Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 1564 | 2 | MULTICRYSTALLINE SILICON//IEEE JOURNAL OF PHOTOVOLTAICS//SILICON SOLAR CELLS | 7597 |
| 22635 | 1 | CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE | 396 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CARL EMILY FUCHS MICROELECT | address | 536147 | 4% | 42% | 16 |
| 2 | CEFIM | address | 318348 | 1% | 100% | 4 |
| 3 | HOT CARRIER LUMINESCENCE | authKW | 318348 | 1% | 100% | 4 |
| 4 | SEMICONDUCTOR INTEGRATED OPTOELECTRONICS | authKW | 318348 | 1% | 100% | 4 |
| 5 | SI LED | authKW | 254677 | 1% | 80% | 4 |
| 6 | SILICON LED | authKW | 254677 | 1% | 80% | 4 |
| 7 | ELECTRON HOLE PLASMA RECOMBINATION | authKW | 238761 | 1% | 100% | 3 |
| 8 | SI LIGHT EMITTING DEVICES | authKW | 238761 | 1% | 100% | 3 |
| 9 | MOS TUNNELING DIODE | authKW | 179069 | 1% | 75% | 3 |
| 10 | CMOS INTEGRATED CIRCUIT TECHNOLOGY | authKW | 159174 | 1% | 100% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 3876 | 63% | 0% | 248 |
| 2 | Engineering, Electrical & Electronic | 2898 | 50% | 0% | 199 |
| 3 | Nanoscience & Nanotechnology | 1394 | 21% | 0% | 83 |
| 4 | Optics | 614 | 17% | 0% | 69 |
| 5 | Physics, Condensed Matter | 398 | 18% | 0% | 72 |
| 6 | Materials Science, Multidisciplinary | 99 | 14% | 0% | 57 |
| 7 | Materials Science, Coatings & Films | 72 | 4% | 0% | 14 |
| 8 | Instruments & Instrumentation | 18 | 3% | 0% | 12 |
| 9 | Computer Science, Hardware & Architecture | 11 | 1% | 0% | 5 |
| 10 | Architecture | 8 | 0% | 0% | 1 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CARL EMILY FUCHS MICROELECT | 536147 | 4% | 42% | 16 |
| 2 | CEFIM | 318348 | 1% | 100% | 4 |
| 3 | ENS BEN SOUDA | 159174 | 1% | 100% | 2 |
| 4 | INNOVAT ELECT SYST | 159174 | 1% | 100% | 2 |
| 5 | PROPULS FLUID MECH | 159174 | 1% | 100% | 2 |
| 6 | INRF | 106115 | 1% | 67% | 2 |
| 7 | TELECOMS GRP | 106115 | 1% | 67% | 2 |
| 8 | CREDENCE DIAGNOST GRP | 79587 | 0% | 100% | 1 |
| 9 | ELECT BUSIENESS GRP | 79587 | 0% | 100% | 1 |
| 10 | ELECT BUSINESS GRP | 79587 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MICROELECTRONICS RELIABILITY | 28101 | 13% | 1% | 51 |
| 2 | MONUMENTS HISTORIQUES | 3458 | 0% | 4% | 1 |
| 3 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 3137 | 6% | 0% | 25 |
| 4 | SOLID-STATE ELECTRONICS | 2282 | 4% | 0% | 17 |
| 5 | IEEE ELECTRON DEVICE LETTERS | 1906 | 4% | 0% | 15 |
| 6 | MICROELECTRONIC ENGINEERING | 1486 | 4% | 0% | 14 |
| 7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 960 | 3% | 0% | 10 |
| 8 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 789 | 1% | 0% | 4 |
| 9 | IEEE DESIGN & TEST OF COMPUTERS | 720 | 1% | 0% | 3 |
| 10 | IEICE TRANSACTIONS ON ELECTRONICS | 632 | 2% | 0% | 7 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |