Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
| 3805 | 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR//SELECTIVE REMOVAL OF ATOMS//SOLAR PHYS PROD CORP | 1045 |
| 29633 | 1 | CURRENT TRANSFORMATION COEFFICIENT//GE SCHOTTKY PHOTODETECTOR//ITO N SI PHOTODETECTOR | 200 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CURRENT TRANSFORMATION COEFFICIENT | authKW | 157584 | 1% | 100% | 1 |
| 2 | GE SCHOTTKY PHOTODETECTOR | authKW | 157584 | 1% | 100% | 1 |
| 3 | ITO N SI PHOTODETECTOR | authKW | 157584 | 1% | 100% | 1 |
| 4 | L H JUNCTION | authKW | 157584 | 1% | 100% | 1 |
| 5 | LEAKY INSULATOR | authKW | 157584 | 1% | 100% | 1 |
| 6 | SILICON CAPACITOR | authKW | 157584 | 1% | 100% | 1 |
| 7 | SIOX AL STRUCTURE | authKW | 157584 | 1% | 100% | 1 |
| 8 | TRANSPARENT CONDUCTORS ITO AZO | authKW | 157584 | 1% | 100% | 1 |
| 9 | PHOTOELECT ENERGY DEVICE PLICAT | address | 63031 | 1% | 20% | 2 |
| 10 | AMORPHOUS SIOX | authKW | 52527 | 1% | 33% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 1801 | 50% | 0% | 99 |
| 2 | Physics, Applied | 486 | 33% | 0% | 66 |
| 3 | Physics, Multidisciplinary | 86 | 11% | 0% | 22 |
| 4 | Engineering, Electrical & Electronic | 36 | 11% | 0% | 21 |
| 5 | Materials Science, Multidisciplinary | 33 | 13% | 0% | 25 |
| 6 | Instruments & Instrumentation | 27 | 5% | 0% | 9 |
| 7 | Materials Science, Coatings & Films | 16 | 3% | 0% | 5 |
| 8 | Multidisciplinary Sciences | 4 | 1% | 0% | 2 |
| 9 | Materials Science, Characterization, Testing | 2 | 1% | 0% | 1 |
| 10 | Crystallography | 0 | 1% | 0% | 2 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | PHOTOELECT ENERGY DEVICE PLICAT | 63031 | 1% | 20% | 2 |
| 2 | INAOE | 24240 | 1% | 8% | 2 |
| 3 | MEASUREMENT ANAL | 2315 | 1% | 1% | 1 |
| 4 | AF IOFFE PHYSICOTECH | 1822 | 4% | 0% | 8 |
| 5 | YAROSLAVL BRANCH | 1789 | 1% | 1% | 1 |
| 6 | FED STATE UNITARY ENTERPRISE | 1239 | 1% | 1% | 1 |
| 7 | CEMOP | 1124 | 1% | 1% | 1 |
| 8 | STATE SCI RUSSIAN FEDERAT | 595 | 1% | 0% | 1 |
| 9 | CFM | 415 | 1% | 0% | 1 |
| 10 | ELECT COMMUN | 329 | 2% | 0% | 3 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 45260 | 20% | 1% | 40 |
| 2 | SEMICONDUCTORS | 27818 | 18% | 1% | 35 |
| 3 | UKRAINSKII FIZICHESKII ZHURNAL | 15507 | 9% | 1% | 18 |
| 4 | MICROWAVES | 14655 | 1% | 5% | 2 |
| 5 | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI | 10149 | 9% | 0% | 18 |
| 6 | TECHNICAL PHYSICS LETTERS | 1904 | 5% | 0% | 9 |
| 7 | SENSORS AND ACTUATORS A-PHYSICAL | 987 | 4% | 0% | 8 |
| 8 | GEC JOURNAL OF RESEARCH | 914 | 1% | 1% | 1 |
| 9 | DOKLADY AKADEMII NAUK BELARUSI | 871 | 2% | 0% | 4 |
| 10 | ZHURNAL TEKHNICHESKOI FIZIKI | 640 | 3% | 0% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |