Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 519 | 3 | TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY | 21306 |
| 2120 | 2 | AVALANCHE PHOTODIODE//IMPACT IONIZATION//EXCESS NOISE FACTOR | 5460 |
| 7054 | 1 | AVALANCHE PHOTODIODE//EXCESS NOISE FACTOR//IMPACT IONIZATION | 1438 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | AVALANCHE PHOTODIODE | authKW | 651304 | 9% | 22% | 134 |
| 2 | EXCESS NOISE FACTOR | authKW | 470963 | 2% | 61% | 35 |
| 3 | IMPACT IONIZATION | authKW | 466113 | 7% | 21% | 102 |
| 4 | AVALANCHE PHOTODIODES APDS | authKW | 226040 | 2% | 37% | 28 |
| 5 | AVALANCHE PHOTODIODE APD | authKW | 219970 | 2% | 31% | 32 |
| 6 | AVALANCHE MULTIPLICATION | authKW | 213042 | 2% | 29% | 33 |
| 7 | MULTIPLICATION GAIN | authKW | 199229 | 1% | 91% | 10 |
| 8 | DEAD SPACE EFFECT | authKW | 177513 | 1% | 90% | 9 |
| 9 | IONIZATION COEFFICIENT | authKW | 129234 | 1% | 35% | 17 |
| 10 | EXCESS NOISE | authKW | 127018 | 1% | 29% | 20 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 12308 | 54% | 0% | 778 |
| 2 | Physics, Applied | 10763 | 55% | 0% | 794 |
| 3 | Optics | 4190 | 23% | 0% | 335 |
| 4 | Telecommunications | 1124 | 8% | 0% | 116 |
| 5 | Physics, Condensed Matter | 1094 | 16% | 0% | 232 |
| 6 | Materials Science, Multidisciplinary | 82 | 9% | 0% | 130 |
| 7 | Physics, Multidisciplinary | 46 | 4% | 0% | 63 |
| 8 | COMPUTER APPLICATIONS & CYBERNETICS | 30 | 0% | 0% | 2 |
| 9 | Spectroscopy | 4 | 1% | 0% | 17 |
| 10 | Nanoscience & Nanotechnology | 4 | 2% | 0% | 24 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | FDN STUDIES EXTENS EDUC | 68482 | 0% | 63% | 5 |
| 2 | C4ISR GRP | 43831 | 0% | 100% | 2 |
| 3 | GRP C4ISR | 43831 | 0% | 100% | 2 |
| 4 | CORP ND | 29219 | 0% | 67% | 2 |
| 5 | ADV DEVICES TECHNOL | 21915 | 0% | 100% | 1 |
| 6 | ADV PHOTON DEVICE GRP | 21915 | 0% | 100% | 1 |
| 7 | DIGITAL DEVICE ENGN GRP | 21915 | 0% | 100% | 1 |
| 8 | ELE O OPT PROD | 21915 | 0% | 100% | 1 |
| 9 | ELECT ENGN OPTELECT TECHNOL | 21915 | 0% | 100% | 1 |
| 10 | ELECT MICROOPTOLE ON MONTPELLIER | 21915 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 23832 | 9% | 1% | 131 |
| 2 | IEEE JOURNAL OF QUANTUM ELECTRONICS | 14283 | 5% | 1% | 75 |
| 3 | IEE PROCEEDINGS-J OPTOELECTRONICS | 7788 | 1% | 3% | 13 |
| 4 | ELECTRONICS LETTERS | 6312 | 8% | 0% | 108 |
| 5 | SOLID-STATE ELECTRONICS | 5863 | 4% | 1% | 52 |
| 6 | IEEE PHOTONICS TECHNOLOGY LETTERS | 5861 | 5% | 0% | 67 |
| 7 | JOURNAL OF LIGHTWAVE TECHNOLOGY | 5854 | 4% | 0% | 58 |
| 8 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 5376 | 3% | 1% | 45 |
| 9 | ELECTRON DEVICE LETTERS | 3554 | 0% | 2% | 7 |
| 10 | JOURNAL OF APPLIED PHYSICS | 3453 | 9% | 0% | 133 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |