Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
| 1718 | 2 | IGBT//LDMOS//POWER MOSFET | 6942 |
| 27502 | 1 | BEAM CHANNEL TRANSISTOR//BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS//BIPOLAR STATIC INDUCTION TRANSISTORS BSITS | 247 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | BEAM CHANNEL TRANSISTOR | authKW | 382795 | 1% | 100% | 3 |
| 2 | BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS | authKW | 255197 | 1% | 100% | 2 |
| 3 | BIPOLAR STATIC INDUCTION TRANSISTORS BSITS | authKW | 255197 | 1% | 100% | 2 |
| 4 | IMPURITY ENHANCED OXIDATION | authKW | 255197 | 1% | 100% | 2 |
| 5 | KAWAUCHI | address | 255197 | 1% | 100% | 2 |
| 6 | 110 SILICON SUBSTRATE | authKW | 127598 | 0% | 100% | 1 |
| 7 | BATTERY CASCADE CHARGING | authKW | 127598 | 0% | 100% | 1 |
| 8 | BIPOLAR STATIC INDUCTION TRANSISTOR | authKW | 127598 | 0% | 100% | 1 |
| 9 | BMFETS | authKW | 127598 | 0% | 100% | 1 |
| 10 | CHARGING POWER SUPPLY | authKW | 127598 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 3640 | 70% | 0% | 173 |
| 2 | Physics, Applied | 1780 | 54% | 0% | 134 |
| 3 | COMPUTER APPLICATIONS & CYBERNETICS | 771 | 2% | 0% | 4 |
| 4 | Physics, Condensed Matter | 276 | 19% | 0% | 47 |
| 5 | Instruments & Instrumentation | 19 | 4% | 0% | 9 |
| 6 | Physics, Fluids & Plasmas | 9 | 2% | 0% | 5 |
| 7 | Materials Science, Multidisciplinary | 7 | 8% | 0% | 19 |
| 8 | Nanoscience & Nanotechnology | 4 | 2% | 0% | 6 |
| 9 | Computer Science, Information Systems | 3 | 2% | 0% | 4 |
| 10 | Telecommunications | 3 | 2% | 0% | 4 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | KAWAUCHI | 255197 | 1% | 100% | 2 |
| 2 | DIPARTIMENTO INGN ELECTTR TELECOMUN | 127598 | 0% | 100% | 1 |
| 3 | INTEGRATED ELECT MFG | 127598 | 0% | 100% | 1 |
| 4 | MICROELECT INFORMAT ELECT 229 | 127598 | 0% | 100% | 1 |
| 5 | S SOLID STATE TECHNOL | 127598 | 0% | 100% | 1 |
| 6 | STAT INDUCT DEVICE | 127598 | 0% | 100% | 1 |
| 7 | TORY 2300 | 127598 | 0% | 100% | 1 |
| 8 | STAT INDUCT DEVICES | 127596 | 1% | 50% | 2 |
| 9 | DATA PROC ELE | 63798 | 0% | 50% | 1 |
| 10 | ELECT COMP ENGN DIEII | 42531 | 0% | 33% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 29306 | 24% | 0% | 60 |
| 2 | JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS | 11592 | 2% | 2% | 4 |
| 3 | SOLID-STATE ELECTRONICS | 11502 | 12% | 0% | 30 |
| 4 | IEEE ELECTRON DEVICE LETTERS | 4434 | 7% | 0% | 18 |
| 5 | ELECTRON DEVICE LETTERS | 3809 | 1% | 1% | 3 |
| 6 | MICROWAVES | 2965 | 0% | 2% | 1 |
| 7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1879 | 4% | 0% | 11 |
| 8 | ARCHIV FUR ELEKTROTECHNIK | 1874 | 1% | 0% | 3 |
| 9 | IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION | 1708 | 1% | 0% | 3 |
| 10 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1498 | 4% | 0% | 10 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |