Class information for:
Level 1: IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
197 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY 20765
1776 1                   IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE 2524

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON NUCLEAR SCIENCE journal 691384 38% 6% 965
2 TOTAL IONIZING DOSE authKW 473407 3% 47% 81
3 OXIDE TRAPPED CHARGE authKW 345245 2% 71% 39
4 ELDRS authKW 338703 1% 94% 29
5 TOTAL DOSE authKW 271320 2% 45% 48
6 TOTAL DOSE EFFECTS authKW 247177 1% 60% 33
7 TOTAL IONIZING DOSE TID authKW 219818 2% 46% 38
8 INTERFACE TRAPS authKW 208688 3% 24% 70
9 ENHANCED LOW DOSE RATE SENSITIVITY ELDRS authKW 202254 1% 90% 18
10 BIPOLAR JUNCTION TRANSISTOR authKW 200163 2% 38% 42

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Nuclear Science & Technology 59106 44% 0% 1122
2 Engineering, Electrical & Electronic 24101 57% 0% 1438
3 Physics, Applied 5620 32% 0% 801
4 Nanoscience & Nanotechnology 997 8% 0% 196
5 Physics, Condensed Matter 882 12% 0% 296
6 Physics, Nuclear 428 5% 0% 114
7 Materials Science, Coatings & Films 401 3% 0% 84
8 Instruments & Instrumentation 373 5% 0% 118
9 Physics, Multidisciplinary 231 6% 0% 154
10 Materials Science, Ceramics 51 1% 0% 32

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SPACE MISSION TECHNOL 33291 0% 67% 4
2 ELECT ENGN NIKOLA TESLA 32098 0% 43% 6
3 IBW RELIC 28090 0% 75% 3
4 1332 24970 0% 100% 2
5 IES UMR CNRS UM2 5214 24970 0% 100% 2
6 SPACE VEHICLES DIRECTORATE SE 24970 0% 100% 2
7 FIS DISPOSIT MICROELECT 22471 0% 60% 3
8 CEM2 19617 1% 10% 15
9 STATE INTENSE PULSED IRRADIAT SIMULAT E 18155 0% 36% 4
10 RREACT GRP 17468 0% 20% 7

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 691384 38% 6% 965
2 MICROELECTRONICS RELIABILITY 12122 3% 1% 85
3 MICROELECTRONIC ENGINEERING 6668 3% 1% 75
4 APPLIED PHYSICS LETTERS 3499 7% 0% 183
5 SOLID-STATE ELECTRONICS 3169 2% 1% 51
6 JOURNAL OF APPLIED PHYSICS 2935 7% 0% 165
7 ACTA PHYSICA SINICA 2656 3% 0% 67
8 NUCLEAR TECHNOLOGY & RADIATION PROTECTION 2492 0% 2% 9
9 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 2146 1% 1% 14
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 1609 1% 0% 33

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 TOTAL IONIZING DOSE 473407 3% 47% 81 Search TOTAL+IONIZING+DOSE Search TOTAL+IONIZING+DOSE
2 OXIDE TRAPPED CHARGE 345245 2% 71% 39 Search OXIDE+TRAPPED+CHARGE Search OXIDE+TRAPPED+CHARGE
3 ELDRS 338703 1% 94% 29 Search ELDRS Search ELDRS
4 TOTAL DOSE 271320 2% 45% 48 Search TOTAL+DOSE Search TOTAL+DOSE
5 TOTAL DOSE EFFECTS 247177 1% 60% 33 Search TOTAL+DOSE+EFFECTS Search TOTAL+DOSE+EFFECTS
6 TOTAL IONIZING DOSE TID 219818 2% 46% 38 Search TOTAL+IONIZING+DOSE+TID Search TOTAL+IONIZING+DOSE+TID
7 INTERFACE TRAPS 208688 3% 24% 70 Search INTERFACE+TRAPS Search INTERFACE+TRAPS
8 ENHANCED LOW DOSE RATE SENSITIVITY ELDRS 202254 1% 90% 18 Search ENHANCED+LOW+DOSE+RATE+SENSITIVITY+ELDRS Search ENHANCED+LOW+DOSE+RATE+SENSITIVITY+ELDRS
9 BIPOLAR JUNCTION TRANSISTOR 200163 2% 38% 42 Search BIPOLAR+JUNCTION+TRANSISTOR Search BIPOLAR+JUNCTION+TRANSISTOR
10 GAIN DEGRADATION 199753 1% 80% 20 Search GAIN+DEGRADATION Search GAIN+DEGRADATION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 20526 SINGLE EVENT BURNOUT SEB//SINGLE EVENT BURNOUT//SINGLE EVENT GATE RUPTURE SEGR
2 20119 RADFET//PMOS DOSIMETER//DEVICE PHYS MICROELECT
3 12845 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI
4 3071 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//OXIDE BREAKDOWN
5 33621 DEUTERIUM ANNEALING//SID4//ADSORPTION HYDROGEN PASSIVATION
6 34428 AL CR FILM//CARBONIC STRUCTURES//EDS SPECTRA
7 25292 AG NANOCRYSTALLITES//ANALOG PROC TECHNOL GRP//CURRENT INDUCED DEFECT GENERATION
8 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
9 12852 SIMOX//CONTACTLESS I V METHOD//BURIED OXIDE LAYER
10 1076 SOFT ERROR//SINGLE EVENT TRANSIENT//SINGLE EVENT UPSET

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