Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
21 | 4 | THERMODYNAMICS//MECHANICS//ENGINEERING, MECHANICAL | 471779 |
421 | 3 | JOURNAL OF ELECTROSTATICS//JOURNAL OF AEROSOL SCIENCE//ELECTROHYDRODYNAMICS | 30196 |
2822 | 2 | ELECTROSTATIC DISCHARGE ESD//JOURNAL OF ELECTROSTATICS//ELECTROSTATIC DISCHARGE | 3250 |
7012 | 1 | ELECTROSTATIC SEPARATION//TRIBOELECTRIFICATION//TRIBOCHARGING | 1443 |
11149 | 1 | ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST | 1031 |
20945 | 1 | JOURNAL OF ELECTROSTATICS//BRUSH DISCHARGE//IONIZER | 462 |
25113 | 1 | ELECTROSTATIC DISCHARGE//ESD GENERATOR//ELECTROSTATICALLY INDUCED VOLTAGE | 314 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE ESD | authKW | 1818284 | 9% | 67% | 281 |
2 | JOURNAL OF ELECTROSTATICS | journal | 1239842 | 18% | 22% | 583 |
3 | ELECTROSTATIC DISCHARGE | authKW | 729513 | 5% | 50% | 152 |
4 | ELECTROSTATIC SEPARATION | authKW | 697471 | 3% | 72% | 100 |
5 | SILICON CONTROLLED RECTIFIER SCR | authKW | 664928 | 2% | 87% | 79 |
6 | NANOELECT GIGASCALE SYST | address | 561964 | 3% | 71% | 82 |
7 | TRIBOCHARGING | authKW | 422900 | 2% | 64% | 68 |
8 | ESD | authKW | 405095 | 4% | 31% | 135 |
9 | TRIBOELECTRIFICATION | authKW | 403844 | 2% | 61% | 68 |
10 | ESD PROTECTION | authKW | 342314 | 2% | 72% | 49 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 34540 | 60% | 0% | 1948 |
2 | Physics, Applied | 4490 | 26% | 0% | 837 |
3 | Engineering, General | 2598 | 7% | 0% | 237 |
4 | Engineering, Chemical | 2506 | 13% | 0% | 416 |
5 | Nanoscience & Nanotechnology | 2031 | 9% | 0% | 308 |
6 | Imaging Science & Photographic Technology | 474 | 2% | 0% | 62 |
7 | Telecommunications | 272 | 3% | 0% | 101 |
8 | Mining & Mineral Processing | 157 | 1% | 0% | 27 |
9 | Engineering, Mechanical | 83 | 3% | 0% | 84 |
10 | Materials Science, Textiles | 63 | 1% | 0% | 19 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANOELECT GIGASCALE SYST | 561964 | 3% | 71% | 82 |
2 | UP EA 1219 | 254808 | 1% | 91% | 29 |
3 | HIGH INTENS ELECT FIELDS | 205156 | 1% | 92% | 23 |
4 | ELECT ELE OSTAT UNIT | 165334 | 1% | 95% | 18 |
5 | IRECOM | 133334 | 1% | 51% | 27 |
6 | ESD | 119500 | 1% | 41% | 30 |
7 | ELECT SAFETY GRP | 117038 | 0% | 93% | 13 |
8 | LAII ESIP | 109068 | 0% | 75% | 15 |
9 | PL ELE OSTAT | 78515 | 1% | 45% | 18 |
10 | CORP ESD | 62049 | 0% | 80% | 8 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTROSTATICS | 1239842 | 18% | 22% | 583 |
2 | MICROELECTRONICS RELIABILITY | 86751 | 8% | 4% | 257 |
3 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 72712 | 3% | 8% | 92 |
4 | IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 52077 | 6% | 3% | 202 |
5 | PARTICULATE SCIENCE AND TECHNOLOGY | 16689 | 1% | 4% | 41 |
6 | JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY | 13487 | 1% | 3% | 48 |
7 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 9767 | 4% | 1% | 127 |
8 | POWDER TECHNOLOGY | 6631 | 3% | 1% | 84 |
9 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 5600 | 1% | 1% | 44 |
10 | IEEE ELECTRON DEVICE LETTERS | 5443 | 2% | 1% | 73 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |