Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 1564 | 2 | MULTICRYSTALLINE SILICON//IEEE JOURNAL OF PHOTOVOLTAICS//SILICON SOLAR CELLS | 7597 |
| 36332 | 1 | AE TECHNOL//VISUAL ABNORMALITIES//ALUMINUM STRIPES | 100 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | AE TECHNOL | address | 630342 | 2% | 100% | 2 |
| 2 | VISUAL ABNORMALITIES | authKW | 420226 | 2% | 67% | 2 |
| 3 | ALUMINUM STRIPES | authKW | 315171 | 1% | 100% | 1 |
| 4 | CMOSLSI | authKW | 315171 | 1% | 100% | 1 |
| 5 | CNES THALES | address | 315171 | 1% | 100% | 1 |
| 6 | COMMUN NXP CRISMATLAMIPSUMR 6508 | address | 315171 | 1% | 100% | 1 |
| 7 | DEFECT MODE CLASSIFICATION | authKW | 315171 | 1% | 100% | 1 |
| 8 | DYNAMIC LASER TESTING | authKW | 315171 | 1% | 100% | 1 |
| 9 | E HPA DEVICE ANAL OPERAT | address | 315171 | 1% | 100% | 1 |
| 10 | ELECT TELECOMMUN INFORMAT PROC | address | 315171 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Nanoscience & Nanotechnology | 1088 | 36% | 0% | 36 |
| 2 | Physics, Applied | 1059 | 65% | 0% | 65 |
| 3 | Engineering, Electrical & Electronic | 755 | 51% | 0% | 51 |
| 4 | Optics | 210 | 20% | 0% | 20 |
| 5 | Computer Science, Hardware & Architecture | 44 | 4% | 0% | 4 |
| 6 | Instruments & Instrumentation | 17 | 5% | 0% | 5 |
| 7 | Computer Science, Information Systems | 17 | 4% | 0% | 4 |
| 8 | Materials Science, Characterization, Testing | 5 | 1% | 0% | 1 |
| 9 | Computer Science, Software Engineering | 4 | 2% | 0% | 2 |
| 10 | Physics, Condensed Matter | 3 | 5% | 0% | 5 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | AE TECHNOL | 630342 | 2% | 100% | 2 |
| 2 | CNES THALES | 315171 | 1% | 100% | 1 |
| 3 | COMMUN NXP CRISMATLAMIPSUMR 6508 | 315171 | 1% | 100% | 1 |
| 4 | E HPA DEVICE ANAL OPERAT | 315171 | 1% | 100% | 1 |
| 5 | ELECT TELECOMMUN INFORMAT PROC | 315171 | 1% | 100% | 1 |
| 6 | LSI MFG | 315171 | 1% | 100% | 1 |
| 7 | MICROELECT FAILURE ANAL | 315171 | 1% | 100% | 1 |
| 8 | MP TI PT2 PRE3 | 315171 | 1% | 100% | 1 |
| 9 | NST CENIDE | 315171 | 1% | 100% | 1 |
| 10 | TECHNOL DEV INFORMAT PROC | 315171 | 1% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MICROELECTRONICS RELIABILITY | 46695 | 33% | 0% | 33 |
| 2 | NEC RESEARCH & DEVELOPMENT | 2887 | 2% | 0% | 2 |
| 3 | IEEE DESIGN & TEST OF COMPUTERS | 1273 | 2% | 0% | 2 |
| 4 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 1116 | 2% | 0% | 2 |
| 5 | APPLIED OPTICS | 422 | 7% | 0% | 7 |
| 6 | UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS | 418 | 1% | 0% | 1 |
| 7 | MICROELECTRONICS AND RELIABILITY | 398 | 1% | 0% | 1 |
| 8 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 283 | 1% | 0% | 1 |
| 9 | IEEE JOURNAL OF PHOTOVOLTAICS | 246 | 1% | 0% | 1 |
| 10 | IEICE TRANSACTIONS ON ELECTRONICS | 205 | 2% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |