Class information for:
Level 1: 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
20817 1                   1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM 468

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 1T DRAM authKW 1853512 7% 81% 34
2 CAPACITORLESS DRAM authKW 1319409 5% 85% 23
3 CAPACITORLESS 1T DRAM authKW 692663 3% 86% 12
4 PSEUDO MOSFET authKW 638495 3% 59% 16
5 CAPACITORLESS authKW 599951 3% 64% 14
6 FLOATING BODY CELL authKW 471398 1% 100% 7
7 FLOATING BODY CELL FBC authKW 404056 1% 100% 6
8 DATA RETENTION TIME authKW 404044 3% 50% 12
9 DRAM authKW 341751 10% 10% 49
10 DYNAMIC RANDOM ACCESS MEMORY DRAM authKW 340896 4% 28% 18

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 7263 72% 0% 336
2 Physics, Applied 3939 58% 0% 273
3 Computer Science, Hardware & Architecture 1018 9% 0% 40
4 Physics, Condensed Matter 577 20% 0% 93
5 Nanoscience & Nanotechnology 273 9% 0% 43
6 Computer Science, Software Engineering 55 3% 0% 14
7 Computer Science, Theory & Methods 47 3% 0% 16
8 Materials Science, Coatings & Films 32 2% 0% 11
9 Materials Science, Multidisciplinary 24 9% 0% 41
10 Optics 12 4% 0% 17

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 DRAM PROD ENGN TEAM 151519 1% 75% 3
2 LEGELB ECUBLENS 134685 0% 100% 2
3 MEMORY DESIGN ENGN 134685 0% 100% 2
4 IMEP LAHC 114921 6% 6% 27
5 DESIGN SOLUT 101011 1% 50% 3
6 SOC DEVICE TEAM 1 89789 0% 67% 2
7 MEMORY DEVICE BUSINESS 86580 1% 43% 3
8 ADV TECHNOL DEV PROC DEV 67343 0% 100% 1
9 AMIRI 67343 0% 100% 1
10 BUBALEUP 67343 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 34763 19% 1% 90
2 IEEE ELECTRON DEVICE LETTERS 27868 13% 1% 62
3 SOLID-STATE ELECTRONICS 25106 13% 1% 61
4 IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY 6947 1% 2% 5
5 IEEE TRANSACTIONS ON COMPUTERS 2473 3% 0% 14
6 ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION 2365 1% 1% 4
7 MICROELECTRONIC ENGINEERING 1855 4% 0% 17
8 IEICE ELECTRONICS EXPRESS 1477 2% 0% 8
9 IEEE JOURNAL OF SOLID-STATE CIRCUITS 1328 3% 0% 13
10 IEEE TRANSACTIONS ON NANOTECHNOLOGY 1298 1% 0% 6

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 1T DRAM 1853512 7% 81% 34 Search 1T+DRAM Search 1T+DRAM
2 CAPACITORLESS DRAM 1319409 5% 85% 23 Search CAPACITORLESS+DRAM Search CAPACITORLESS+DRAM
3 CAPACITORLESS 1T DRAM 692663 3% 86% 12 Search CAPACITORLESS+1T+DRAM Search CAPACITORLESS+1T+DRAM
4 PSEUDO MOSFET 638495 3% 59% 16 Search PSEUDO+MOSFET Search PSEUDO+MOSFET
5 CAPACITORLESS 599951 3% 64% 14 Search CAPACITORLESS Search CAPACITORLESS
6 FLOATING BODY CELL 471398 1% 100% 7 Search FLOATING+BODY+CELL Search FLOATING+BODY+CELL
7 FLOATING BODY CELL FBC 404056 1% 100% 6 Search FLOATING+BODY+CELL+FBC Search FLOATING+BODY+CELL+FBC
8 DATA RETENTION TIME 404044 3% 50% 12 Search DATA+RETENTION+TIME Search DATA+RETENTION+TIME
9 DRAM 341751 10% 10% 49 Search DRAM Search DRAM
10 DYNAMIC RANDOM ACCESS MEMORY DRAM 340896 4% 28% 18 Search DYNAMIC+RANDOM+ACCESS+MEMORY+DRAM Search DYNAMIC+RANDOM+ACCESS+MEMORY+DRAM

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 33041 MAIN MEMORY SYSTEMS//ASYMMETRIC CORES//COMPUTATIONAL REDUNDANCY
2 38433 VERTICAL MOSFET//BACK BIAS EFFECT//1R READ 1W WRITE 8T TRANSISTOR STATIC RANDOM
3 10114 TUNNEL FIELD EFFECT TRANSISTOR TFET//BAND TO BAND TUNNELING BTBT//TUNNEL FET
4 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
5 23836 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
6 25310 DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY
7 10278 MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS
8 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
9 33621 DEUTERIUM ANNEALING//SID4//ADSORPTION HYDROGEN PASSIVATION
10 19176 NAND FLASH MEMORY//FLASH MEMORY//NAND FLASH

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