Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 197 | 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FLASH MEMORY | 20765 |
| 20526 | 1 | SINGLE EVENT BURNOUT SEB//SINGLE EVENT BURNOUT//SINGLE EVENT GATE RUPTURE SEGR | 480 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SINGLE EVENT BURNOUT SEB | authKW | 1650527 | 6% | 93% | 27 |
| 2 | SINGLE EVENT BURNOUT | authKW | 1335903 | 5% | 88% | 23 |
| 3 | SINGLE EVENT GATE RUPTURE SEGR | authKW | 1313180 | 4% | 100% | 20 |
| 4 | RREACT GRP | address | 1172468 | 5% | 71% | 25 |
| 5 | ION ELECTRON EMISSION MICROSCOPY | authKW | 675346 | 3% | 86% | 12 |
| 6 | SEGR | authKW | 675346 | 3% | 86% | 12 |
| 7 | SINGLE EVENT GATE RUPTURE | authKW | 547155 | 2% | 83% | 10 |
| 8 | FLOATING GATE MEMORIES | authKW | 420214 | 2% | 80% | 8 |
| 9 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | journal | 310766 | 59% | 2% | 282 |
| 10 | SINGLE EVENT EFFECTS | authKW | 301810 | 8% | 11% | 40 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Nuclear Science & Technology | 25921 | 67% | 0% | 322 |
| 2 | Engineering, Electrical & Electronic | 9333 | 80% | 0% | 384 |
| 3 | Nanoscience & Nanotechnology | 423 | 11% | 0% | 53 |
| 4 | Instruments & Instrumentation | 418 | 10% | 0% | 48 |
| 5 | Physics, Applied | 337 | 19% | 0% | 93 |
| 6 | Physics, Nuclear | 233 | 7% | 0% | 34 |
| 7 | Physics, Atomic, Molecular & Chemical | 64 | 6% | 0% | 28 |
| 8 | Theater | 6 | 0% | 0% | 1 |
| 9 | Engineering, General | 2 | 1% | 0% | 5 |
| 10 | Physics, Multidisciplinary | 2 | 3% | 0% | 13 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | RREACT GRP | 1172468 | 5% | 71% | 25 |
| 2 | RD TECHNOL DEV | 177267 | 2% | 30% | 9 |
| 3 | FTM ADV RD | 116723 | 1% | 44% | 4 |
| 4 | STMICROELECT M6 | 87544 | 0% | 67% | 2 |
| 5 | TEC QEC | 87544 | 0% | 67% | 2 |
| 6 | DIPARTIMENTO INGN INFORMAZ | 80298 | 12% | 2% | 57 |
| 7 | ASRC FED SPACE DEF INC | 65659 | 0% | 100% | 1 |
| 8 | ASRC SPACE DEF INC | 65659 | 0% | 100% | 1 |
| 9 | DIMAST | 65659 | 0% | 100% | 1 |
| 10 | DIP AUTOMAZ ELETTROMAGNETISMO INGN INFORMAZ MAT | 65659 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 310766 | 59% | 2% | 282 |
| 2 | MICROELECTRONICS RELIABILITY | 19667 | 10% | 1% | 47 |
| 3 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2087 | 1% | 1% | 6 |
| 4 | ENTERTAINMENT DESIGN | 1929 | 0% | 3% | 1 |
| 5 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1353 | 5% | 0% | 26 |
| 6 | NUCLEAR TECHNOLOGY & RADIATION PROTECTION | 648 | 0% | 0% | 2 |
| 7 | JOURNAL OF INSTRUMENTATION | 637 | 1% | 0% | 7 |
| 8 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 582 | 3% | 0% | 12 |
| 9 | MEASUREMENT | 364 | 1% | 0% | 5 |
| 10 | IET POWER ELECTRONICS | 334 | 1% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |