Class information for:
Level 1: SOFT ERROR//SINGLE EVENT TRANSIENT//SINGLE EVENT UPSET

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
12 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, INFORMATION SYSTEMS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 1181119
295 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 41956
1155 2             SOFT ERROR//SINGLE EVENT UPSET//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 9839
1076 1                   SOFT ERROR//SINGLE EVENT TRANSIENT//SINGLE EVENT UPSET 2897

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SOFT ERROR authKW 2085255 11% 62% 309
2 SINGLE EVENT TRANSIENT authKW 1824667 7% 86% 196
3 SINGLE EVENT UPSET authKW 1812740 9% 66% 251
4 IEEE TRANSACTIONS ON NUCLEAR SCIENCE journal 1593703 54% 9% 1569
5 SINGLE EVENT EFFECTS authKW 1540287 8% 64% 222
6 SINGLE EVENT UPSET SEU authKW 1225420 5% 72% 156
7 SINGLE EVENT TRANSIENT SET authKW 959343 4% 84% 105
8 SEU authKW 638161 3% 67% 87
9 SPACE DEF ELECT address 599743 2% 84% 66
10 SOFT ERROR RATE authKW 532533 2% 80% 61

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Nuclear Science & Technology 134399 62% 1% 1803
2 Engineering, Electrical & Electronic 54645 79% 0% 2284
3 Computer Science, Hardware & Architecture 7829 9% 0% 275
4 Physics, Nuclear 1195 7% 0% 191
5 Instruments & Instrumentation 1143 7% 0% 204
6 Physics, Applied 438 11% 0% 316
7 Computer Science, Software Engineering 405 3% 0% 93
8 Nanoscience & Nanotechnology 312 5% 0% 133
9 Physics, Atomic, Molecular & Chemical 241 5% 0% 142
10 Computer Science, Theory & Methods 109 2% 0% 69

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SPACE DEF ELECT 599743 2% 84% 66
2 RADIAT EFFECTS GRP 155378 1% 71% 20
3 COMPONENT ENGN GRP 76141 0% 100% 7
4 ISDE 59218 0% 78% 7
5 IES UMR CNRS 5214 48945 0% 75% 6
6 MICROELECT MICROPROCESSOR 48945 0% 75% 6
7 SEVERE ENVIRONM MAT 45320 0% 83% 5
8 CENT CAD DESIGN SOLUT 44410 0% 58% 7
9 MEI TECHNOL INC 43509 0% 100% 4
10 CC 083 32632 0% 100% 3

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 1593703 54% 9% 1569
2 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 52761 3% 7% 74
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 22609 2% 4% 48
4 MICROELECTRONICS RELIABILITY 16756 4% 1% 107
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 10321 2% 2% 59
6 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 5827 5% 0% 133
7 IEICE ELECTRONICS EXPRESS 3796 1% 1% 32
8 IEEE TRANSACTIONS ON COMPUTERS 3383 1% 1% 41
9 IBM JOURNAL OF RESEARCH AND DEVELOPMENT 2608 1% 1% 22
10 ELECTRONIC ENGINEERING DESIGN 2174 0% 20% 1

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 SOFT ERROR 2085255 11% 62% 309 Search SOFT+ERROR Search SOFT+ERROR
2 SINGLE EVENT TRANSIENT 1824667 7% 86% 196 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
3 SINGLE EVENT UPSET 1812740 9% 66% 251 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
4 SINGLE EVENT EFFECTS 1540287 8% 64% 222 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
5 SINGLE EVENT UPSET SEU 1225420 5% 72% 156 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
6 SINGLE EVENT TRANSIENT SET 959343 4% 84% 105 Search SINGLE+EVENT+TRANSIENT+SET Search SINGLE+EVENT+TRANSIENT+SET
7 SEU 638161 3% 67% 87 Search SEU Search SEU
8 SOFT ERROR RATE 532533 2% 80% 61 Search SOFT+ERROR+RATE Search SOFT+ERROR+RATE
9 SOFT ERROR RATE SER 431881 2% 88% 45 Search SOFT+ERROR+RATE+SER Search SOFT+ERROR+RATE+SER
10 SINGLE EVENT EFFECTS SEES 394077 2% 72% 50 Search SINGLE+EVENT+EFFECTS+SEES Search SINGLE+EVENT+EFFECTS+SEES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 12579 FAULT INJECTION//CONTROL FLOW CHECKING//SRAM BASED FPGA
2 20526 SINGLE EVENT BURNOUT SEB//SINGLE EVENT BURNOUT//SINGLE EVENT GATE RUPTURE SEGR
3 21577 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
4 1776 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
5 36332 AE TECHNOL//VISUAL ABNORMALITIES//ALUMINUM STRIPES
6 21567 DEFECT TOLERANCE//NEUROMORPHIC NETWORKS//CMOL
7 24695 OPTOCOUPLER//ACTIVATION ENERGY OF RECOVERY//CMS OPTICAL LINKS
8 26691 QUASI SELECTIVE EPITAXY//SILICON SURFACE BARRIER DETECTOR//SILICON TELESCOPE
9 15440 CHARGE COUPLED DEVICE//MESH EXPERIMENT//HXMT
10 10278 MARCH TEST//MEMORY TESTING//IEEE JOURNAL OF SOLID-STATE CIRCUITS

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