Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 215 | 3 | JOURNAL OF CRYSTAL GROWTH//HGCDTE//SOVIET PHYSICS SEMICONDUCTORS-USSR | 51359 |
| 3960 | 2 | PIEZOOPTIC EFFECT//UKRAINIAN JOURNAL OF PHYSICAL OPTICS//MICROSCOPE | 849 |
| 33283 | 1 | MICROSCOPE//EUROPEAN QUAL//LIGHT SCATTERING TOMOGRAPHY | 140 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | MICROSCOPE | journal | 1225644 | 10% | 39% | 14 |
| 2 | EUROPEAN QUAL | address | 300161 | 1% | 67% | 2 |
| 3 | LIGHT SCATTERING TOMOGRAPHY | authKW | 240124 | 3% | 27% | 4 |
| 4 | AFM BASED NANOPROBER | authKW | 225121 | 1% | 100% | 1 |
| 5 | CHARACTERIZATION OF EPITAXY | authKW | 225121 | 1% | 100% | 1 |
| 6 | CZ SI WAFER | authKW | 225121 | 1% | 100% | 1 |
| 7 | DYNAMIC EMISSION MICROSCOPY | authKW | 225121 | 1% | 100% | 1 |
| 8 | ELECTRONIC STATES OF DEFECTS | authKW | 225121 | 1% | 100% | 1 |
| 9 | EPITAXIAL LAYER OF SEMICONDUCTORS | authKW | 225121 | 1% | 100% | 1 |
| 10 | GATE OXIDE RUPTURE DEFECT | authKW | 225121 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 821 | 49% | 0% | 69 |
| 2 | Crystallography | 336 | 14% | 0% | 19 |
| 3 | Materials Science, Multidisciplinary | 236 | 31% | 0% | 43 |
| 4 | Physics, Condensed Matter | 161 | 19% | 0% | 27 |
| 5 | Microscopy | 92 | 3% | 0% | 4 |
| 6 | Metallurgy & Metallurgical Engineering | 61 | 8% | 0% | 11 |
| 7 | Nanoscience & Nanotechnology | 35 | 6% | 0% | 9 |
| 8 | Physics, Multidisciplinary | 26 | 8% | 0% | 11 |
| 9 | Instruments & Instrumentation | 24 | 5% | 0% | 7 |
| 10 | Engineering, Electrical & Electronic | 18 | 9% | 0% | 13 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | EUROPEAN QUAL | 300161 | 1% | 67% | 2 |
| 2 | SOLID STATE PL PHYS GRP | 225121 | 1% | 100% | 1 |
| 3 | TLS ANALOG QUAL | 225121 | 1% | 100% | 1 |
| 4 | LASER SCI GRP | 225119 | 1% | 50% | 2 |
| 5 | TOULOUSE PROD ANAL | 56279 | 1% | 25% | 1 |
| 6 | CNRSUMR 6242 | 22510 | 1% | 10% | 1 |
| 7 | ELECT DEVICES CO | 20464 | 1% | 9% | 1 |
| 8 | PROD ANAL | 16078 | 1% | 7% | 1 |
| 9 | PHYS TOSHIMA KU | 15006 | 1% | 7% | 1 |
| 10 | DIAGNOST GRP | 11254 | 1% | 5% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MICROSCOPE | 1225644 | 10% | 39% | 14 |
| 2 | PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 6195 | 7% | 0% | 10 |
| 3 | PHILIPS TECHNICAL REVIEW | 2812 | 1% | 1% | 1 |
| 4 | MICROELECTRONICS RELIABILITY | 1947 | 6% | 0% | 8 |
| 5 | MICROSCOPICA ACTA | 1629 | 1% | 1% | 1 |
| 6 | JOURNAL OF CRYSTAL GROWTH | 1598 | 11% | 0% | 15 |
| 7 | KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1152 | 1% | 1% | 1 |
| 8 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 1122 | 5% | 0% | 7 |
| 9 | JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 880 | 2% | 0% | 3 |
| 10 | INDUSTRIAL DIAMOND REVIEW | 848 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |