Class information for:
Level 1: LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
521 3       SILICON CARBIDE//4H SIC//SIC 21253
1718 2             IGBT//LDMOS//POWER MOSFET 6942
5425 1                   LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE 1656

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LDMOS authKW 1420962 7% 67% 111
2 SPECIFIC ON RESISTANCE authKW 1177823 5% 74% 84
3 BREAKDOWN VOLTAGE authKW 771266 11% 22% 182
4 POWER MOSFET authKW 719434 7% 34% 110
5 BREAKDOWN VOLTAGE BV authKW 678004 3% 76% 47
6 SUPERJUNCTION authKW 558463 3% 65% 45
7 ON RESISTANCE authKW 394950 3% 43% 48
8 RESURF authKW 332482 2% 56% 31
9 TRENCH GATE authKW 313167 1% 69% 24
10 ASIC SYST ENGN address 290119 4% 25% 61

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 30367 78% 0% 1288
2 Physics, Applied 11419 53% 0% 880
3 Physics, Condensed Matter 1639 18% 0% 299
4 Nanoscience & Nanotechnology 1497 11% 0% 185
5 Physics, Multidisciplinary 274 8% 0% 125
6 Telecommunications 81 3% 0% 42
7 Computer Science, Hardware & Architecture 23 1% 0% 16
8 Materials Science, Multidisciplinary 8 6% 0% 92
9 Computer Science, Interdisciplinary Applications 2 1% 0% 16
10 Materials Science, Coatings & Films -0 0% 0% 8

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ASIC SYST ENGN 290119 4% 25% 61
2 STATE ELECT THIN FILMS INTEGRATED DEVIC 143858 9% 5% 147
3 SAGE ENISO 97868 0% 86% 6
4 ANALOGUE INTEGRATED CIRCUITS 96332 1% 56% 9
5 IUT ROUEN 76113 0% 50% 8
6 24 59275 1% 35% 9
7 MINIST EDUC WIDE BAND G SEMICOND MAT DEVICES 52415 1% 13% 21
8 AL LEITH ENGN 38060 0% 100% 2
9 CHINA 24 38060 0% 100% 2
10 CORP ENGN DEVICE INFRA TEAM 38060 0% 100% 2

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 184654 24% 2% 390
2 SOLID-STATE ELECTRONICS 55686 10% 2% 171
3 IEEE ELECTRON DEVICE LETTERS 43576 9% 2% 146
4 MICROELECTRONICS RELIABILITY 19904 5% 1% 88
5 MICROELECTRONICS JOURNAL 14581 3% 1% 55
6 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 8895 1% 2% 23
7 SUPERLATTICES AND MICROSTRUCTURES 5509 3% 1% 44
8 IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 4062 1% 2% 14
9 CHINESE PHYSICS B 3781 3% 0% 46
10 IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION 2821 1% 1% 10

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 LDMOS 1420962 7% 67% 111 Search LDMOS Search LDMOS
2 SPECIFIC ON RESISTANCE 1177823 5% 74% 84 Search SPECIFIC+ON+RESISTANCE Search SPECIFIC+ON+RESISTANCE
3 BREAKDOWN VOLTAGE 771266 11% 22% 182 Search BREAKDOWN+VOLTAGE Search BREAKDOWN+VOLTAGE
4 POWER MOSFET 719434 7% 34% 110 Search POWER+MOSFET Search POWER+MOSFET
5 BREAKDOWN VOLTAGE BV 678004 3% 76% 47 Search BREAKDOWN+VOLTAGE+BV Search BREAKDOWN+VOLTAGE+BV
6 SUPERJUNCTION 558463 3% 65% 45 Search SUPERJUNCTION Search SUPERJUNCTION
7 ON RESISTANCE 394950 3% 43% 48 Search ON+RESISTANCE Search ON+RESISTANCE
8 RESURF 332482 2% 56% 31 Search RESURF Search RESURF
9 TRENCH GATE 313167 1% 69% 24 Search TRENCH+GATE Search TRENCH+GATE
10 LDMOSFET 273687 2% 55% 26 Search LDMOSFET Search LDMOSFET

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 16882 LATERAL INSULATED GATE BIPOLAR TRANSISTOR LIGBT//GATE COMMUTATED THYRISTOR GCT//EMITTER TURN OFF THYRISTOR ETO
2 5559 IGBT//INSULATED GATE BIPOLAR TRANSISTOR IGBT//IEEE TRANSACTIONS ON POWER ELECTRONICS
3 29260 MSOS O P STRUCTURE//SEMI INSULATING POLYCRYSTALLINE SILICON//SIPOS
4 11149 ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST
5 22373 MESFET//4H SIC MESFET//SIC MESFET
6 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
7 19217 SELF HEATING//CHARACTERISTIC THERMAL LENGTH//BALLASTING RESISTORS
8 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
9 27502 BEAM CHANNEL TRANSISTOR//BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS//BIPOLAR STATIC INDUCTION TRANSISTORS BSITS
10 3228 4H SIC//CHANNEL MOBILITY//SILICON CARBIDE SIC

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