Class information for:
Level 1: ELECTRON BEAM INDUCED CURRENT//EBIC//LEHRSTUHL ELEKT

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
1564 2             MULTICRYSTALLINE SILICON//IEEE JOURNAL OF PHOTOVOLTAICS//SILICON SOLAR CELLS 7597
10359 1                   ELECTRON BEAM INDUCED CURRENT//EBIC//LEHRSTUHL ELEKT 1100

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ELECTRON BEAM INDUCED CURRENT authKW 301147 3% 36% 29
2 EBIC authKW 208851 3% 21% 35
3 LEHRSTUHL ELEKT address 95487 1% 33% 10
4 IVANOVO BRANCH address 85950 0% 100% 3
5 DIFFUSION LENGTH authKW 79539 2% 11% 25
6 SEMICONDUCTOR MATERIAL MEASUREMENTS authKW 76398 0% 67% 4
7 ELECTRON BEAM APPLICATIONS authKW 74847 1% 29% 9
8 EBIC CONTRAST authKW 64461 0% 75% 3
9 SPACE MAT SCI address 58454 1% 20% 10
10 PHYS CHEM STUDIES MAT LEPCM address 57300 0% 100% 2

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Microscopy 12540 12% 0% 127
2 Physics, Applied 5345 45% 0% 497
3 Physics, Condensed Matter 5340 37% 0% 407
4 Physics, Multidisciplinary 2032 21% 0% 228
5 Materials Science, Multidisciplinary 907 23% 0% 250
6 Engineering, Electrical & Electronic 391 13% 0% 148
7 Instruments & Instrumentation 159 5% 0% 51
8 Materials Science, Characterization, Testing 88 1% 0% 14
9 Crystallography 44 2% 0% 26
10 Nanoscience & Nanotechnology 42 3% 0% 35

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 LEHRSTUHL ELEKT 95487 1% 33% 10
2 IVANOVO BRANCH 85950 0% 100% 3
3 SPACE MAT SCI 58454 1% 20% 10
4 PHYS CHEM STUDIES MAT LEPCM 57300 0% 100% 2
5 PHYS RADIAT THEIR INTERACT MATTER PRIMA 57300 0% 100% 2
6 KALUGA BRANCH 50913 1% 15% 12
7 MICROELECT TECHNOL PROBLEM 38199 0% 67% 2
8 RECH NANOSCI EA4682 38199 0% 67% 2
9 EA 3799 35985 1% 18% 7
10 MICROELECT TECHNOL 33574 2% 5% 26

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 INSTITUTE OF PHYSICS CONFERENCE SERIES 19675 7% 1% 82
2 IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA 16210 5% 1% 53
3 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 14066 9% 0% 101
4 SCANNING 12190 2% 2% 27
5 SOLID STATE PHENOMENA 11667 3% 1% 30
6 JOURNAL OF SURFACE INVESTIGATION 11498 2% 2% 23
7 IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA 8249 3% 1% 31
8 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 8185 4% 1% 46
9 JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES 7350 1% 3% 9
10 REVUE DE PHYSIQUE APPLIQUEE 6258 2% 1% 17

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 ELECTRON BEAM INDUCED CURRENT 301147 3% 36% 29 Search ELECTRON+BEAM+INDUCED+CURRENT Search ELECTRON+BEAM+INDUCED+CURRENT
2 EBIC 208851 3% 21% 35 Search EBIC Search EBIC
3 DIFFUSION LENGTH 79539 2% 11% 25 Search DIFFUSION+LENGTH Search DIFFUSION+LENGTH
4 SEMICONDUCTOR MATERIAL MEASUREMENTS 76398 0% 67% 4 Search SEMICONDUCTOR+MATERIAL+MEASUREMENTS Search SEMICONDUCTOR+MATERIAL+MEASUREMENTS
5 ELECTRON BEAM APPLICATIONS 74847 1% 29% 9 Search ELECTRON+BEAM+APPLICATIONS Search ELECTRON+BEAM+APPLICATIONS
6 EBIC CONTRAST 64461 0% 75% 3 Search EBIC+CONTRAST Search EBIC+CONTRAST
7 SCANNING DEEP LEVEL TRANSIENT SPECTROSCOPY 57300 0% 100% 2 Search SCANNING+DEEP+LEVEL+TRANSIENT+SPECTROSCOPY Search SCANNING+DEEP+LEVEL+TRANSIENT+SPECTROSCOPY
8 SEMICONDUCTOR STRUCTURE MEASUREMENT 57300 0% 100% 2 Search SEMICONDUCTOR+STRUCTURE+MEASUREMENT Search SEMICONDUCTOR+STRUCTURE+MEASUREMENT
9 COLLECTION PROBABILITY 51568 0% 60% 3 Search COLLECTION+PROBABILITY Search COLLECTION+PROBABILITY
10 TRANSPORT IMAGING 42972 0% 50% 3 Search TRANSPORT+IMAGING Search TRANSPORT+IMAGING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 29725 PHOTON RECYCLING//1D DRIFT DIFFUSION SIMULATIONS//BIPOLAR TRANSISTOR STRUCTURES
2 36332 AE TECHNOL//VISUAL ABNORMALITIES//ALUMINUM STRIPES
3 15641 D LINES//DISLOCATION ENGINEERING//THERMODONORS
4 11891 SOLAR CELLS//DEVICE FUNCT SECT//DIFFUSION TEMPERATURE
5 10375 MULTICRYSTALLINE SILICON//DIRECTIONAL SOLIDIFICATION//SEMICONDUCTING SILICON
6 27693 ALXGA1 XP//VAPOR PRESSURE CONTROL//GAP N
7 34231 CL IMAGE CONTRAST//ELECTRO PHYSICAL MEASUREMENTS//FINE DISPERSED STRUCTURE
8 31674 CNRS URA 234//DIFFERENTIAL MICROCALORIMETER//ELE OOPT GP
9 28895 SOVIET PHYSICS SEMICONDUCTORS-USSR//AIII B V//CARRIERS CAPTURE
10 22275 LOCK IN THERMOGRAPHY//SATURATION CURRENT DENSITY IMAGING//PHOTOLUMINESCENCE IMAGING

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