Class information for:
Level 1: HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
4663 1                   HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT 1771

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 HOT CARRIERS authKW 377195 6% 20% 108
2 HOT CARRIER DEGRADATION authKW 293573 2% 50% 33
3 HOT CARRIER EFFECT authKW 236462 2% 36% 37
4 IEEE TRANSACTIONS ON ELECTRON DEVICES journal 214845 25% 3% 435
5 CHARGE PUMPING authKW 207165 2% 31% 38
6 CHARGE PUMPING CP authKW 202181 1% 45% 25
7 CHANNEL INITIATED SECONDARY ELECTRON CHISEL authKW 161765 1% 91% 10
8 GIDL authKW 140598 1% 44% 18
9 IEEE ELECTRON DEVICE LETTERS journal 122670 14% 3% 253
10 CHANNEL HOT ELECTRON CHE authKW 110867 1% 69% 9

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 33095 78% 0% 1390
2 Physics, Applied 18099 64% 0% 1132
3 Nanoscience & Nanotechnology 2793 14% 0% 255
4 Physics, Condensed Matter 825 13% 0% 233
5 Physics, Multidisciplinary 52 4% 0% 76
6 Computer Science, Hardware & Architecture 43 1% 0% 21
7 Optics 39 4% 0% 62
8 Materials Science, Coatings & Films 7 1% 0% 17
9 COMPUTER APPLICATIONS & CYBERNETICS 5 0% 0% 1
10 Computer Science, Interdisciplinary Applications 1 1% 0% 15

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 EXPLORATORY DEVICE 71177 0% 100% 4
2 FLORIDA SOLID STATE ELECT 58230 0% 55% 6
3 PROC DEV IMPLEMENTAT 47449 0% 67% 4
4 PHYS COMPOSANTS SEMICONDUCTEURS 40036 0% 75% 3
5 MECHATON TECHNOL 35589 0% 100% 2
6 MICROELECT SEMICOND DEVICE PHYS 35589 0% 100% 2
7 PHYS COMPOSANTS SEMICONDUCT 35589 0% 100% 2
8 RM DEV 35589 0% 100% 2
9 SEMICOND TECHNOL PLICAT GRP 26682 0% 25% 6
10 INTEGRATED CIRCUIT FAILURE ANAL RELIABIL 26542 1% 15% 10

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 214845 25% 3% 435
2 IEEE ELECTRON DEVICE LETTERS 122670 14% 3% 253
3 MICROELECTRONICS RELIABILITY 64884 9% 2% 164
4 SOLID-STATE ELECTRONICS 48448 9% 2% 165
5 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 18203 2% 3% 34
6 MICROELECTRONIC ENGINEERING 6305 3% 1% 61
7 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 2244 4% 0% 64
8 ELECTRON DEVICE LETTERS 2116 0% 2% 6
9 JAPANESE JOURNAL OF APPLIED PHYSICS 1749 2% 0% 41
10 IEEE JOURNAL OF SOLID-STATE CIRCUITS 1605 2% 0% 28

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 HOT CARRIERS 377195 6% 20% 108 Search HOT+CARRIERS Search HOT+CARRIERS
2 HOT CARRIER DEGRADATION 293573 2% 50% 33 Search HOT+CARRIER+DEGRADATION Search HOT+CARRIER+DEGRADATION
3 HOT CARRIER EFFECT 236462 2% 36% 37 Search HOT+CARRIER+EFFECT Search HOT+CARRIER+EFFECT
4 CHARGE PUMPING 207165 2% 31% 38 Search CHARGE+PUMPING Search CHARGE+PUMPING
5 CHARGE PUMPING CP 202181 1% 45% 25 Search CHARGE+PUMPING+CP Search CHARGE+PUMPING+CP
6 CHANNEL INITIATED SECONDARY ELECTRON CHISEL 161765 1% 91% 10 Search CHANNEL+INITIATED+SECONDARY+ELECTRON+CHISEL Search CHANNEL+INITIATED+SECONDARY+ELECTRON+CHISEL
7 GIDL 140598 1% 44% 18 Search GIDL Search GIDL
8 CHANNEL HOT ELECTRON CHE 110867 1% 69% 9 Search CHANNEL+HOT+ELECTRON+CHE Search CHANNEL+HOT+ELECTRON+CHE
9 HOT CARRIER INDUCED DEGRADATION 107646 1% 55% 11 Search HOT+CARRIER+INDUCED+DEGRADATION Search HOT+CARRIER+INDUCED+DEGRADATION
10 SUBSTRATE CURRENT 76973 1% 29% 15 Search SUBSTRATE+CURRENT Search SUBSTRATE+CURRENT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 12845 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI
2 9421 EFFECTIVE CHANNEL LENGTH//LOW TEMPERATURE ELECTRONICS//CRYOGENIC CMOS
3 33621 DEUTERIUM ANNEALING//SID4//ADSORPTION HYDROGEN PASSIVATION
4 3071 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//OXIDE BREAKDOWN
5 25310 DEVICE TECHNOL MODELING//NARROW CHANNEL TRANSISTOR//NOISE ADAPTABILITY
6 22635 CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE
7 16884 RF MOSFET//INDUCED GATE NOISE//CHANNEL THERMAL NOISE
8 432 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
9 1776 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
10 20817 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS 1T DRAM

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