Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | SOFT ERROR MAPPING | authKW | 288480 | 1% | 100% | 4 |
| 2 | HIGH ENERGY ION IMPLANTATION | authKW | 194711 | 2% | 30% | 9 |
| 3 | DYNAMIC RANDOM ACCESS MEMORY | authKW | 168270 | 2% | 33% | 7 |
| 4 | BURIED BARRIER LAYER | authKW | 144240 | 0% | 100% | 2 |
| 5 | ION BEAM INDUCED CURRENT | authKW | 144240 | 0% | 100% | 2 |
| 6 | ION INDUCED CURRENT | authKW | 144240 | 0% | 100% | 2 |
| 7 | SECONDARY ELECTRON MAPPING | authKW | 144240 | 0% | 100% | 2 |
| 8 | BORON IMPLANTED | authKW | 72120 | 0% | 100% | 1 |
| 9 | BULK CMOS DEVICE | authKW | 72120 | 0% | 100% | 1 |
| 10 | BURIED CHANNEL MOS CAPACITOR | authKW | 72120 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 5752 | 66% | 0% | 290 |
| 2 | Nuclear Science & Technology | 2007 | 20% | 0% | 88 |
| 3 | Physics, Applied | 1652 | 40% | 0% | 176 |
| 4 | Instruments & Instrumentation | 406 | 10% | 0% | 45 |
| 5 | Physics, Nuclear | 245 | 8% | 0% | 33 |
| 6 | Physics, Condensed Matter | 159 | 12% | 0% | 52 |
| 7 | Physics, Atomic, Molecular & Chemical | 113 | 8% | 0% | 33 |
| 8 | Computer Science, Hardware & Architecture | 83 | 3% | 0% | 12 |
| 9 | Architecture | 75 | 1% | 0% | 3 |
| 10 | Nanoscience & Nanotechnology | 41 | 4% | 0% | 19 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | COMPONENT DEV MFG | 72120 | 0% | 100% | 1 |
| 2 | EMBEDDED SYST EPFL | 72120 | 0% | 100% | 1 |
| 3 | INTEGRATED CIRCUIT SEMICOND DEVICE ENGN | 72120 | 0% | 100% | 1 |
| 4 | INTEGRATED CIRCUITS PLICAT | 72120 | 0% | 100% | 1 |
| 5 | MACRO COMPONENTS ORG | 72120 | 0% | 100% | 1 |
| 6 | RADIAT BEAM MAT ENGN OPEN STATE EDUC COMMIS | 72120 | 0% | 100% | 1 |
| 7 | SILICON GERMANIUM DEV | 72120 | 0% | 100% | 1 |
| 8 | SPACE DEV ELECT | 72120 | 0% | 100% | 1 |
| 9 | ULTRA LARGE SCALE INTEGRAT | 72120 | 0% | 100% | 1 |
| 10 | LOG TECHNOL RD | 36059 | 0% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 27238 | 18% | 0% | 77 |
| 2 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 11524 | 12% | 0% | 52 |
| 3 | IEEE ELECTRON DEVICE LETTERS | 7433 | 7% | 0% | 31 |
| 4 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 4895 | 5% | 0% | 24 |
| 5 | IEEE CIRCUITS AND DEVICES MAGAZINE | 4732 | 1% | 2% | 3 |
| 6 | SOLID-STATE ELECTRONICS | 4488 | 6% | 0% | 25 |
| 7 | DESIGN AND CULTURE | 3001 | 0% | 2% | 2 |
| 8 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2420 | 8% | 0% | 33 |
| 9 | SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 2346 | 1% | 1% | 3 |
| 10 | IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA | 2034 | 1% | 1% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |