Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
519 | 3 | TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY | 21306 |
1434 | 2 | TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY | 8140 |
1536 | 2 | PHOTODIODE//PHOTODETECTORS//ENGINEERING, ELECTRICAL & ELECTRONIC | 7706 |
2120 | 2 | AVALANCHE PHOTODIODE//IMPACT IONIZATION//EXCESS NOISE FACTOR | 5460 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | TERAHERTZ | authKW | 298027 | 3% | 34% | 590 |
2 | TERAHERTZ TIME DOMAIN SPECTROSCOPY | authKW | 173412 | 1% | 72% | 164 |
3 | TERAHERTZ SPECTROSCOPY | authKW | 152063 | 1% | 56% | 183 |
4 | TERAHERTZ WAVE | authKW | 125347 | 1% | 56% | 152 |
5 | ENGINEERING, ELECTRICAL & ELECTRONIC | WoSSC | 108301 | 42% | 1% | 9032 |
6 | PHOTOCONDUCTIVE ANTENNA | authKW | 96204 | 0% | 96% | 68 |
7 | JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES | journal | 93516 | 1% | 26% | 247 |
8 | IEEE TRANSACTIONS ON ELECTRON DEVICES | journal | 91647 | 5% | 6% | 994 |
9 | IMPACT IONIZATION | authKW | 89151 | 1% | 35% | 172 |
10 | PHYSICS, APPLIED | WoSSC | 87736 | 42% | 1% | 8922 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 108301 | 42% | 1% | 9032 |
2 | Physics, Applied | 87736 | 42% | 1% | 8922 |
3 | Optics | 66446 | 24% | 1% | 5123 |
4 | Physics, Condensed Matter | 7950 | 12% | 0% | 2564 |
5 | Telecommunications | 3362 | 4% | 0% | 854 |
6 | Physics, Multidisciplinary | 2357 | 7% | 0% | 1389 |
7 | Nanoscience & Nanotechnology | 701 | 3% | 0% | 647 |
8 | Instruments & Instrumentation | 347 | 2% | 0% | 465 |
9 | Materials Science, Multidisciplinary | 316 | 7% | 0% | 1419 |
10 | Spectroscopy | 250 | 2% | 0% | 347 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | TERAHERTZ | 51556 | 0% | 37% | 95 |
2 | BEIJING TERAHERTZ SPECT IMAGING | 48946 | 0% | 45% | 74 |
3 | THZ | 37196 | 0% | 43% | 59 |
4 | TERAHERTZ MEASUREMENT SYST | 22244 | 0% | 94% | 16 |
5 | TERAHERTZ OPTOELECT | 18750 | 0% | 28% | 45 |
6 | LASER OPTOELECT | 18692 | 0% | 20% | 63 |
7 | MILLIMETER WAVE INNOVAT TECHNOL | 18409 | 0% | 39% | 32 |
8 | PHOTO DYNAM | 18093 | 0% | 88% | 14 |
9 | FLUCTUAT | 17779 | 0% | 71% | 17 |
10 | PRECIS RUMENT OPTOELECT ENGN | 15894 | 1% | 9% | 118 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES | 93516 | 1% | 26% | 247 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 91647 | 5% | 6% | 994 |
3 | IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | 78867 | 1% | 30% | 177 |
4 | SOLID-STATE ELECTRONICS | 60673 | 3% | 6% | 645 |
5 | ELECTRONICS LETTERS | 53434 | 6% | 3% | 1216 |
6 | APPLIED PHYSICS LETTERS | 46315 | 9% | 2% | 1916 |
7 | IEEE ELECTRON DEVICE LETTERS | 36356 | 2% | 5% | 483 |
8 | IEEE PHOTONICS TECHNOLOGY LETTERS | 23618 | 2% | 3% | 523 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 20996 | 2% | 4% | 345 |
10 | OPTICS EXPRESS | 20026 | 3% | 2% | 713 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 3 |