Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | IGBT | authKW | 360444 | 2% | 61% | 131 |
2 | LDMOS | authKW | 357366 | 2% | 69% | 114 |
3 | POWER MOSFET | authKW | 340551 | 2% | 48% | 155 |
4 | JUNCTION TEMPERATURE | authKW | 303759 | 2% | 63% | 107 |
5 | SPECIFIC ON RESISTANCE | authKW | 294376 | 1% | 75% | 86 |
6 | INSULATED GATE BIPOLAR TRANSISTOR IGBT | authKW | 273281 | 1% | 63% | 96 |
7 | BREAKDOWN VOLTAGE | authKW | 217462 | 3% | 24% | 198 |
8 | MICROELECTRONICS RELIABILITY | journal | 208352 | 8% | 8% | 582 |
9 | IEEE TRANSACTIONS ON ELECTRON DEVICES | journal | 205971 | 12% | 5% | 845 |
10 | POWER SEMICONDUCTOR DEVICES | authKW | 176354 | 1% | 41% | 96 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 111695 | 73% | 1% | 5071 |
2 | Physics, Applied | 24648 | 39% | 0% | 2717 |
3 | Nanoscience & Nanotechnology | 9294 | 13% | 0% | 927 |
4 | Computer Science, Hardware & Architecture | 2472 | 4% | 0% | 253 |
5 | Physics, Condensed Matter | 1606 | 10% | 0% | 694 |
6 | Engineering, Manufacturing | 1299 | 3% | 0% | 185 |
7 | Engineering, General | 840 | 3% | 0% | 221 |
8 | Materials Science, Multidisciplinary | 722 | 11% | 0% | 747 |
9 | Optics | 665 | 6% | 0% | 385 |
10 | Thermodynamics | 376 | 2% | 0% | 173 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MARINE ELECT | 98107 | 1% | 44% | 49 |
2 | ASIC SYST ENGN | 96314 | 1% | 30% | 72 |
3 | STATE ELECT THIN FILMS INTEGRATED DEVIC | 47832 | 3% | 6% | 174 |
4 | FUJIAN ENGN SOLID STATE LIGHTING | 45735 | 0% | 46% | 22 |
5 | RELIABLE POWER ELECT | 33414 | 0% | 82% | 9 |
6 | ELE ON DEVICES | 32019 | 0% | 23% | 31 |
7 | LIGHTING SOURCES MAT | 27794 | 0% | 88% | 7 |
8 | POWER ELECT SYST | 25370 | 1% | 10% | 55 |
9 | SAGE ENISO | 23337 | 0% | 86% | 6 |
10 | ANALOGUE INTEGRATED CIRCUITS | 22966 | 0% | 56% | 9 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MICROELECTRONICS RELIABILITY | 208352 | 8% | 8% | 582 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 205971 | 12% | 5% | 845 |
3 | IEEE TRANSACTIONS ON POWER ELECTRONICS | 126543 | 6% | 6% | 451 |
4 | SOLID-STATE ELECTRONICS | 79790 | 6% | 4% | 420 |
5 | IEEE ELECTRON DEVICE LETTERS | 54100 | 5% | 4% | 334 |
6 | MICROELECTRONICS JOURNAL | 51156 | 3% | 5% | 211 |
7 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 50229 | 2% | 10% | 113 |
8 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 30345 | 1% | 8% | 87 |
9 | JOURNAL OF ELECTRONIC PACKAGING | 19490 | 1% | 6% | 74 |
10 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 15863 | 1% | 5% | 71 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | IGBT | 360444 | 2% | 61% | 131 | Search IGBT | Search IGBT |
2 | LDMOS | 357366 | 2% | 69% | 114 | Search LDMOS | Search LDMOS |
3 | POWER MOSFET | 340551 | 2% | 48% | 155 | Search POWER+MOSFET | Search POWER+MOSFET |
4 | JUNCTION TEMPERATURE | 303759 | 2% | 63% | 107 | Search JUNCTION+TEMPERATURE | Search JUNCTION+TEMPERATURE |
5 | SPECIFIC ON RESISTANCE | 294376 | 1% | 75% | 86 | Search SPECIFIC+ON+RESISTANCE | Search SPECIFIC+ON+RESISTANCE |
6 | INSULATED GATE BIPOLAR TRANSISTOR IGBT | 273281 | 1% | 63% | 96 | Search INSULATED+GATE+BIPOLAR+TRANSISTOR+IGBT | Search INSULATED+GATE+BIPOLAR+TRANSISTOR+IGBT |
7 | BREAKDOWN VOLTAGE | 217462 | 3% | 24% | 198 | Search BREAKDOWN+VOLTAGE | Search BREAKDOWN+VOLTAGE |
8 | POWER SEMICONDUCTOR DEVICES | 176354 | 1% | 41% | 96 | Search POWER+SEMICONDUCTOR+DEVICES | Search POWER+SEMICONDUCTOR+DEVICES |
9 | BREAKDOWN VOLTAGE BV | 175720 | 1% | 79% | 49 | Search BREAKDOWN+VOLTAGE+BV | Search BREAKDOWN+VOLTAGE+BV |
10 | SUPERJUNCTION | 164396 | 1% | 72% | 50 | Search SUPERJUNCTION | Search SUPERJUNCTION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |