Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
21 | 4 | THERMODYNAMICS//MECHANICS//ENGINEERING, MECHANICAL | 471779 |
421 | 3 | JOURNAL OF ELECTROSTATICS//JOURNAL OF AEROSOL SCIENCE//ELECTROHYDRODYNAMICS | 30196 |
2822 | 2 | ELECTROSTATIC DISCHARGE ESD//JOURNAL OF ELECTROSTATICS//ELECTROSTATIC DISCHARGE | 3250 |
11149 | 1 | ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST | 1031 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE ESD | authKW | 4429486 | 24% | 59% | 247 |
2 | SILICON CONTROLLED RECTIFIER SCR | authKW | 2096380 | 8% | 87% | 79 |
3 | NANOELECT GIGASCALE SYST | address | 1728866 | 8% | 70% | 81 |
4 | ESD PROTECTION | authKW | 1035675 | 5% | 71% | 48 |
5 | HOLDING VOLTAGE | authKW | 920621 | 3% | 94% | 32 |
6 | ESD PROTECTION CIRCUIT | authKW | 641920 | 2% | 100% | 21 |
7 | TRIGGER VOLTAGE | authKW | 616443 | 2% | 92% | 22 |
8 | ESD | authKW | 530517 | 8% | 20% | 87 |
9 | LATCHUP | authKW | 518208 | 3% | 63% | 27 |
10 | ELECTROSTATIC DISCHARGE | authKW | 501817 | 7% | 23% | 71 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 25658 | 90% | 0% | 929 |
2 | Physics, Applied | 8031 | 56% | 0% | 580 |
3 | Nanoscience & Nanotechnology | 5976 | 27% | 0% | 274 |
4 | Computer Science, Hardware & Architecture | 207 | 3% | 0% | 29 |
5 | Physics, Condensed Matter | 105 | 7% | 0% | 77 |
6 | Telecommunications | 79 | 3% | 0% | 31 |
7 | Engineering, Manufacturing | 72 | 2% | 0% | 18 |
8 | Engineering, General | 11 | 1% | 0% | 14 |
9 | Computer Science, Interdisciplinary Applications | 1 | 1% | 0% | 10 |
10 | Engineering, Industrial | 0 | 0% | 0% | 4 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANOELECT GIGASCALE SYST | 1728866 | 8% | 70% | 81 |
2 | ESD | 305223 | 3% | 37% | 27 |
3 | CORP ESD | 195630 | 1% | 80% | 8 |
4 | ESD PROTECT TECHNOL | 122270 | 0% | 100% | 4 |
5 | CORP PROC RELIABIL GRP | 91703 | 0% | 100% | 3 |
6 | ESD ENGN | 91703 | 0% | 100% | 3 |
7 | SOC TECHNOL | 88048 | 1% | 26% | 11 |
8 | ROBERT BO POWER ELECT | 76414 | 0% | 50% | 5 |
9 | MIXED SIGNAL DEVICE TECHNOL | 68776 | 0% | 75% | 3 |
10 | SHRIME | 68776 | 0% | 75% | 3 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MICROELECTRONICS RELIABILITY | 255656 | 24% | 3% | 248 |
2 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 205316 | 8% | 8% | 87 |
3 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 31330 | 12% | 1% | 127 |
4 | IEEE ELECTRON DEVICE LETTERS | 16992 | 7% | 1% | 72 |
5 | JOURNAL OF ELECTROSTATICS | 15683 | 4% | 1% | 37 |
6 | SOLID-STATE ELECTRONICS | 9540 | 5% | 1% | 56 |
7 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 6640 | 4% | 1% | 43 |
8 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | 3218 | 1% | 1% | 8 |
9 | IEICE TRANSACTIONS ON ELECTRONICS | 2405 | 2% | 0% | 22 |
10 | IEICE ELECTRONICS EXPRESS | 2353 | 1% | 1% | 15 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE ESD | 4429486 | 24% | 59% | 247 | Search ELECTROSTATIC+DISCHARGE+ESD | Search ELECTROSTATIC+DISCHARGE+ESD |
2 | SILICON CONTROLLED RECTIFIER SCR | 2096380 | 8% | 87% | 79 | Search SILICON+CONTROLLED+RECTIFIER+SCR | Search SILICON+CONTROLLED+RECTIFIER+SCR |
3 | ESD PROTECTION | 1035675 | 5% | 71% | 48 | Search ESD+PROTECTION | Search ESD+PROTECTION |
4 | HOLDING VOLTAGE | 920621 | 3% | 94% | 32 | Search HOLDING+VOLTAGE | Search HOLDING+VOLTAGE |
5 | ESD PROTECTION CIRCUIT | 641920 | 2% | 100% | 21 | Search ESD+PROTECTION+CIRCUIT | Search ESD+PROTECTION+CIRCUIT |
6 | TRIGGER VOLTAGE | 616443 | 2% | 92% | 22 | Search TRIGGER+VOLTAGE | Search TRIGGER+VOLTAGE |
7 | ESD | 530517 | 8% | 20% | 87 | Search ESD | Search ESD |
8 | LATCHUP | 518208 | 3% | 63% | 27 | Search LATCHUP | Search LATCHUP |
9 | ELECTROSTATIC DISCHARGE | 501817 | 7% | 23% | 71 | Search ELECTROSTATIC+DISCHARGE | Search ELECTROSTATIC+DISCHARGE |
10 | POWER RAIL ESD CLAMP CIRCUIT | 458514 | 1% | 100% | 15 | Search POWER+RAIL+ESD+CLAMP+CIRCUIT | Search POWER+RAIL+ESD+CLAMP+CIRCUIT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |