFUSION+R+D+MODEL Search REACTION+DIFFUSION+R+D+MODEL
6 BIAS TEMPERATURE INSTABILITY BTI 469056 3% 50% 27 Search BIAS+TEMPERATURE+INSTABILITY+BTI Search BIAS+TEMPERATURE+INSTABILITY+BTI
7 POSITIVE BIAS TEMPERATURE INSTABILITY PBTI 408526 3% 44% 27 Search POSITIVE+BIAS+TEMPERATURE+INSTABILITY+PBTI Search POSITIVE+BIAS+TEMPERATURE+INSTABILITY+PBTI
8 HOT CARRIER INJECTION HCI 240393 2% 43% 16 Search HOT+CARRIER+INJECTION+HCI Search HOT+CARRIER+INJECTION+HCI
9 HOLE TRAPPING 181764 2% 28% 19 Search HOLE+TRAPPING Search HOLE+TRAPPING
10 NEGATIVE BTI NBTI 173735 1% 100% 5 Search NEGATIVE+BTI+NBTI Search NEGATIVE+BTI+NBTI

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
2 3071 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//OXIDE BREAKDOWN
3 1649 SRAM//PROCESS VARIATION//STATIC RANDOM ACCESS MEMORY SRAM
4 33621 DEUTERIUM ANNEALING//SID4//ADSORPTION HYDROGEN PASSIVATION
5 1776 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
6 19176 NAND FLASH MEMORY//FLASH MEMORY//NAND FLASH
7 116 HFO2//HIGH K DIELECTRICS//HIGH K
8 5396 BORON PENETRATION//NITRIDED OXIDE//SI OXYNITRIDE
9 12310 DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS//ULTRATHIN GATE OXIDE
10 20091 HARDWARE SECURITY//HARDWARE TROJAN//PHYSICAL UNCLONABLE FUNCTION

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