Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
695 | 2 | SILICON CARBIDE//4H SIC//SIC | 13432 |
1718 | 2 | IGBT//LDMOS//POWER MOSFET | 6942 |
3941 | 2 | NONEQUILIBRIUM CHARGE CARRIERS//REVERSELY SWITCHED DYNISTOR RSD//NONEQUILIBRIUM CARRIERS | 879 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SILICON CARBIDE | authKW | 957070 | 8% | 37% | 1755 |
2 | 4H SIC | authKW | 628017 | 2% | 84% | 507 |
3 | SIC | authKW | 442547 | 5% | 30% | 1013 |
4 | MATERIALS SCIENCE FORUM | journal | 285207 | 9% | 11% | 1833 |
5 | SILICON CARBIDE SIC | authKW | 248048 | 1% | 65% | 256 |
6 | 3C SIC | authKW | 241638 | 1% | 81% | 202 |
7 | POWER MOSFET | authKW | 170453 | 1% | 60% | 192 |
8 | 6H SIC | authKW | 160464 | 1% | 63% | 173 |
9 | BREAKDOWN VOLTAGE | authKW | 149978 | 1% | 35% | 288 |
10 | MICROPIPE | authKW | 147413 | 1% | 89% | 112 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 79359 | 40% | 1% | 8511 |
2 | Engineering, Electrical & Electronic | 74724 | 36% | 1% | 7602 |
3 | Physics, Condensed Matter | 31537 | 22% | 1% | 4581 |
4 | Materials Science, Multidisciplinary | 29389 | 28% | 0% | 5993 |
5 | Materials Science, Coatings & Films | 16819 | 7% | 1% | 1447 |
6 | Materials Science, Characterization, Testing | 11609 | 3% | 1% | 654 |
7 | Nanoscience & Nanotechnology | 9246 | 8% | 0% | 1720 |
8 | Crystallography | 1918 | 3% | 0% | 678 |
9 | Materials Science, Ceramics | 1269 | 2% | 0% | 403 |
10 | Physics, Multidisciplinary | 1047 | 5% | 0% | 1060 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PHYS MEASUREMENT TECHNOL | 111886 | 2% | 22% | 346 |
2 | POWER SEMICOND | 39733 | 0% | 73% | 37 |
3 | ADV POWER DEVICE | 35598 | 0% | 96% | 25 |
4 | MARINE ELECT | 34647 | 0% | 46% | 51 |
5 | ASIC SYST ENGN | 31363 | 0% | 30% | 72 |
6 | ETUD SEMICOND GRP | 30755 | 0% | 20% | 105 |
7 | MAT SCI 6 | 29598 | 0% | 36% | 55 |
8 | ULTRA LOW LOSS POWER DEVICE TECHNOL BODY | 26729 | 0% | 95% | 19 |
9 | WIDE BAND G SEMICOND MAT DEVICES | 22919 | 0% | 20% | 78 |
10 | FG NANOTECHNOL | 22368 | 0% | 66% | 23 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MATERIALS SCIENCE FORUM | 285207 | 9% | 11% | 1833 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 124208 | 5% | 7% | 1154 |
3 | MICROELECTRONICS RELIABILITY | 80202 | 3% | 9% | 635 |
4 | SOLID-STATE ELECTRONICS | 72801 | 3% | 7% | 705 |
5 | IEEE ELECTRON DEVICE LETTERS | 51691 | 3% | 6% | 574 |
6 | IEEE TRANSACTIONS ON POWER ELECTRONICS | 44465 | 2% | 7% | 471 |
7 | SEMICONDUCTORS | 25401 | 2% | 5% | 349 |
8 | MICROELECTRONICS JOURNAL | 23718 | 1% | 6% | 253 |
9 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 16799 | 1% | 4% | 293 |
10 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 16546 | 1% | 10% | 114 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SILICON CARBIDE | 957070 | 8% | 37% | 1755 | Search SILICON+CARBIDE | Search SILICON+CARBIDE |
2 | 4H SIC | 628017 | 2% | 84% | 507 | Search 4H+SIC | Search 4H+SIC |
3 | SIC | 442547 | 5% | 30% | 1013 | Search SIC | Search SIC |
4 | SILICON CARBIDE SIC | 248048 | 1% | 65% | 256 | Search SILICON+CARBIDE+SIC | Search SILICON+CARBIDE+SIC |
5 | 3C SIC | 241638 | 1% | 81% | 202 | Search 3C+SIC | Search 3C+SIC |
6 | POWER MOSFET | 170453 | 1% | 60% | 192 | Search POWER+MOSFET | Search POWER+MOSFET |
7 | 6H SIC | 160464 | 1% | 63% | 173 | Search 6H+SIC | Search 6H+SIC |
8 | BREAKDOWN VOLTAGE | 149978 | 1% | 35% | 288 | Search BREAKDOWN+VOLTAGE | Search BREAKDOWN+VOLTAGE |
9 | MICROPIPE | 147413 | 1% | 89% | 112 | Search MICROPIPE | Search MICROPIPE |
10 | SPECIFIC ON RESISTANCE | 140491 | 0% | 91% | 104 | Search SPECIFIC+ON+RESISTANCE | Search SPECIFIC+ON+RESISTANCE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 3 |