Class information for:
Level 1: ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST

Basic class information

Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
21 4 THERMODYNAMICS//MECHANICS//ENGINEERING, MECHANICAL 471779
421 3       JOURNAL OF ELECTROSTATICS//JOURNAL OF AEROSOL SCIENCE//ELECTROHYDRODYNAMICS 30196
2822 2             ELECTROSTATIC DISCHARGE ESD//JOURNAL OF ELECTROSTATICS//ELECTROSTATIC DISCHARGE 3250
11149 1                   ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST 1031

Terms with highest relevance score



rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ELECTROSTATIC DISCHARGE ESD authKW 4429486 24% 59% 247
2 SILICON CONTROLLED RECTIFIER SCR authKW 2096380 8% 87% 79
3 NANOELECT GIGASCALE SYST address 1728866 8% 70% 81
4 ESD PROTECTION authKW 1035675 5% 71% 48
5 HOLDING VOLTAGE authKW 920621 3% 94% 32
6 ESD PROTECTION CIRCUIT authKW 641920 2% 100% 21
7 TRIGGER VOLTAGE authKW 616443 2% 92% 22
8 ESD authKW 530517 8% 20% 87
9 LATCHUP authKW 518208 3% 63% 27
10 ELECTROSTATIC DISCHARGE authKW 501817 7% 23% 71

Web of Science journal categories



chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 25658 90% 0% 929
2 Physics, Applied 8031 56% 0% 580
3 Nanoscience & Nanotechnology 5976 27% 0% 274
4 Computer Science, Hardware & Architecture 207 3% 0% 29
5 Physics, Condensed Matter 105 7% 0% 77
6 Telecommunications 79 3% 0% 31
7 Engineering, Manufacturing 72 2% 0% 18
8 Engineering, General 11 1% 0% 14
9 Computer Science, Interdisciplinary Applications 1 1% 0% 10
10 Engineering, Industrial 0 0% 0% 4

Address terms



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NANOELECT GIGASCALE SYST 1728866 8% 70% 81
2 ESD 305223 3% 37% 27
3 CORP ESD 195630 1% 80% 8
4 ESD PROTECT TECHNOL 122270 0% 100% 4
5 CORP PROC RELIABIL GRP 91703 0% 100% 3
6 ESD ENGN 91703 0% 100% 3
7 SOC TECHNOL 88048 1% 26% 11
8 ROBERT BO POWER ELECT 76414 0% 50% 5
9 MIXED SIGNAL DEVICE TECHNOL 68776 0% 75% 3
10 SHRIME 68776 0% 75% 3

Journals



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MICROELECTRONICS RELIABILITY 255656 24% 3% 248
2 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 205316 8% 8% 87
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 31330 12% 1% 127
4 IEEE ELECTRON DEVICE LETTERS 16992 7% 1% 72
5 JOURNAL OF ELECTROSTATICS 15683 4% 1% 37
6 SOLID-STATE ELECTRONICS 9540 5% 1% 56
7 IEEE JOURNAL OF SOLID-STATE CIRCUITS 6640 4% 1% 43
8 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 3218 1% 1% 8
9 IEICE TRANSACTIONS ON ELECTRONICS 2405 2% 0% 22
10 IEICE ELECTRONICS EXPRESS 2353 1% 1% 15

Author Key Words



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 ELECTROSTATIC DISCHARGE ESD 4429486 24% 59% 247 Search ELECTROSTATIC+DISCHARGE+ESD Search ELECTROSTATIC+DISCHARGE+ESD
2 SILICON CONTROLLED RECTIFIER SCR 2096380 8% 87% 79 Search SILICON+CONTROLLED+RECTIFIER+SCR Search SILICON+CONTROLLED+RECTIFIER+SCR
3 ESD PROTECTION 1035675 5% 71% 48 Search ESD+PROTECTION Search ESD+PROTECTION
4 HOLDING VOLTAGE 920621 3% 94% 32 Search HOLDING+VOLTAGE Search HOLDING+VOLTAGE
5 ESD PROTECTION CIRCUIT 641920 2% 100% 21 Search ESD+PROTECTION+CIRCUIT Search ESD+PROTECTION+CIRCUIT
6 TRIGGER VOLTAGE 616443 2% 92% 22 Search TRIGGER+VOLTAGE Search TRIGGER+VOLTAGE
7 ESD 530517 8% 20% 87 Search ESD Search ESD
8 LATCHUP 518208 3% 63% 27 Search LATCHUP Search LATCHUP
9 ELECTROSTATIC DISCHARGE 501817 7% 23% 71 Search ELECTROSTATIC+DISCHARGE Search ELECTROSTATIC+DISCHARGE
10 POWER RAIL ESD CLAMP CIRCUIT 458514 1% 100% 15 Search POWER+RAIL+ESD+CLAMP+CIRCUIT Search POWER+RAIL+ESD+CLAMP+CIRCUIT

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1



rank cluster_id2 link
1 25113 ELECTROSTATIC DISCHARGE//ESD GENERATOR//ELECTROSTATICALLY INDUCED VOLTAGE
2 21577 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
3 21229 INTENTIONAL ELECTROMAGNETIC INTERFERENCE IEMI//IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY//DIRECT POWER INJECTION DPI
4 5425 LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE
5 4663 HOT CARRIERS//HOT CARRIER DEGRADATION//HOT CARRIER EFFECT
6 37504 SCHMITT TRIGGER//COUPLED METHOD CM//1D BJT
7 36332 AE TECHNOL//VISUAL ABNORMALITIES//ALUMINUM STRIPES
8 16882 LATERAL INSULATED GATE BIPOLAR TRANSISTOR LIGBT//GATE COMMUTATED THYRISTOR GCT//EMITTER TURN OFF THYRISTOR ETO
9 19217 SELF HEATING//CHARACTERISTIC THERMAL LENGTH//BALLASTING RESISTORS
10 38674 SOVIET PHYSICS SEMICONDUCTORS-USSR//SEMICONDUCTORS//AMIRKHANOV PHYS

Go to start page