Class information for:
Level 1: DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
25310 1                   DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY 308

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DEVICE TECHNOL MODELING address 204654 1% 100% 2
2 NARROW CHANNEL TRANSISTOR authKW 204654 1% 100% 2
3 NOISE ADAPTABILITY authKW 204654 1% 100% 2
4 OXIDE RECESS authKW 204654 1% 100% 2
5 TRENCH ISOLATION authKW 139267 2% 19% 7
6 SHALLOW TRENCH ISOLATION STI authKW 137553 4% 12% 11
7 SHALLOW TRENCH ISOLATION authKW 119034 4% 11% 11
8 LOCOS authKW 108336 2% 18% 6
9 3 D DIBL authKW 102327 0% 100% 1
10 45 DEGREES CMOSFET authKW 102327 0% 100% 1

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 5572 77% 0% 238
2 Physics, Applied 2633 59% 0% 181
3 Physics, Condensed Matter 482 22% 0% 68
4 Nanoscience & Nanotechnology 220 10% 0% 31
5 Computer Science, Hardware & Architecture 52 3% 0% 8
6 Optics 24 5% 0% 16
7 Materials Science, Coatings & Films 19 2% 0% 7
8 Physics, Multidisciplinary 6 4% 0% 12
9 Engineering, Manufacturing 5 1% 0% 3
10 Nuclear Science & Technology 1 1% 0% 4

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DEVICE TECHNOL MODELING 204654 1% 100% 2
2 ASD GRP 102327 0% 100% 1
3 DEV TECH SUPPORT 102327 0% 100% 1
4 DEVICE PROC INTEGRAT PART 102327 0% 100% 1
5 DEVICES DESIGN NM 90 102327 0% 100% 1
6 DRAM TECHNOL 6 102327 0% 100% 1
7 ELE SERV ORG IC DEV 102327 0% 100% 1
8 ELECT COMP ENGN ZENTRUM SOLID STATE ELE 102327 0% 100% 1
9 MICRO POWER ANALOG GRP 102327 0% 100% 1
10 PROC DEV 2 102327 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 EDN 32233 3% 4% 9
2 SOLID-STATE ELECTRONICS 25655 16% 1% 50
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 18307 17% 0% 53
4 IEEE ELECTRON DEVICE LETTERS 14268 12% 0% 36
5 INTERNATIONAL JOURNAL OF ELECTRONICS 2065 3% 0% 10
6 MICROELECTRONIC ENGINEERING 1652 4% 0% 13
7 MICROELECTRONICS RELIABILITY 876 3% 0% 8
8 JOURNAL DE PHYSIQUE III 858 1% 0% 3
9 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 624 5% 0% 14
10 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 570 1% 0% 3

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 NARROW CHANNEL TRANSISTOR 204654 1% 100% 2 Search NARROW+CHANNEL+TRANSISTOR Search NARROW+CHANNEL+TRANSISTOR
2 NOISE ADAPTABILITY 204654 1% 100% 2 Search NOISE+ADAPTABILITY Search NOISE+ADAPTABILITY
3 OXIDE RECESS 204654 1% 100% 2 Search OXIDE+RECESS Search OXIDE+RECESS
4 TRENCH ISOLATION 139267 2% 19% 7 Search TRENCH+ISOLATION Search TRENCH+ISOLATION
5 SHALLOW TRENCH ISOLATION STI 137553 4% 12% 11 Search SHALLOW+TRENCH+ISOLATION+STI Search SHALLOW+TRENCH+ISOLATION+STI
6 SHALLOW TRENCH ISOLATION 119034 4% 11% 11 Search SHALLOW+TRENCH+ISOLATION Search SHALLOW+TRENCH+ISOLATION
7 LOCOS 108336 2% 18% 6 Search LOCOS Search LOCOS
8 3 D DIBL 102327 0% 100% 1 Search 3+D+DIBL Search 3+D+DIBL
9 45 DEGREES CMOSFET 102327 0% 100% 1 Search 45+DEGREES+CMOSFET Search 45+DEGREES+CMOSFET
10 ABNORMALLY STRUCTURED MOSFET 102327 0% 100% 1 Search ABNORMALLY+STRUCTURED+MOSFET Search ABNORMALLY+STRUCTURED+MOSFET

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 9421 EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS
2 18908 CHEMICAL AFFINITY TENSOR//GUIDED MODES OF ELECTRON WAVE//FILM EDGE
3 20817 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM
4 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
5 23836 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
6 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
7 21577 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
8 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
9 22635 CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE
10 4410 ENERGY TRANSPORT MODEL//HYDRODYNAMICAL MODELS//BOLTZMANN POISSON SYSTEM

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