Class information for:
Level 1: DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS//ULTRATHIN GATE OXIDE

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
12310 1                   DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS//ULTRATHIN GATE OXIDE 945

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DIRECT TUNNELING authKW 368339 3% 36% 31
2 QUANTUM MECHANICAL EFFECTS authKW 348969 3% 35% 30
3 ULTRATHIN GATE OXIDE authKW 267272 2% 35% 23
4 WAVE FUNCTION PENETRATION authKW 177859 1% 67% 8
5 DIRECT TUNNELING CURRENT authKW 163409 1% 70% 7
6 LEHRSTUHL HALBLEITERTECH address 158893 1% 53% 9
7 GATE TUNNELING CURRENT authKW 150064 1% 50% 9
8 QUANTUM MECHANICAL EFFECTS QMES authKW 138955 1% 83% 5
9 QUANTUM MECHANICAL QM EFFECTS authKW 133394 1% 67% 6
10 DIRECT TUNNELING DT authKW 119103 1% 71% 5

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Physics, Applied 11609 70% 0% 659
2 Engineering, Electrical & Electronic 9805 59% 0% 560
3 Physics, Condensed Matter 2214 26% 0% 250
4 Nanoscience & Nanotechnology 936 12% 0% 110
5 Materials Science, Coatings & Films 56 2% 0% 21
6 Materials Science, Multidisciplinary 55 9% 0% 86
7 Optics 26 4% 0% 35
8 Engineering, Manufacturing 18 1% 0% 10
9 Materials Science, Ceramics 8 1% 0% 9
10 Computer Science, Hardware & Architecture 3 1% 0% 6

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LEHRSTUHL HALBLEITERTECH 158893 1% 53% 9
2 LASSIDTI 75035 0% 75% 3
3 NETZWERKTHEORIE ALTUNGSTECH 66699 0% 100% 2
4 CPR ND 60027 0% 60% 3
5 SI NANO DEVICE 44465 0% 67% 2
6 ELEKT BAUELEMENTE ALTUNGSTECH 37515 0% 38% 3
7 ADV ELECT SYST INFORMAT COMMUN TECHNO 33350 0% 100% 1
8 ADV SEMICOND DEVICE S 33350 0% 100% 1
9 ARCES IUNET 33350 0% 100% 1
10 CASCADE SCI LTD 33350 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 66578 19% 1% 177
2 SOLID-STATE ELECTRONICS 48111 13% 1% 120
3 IEEE ELECTRON DEVICE LETTERS 10025 6% 1% 53
4 MICROELECTRONICS RELIABILITY 4305 3% 0% 31
5 JOURNAL OF COMPUTATIONAL ELECTRONICS 4163 1% 1% 12
6 SEMICONDUCTORS 3994 3% 0% 29
7 MICROELECTRONIC ENGINEERING 3459 3% 0% 33
8 JOURNAL OF APPLIED PHYSICS 1938 9% 0% 81
9 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 1673 1% 1% 9
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 894 2% 0% 15

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 DIRECT TUNNELING 368339 3% 36% 31 Search DIRECT+TUNNELING Search DIRECT+TUNNELING
2 QUANTUM MECHANICAL EFFECTS 348969 3% 35% 30 Search QUANTUM+MECHANICAL+EFFECTS Search QUANTUM+MECHANICAL+EFFECTS
3 ULTRATHIN GATE OXIDE 267272 2% 35% 23 Search ULTRATHIN+GATE+OXIDE Search ULTRATHIN+GATE+OXIDE
4 WAVE FUNCTION PENETRATION 177859 1% 67% 8 Search WAVE+FUNCTION+PENETRATION Search WAVE+FUNCTION+PENETRATION
5 DIRECT TUNNELING CURRENT 163409 1% 70% 7 Search DIRECT+TUNNELING+CURRENT Search DIRECT+TUNNELING+CURRENT
6 GATE TUNNELING CURRENT 150064 1% 50% 9 Search GATE+TUNNELING+CURRENT Search GATE+TUNNELING+CURRENT
7 QUANTUM MECHANICAL EFFECTS QMES 138955 1% 83% 5 Search QUANTUM+MECHANICAL+EFFECTS+QMES Search QUANTUM+MECHANICAL+EFFECTS+QMES
8 QUANTUM MECHANICAL QM EFFECTS 133394 1% 67% 6 Search QUANTUM+MECHANICAL+QM+EFFECTS Search QUANTUM+MECHANICAL+QM+EFFECTS
9 DIRECT TUNNELING DT 119103 1% 71% 5 Search DIRECT+TUNNELING+DT Search DIRECT+TUNNELING+DT
10 GATE CAPACITANCE 110767 1% 24% 14 Search GATE+CAPACITANCE Search GATE+CAPACITANCE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 3071 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//OXIDE BREAKDOWN
2 7073 NETWORK COMPUTAT NANOTECHNOL//BALLISTIC TRANSPORT//QUASI BALLISTIC TRANSPORT
3 116 HFO2//HIGH K DIELECTRICS//HIGH K
4 9421 EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS
5 5396 BORON PENETRATION//NITRIDED OXIDE//SI OXYNITRIDE
6 29633 CURRENT TRANSFORMATION COEFFICIENT//GE SCHOTTKY PHOTODETECTOR//ITO N SI PHOTODETECTOR
7 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
8 33729 AUGER TRANSISTOR//SELF CONSISTENT QUANTUM WELLS//AL SIO2 N SI
9 34428 AL CR FILM//CARBONIC STRUCTURES//EDS SPECTRA
10 22635 CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE

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