Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 6 | 4 | CHEMISTRY, ORGANIC//CHEMISTRY, INORGANIC & NUCLEAR//CHEMISTRY, MULTIDISCIPLINARY | 1698077 |
| 249 | 3 | CHEMISTRY, INORGANIC & NUCLEAR//JOURNAL OF ORGANOMETALLIC CHEMISTRY//CARBORANES | 46863 |
| 3118 | 2 | METALLASILSESQUIOXANES//SILANETRIOL//CYCLOSILOXANES | 2461 |
| 34231 | 1 | CL IMAGE CONTRAST//ELECTRO PHYSICAL MEASUREMENTS//FINE DISPERSED STRUCTURE | 127 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CL IMAGE CONTRAST | authKW | 248166 | 1% | 100% | 1 |
| 2 | ELECTRO PHYSICAL MEASUREMENTS | authKW | 248166 | 1% | 100% | 1 |
| 3 | FINE DISPERSED STRUCTURE | authKW | 248166 | 1% | 100% | 1 |
| 4 | GREEN LASER HETEROSTRUCTURES | authKW | 248166 | 1% | 100% | 1 |
| 5 | MULTILAYERS SEMICONDUCTORS NANOSTRUCTURES | authKW | 248166 | 1% | 100% | 1 |
| 6 | ON P TYPE AND ON N TYPE SI | authKW | 248166 | 1% | 100% | 1 |
| 7 | RANDOM VALUE | authKW | 248166 | 1% | 100% | 1 |
| 8 | THE STRUCTURE OF SI SIO2 | authKW | 248166 | 1% | 100% | 1 |
| 9 | BETA TIN STRUCTURE | authKW | 124082 | 1% | 50% | 1 |
| 10 | CATHODOLUMINESENCE | authKW | 124082 | 1% | 50% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 589 | 36% | 0% | 46 |
| 2 | Physics, Applied | 219 | 28% | 0% | 36 |
| 3 | Microscopy | 162 | 4% | 0% | 5 |
| 4 | Multidisciplinary Sciences | 121 | 6% | 0% | 7 |
| 5 | Materials Science, Multidisciplinary | 66 | 19% | 0% | 24 |
| 6 | Physics, Multidisciplinary | 55 | 11% | 0% | 14 |
| 7 | Chemistry, Multidisciplinary | 29 | 13% | 0% | 16 |
| 8 | Spectroscopy | 19 | 4% | 0% | 5 |
| 9 | Materials Science, Coatings & Films | 18 | 3% | 0% | 4 |
| 10 | Polymer Science | 17 | 6% | 0% | 7 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | MIN METALS MAT ENGN | 35451 | 1% | 14% | 1 |
| 2 | PL MINERAL RADIOGEOCHEM | 35451 | 1% | 14% | 1 |
| 3 | ARIZONA NANOELECT | 24815 | 1% | 10% | 1 |
| 4 | IOFFE PHYSICAL TECH | 17724 | 1% | 7% | 1 |
| 5 | AF IOFFE PHYSICOTECH | 10148 | 12% | 0% | 15 |
| 6 | AF IOFFE | 6892 | 1% | 3% | 1 |
| 7 | AF IOFFE PHYS TECH | 6376 | 7% | 0% | 9 |
| 8 | INTEGRATED CIRCUIT FAILURE ANAL RELIABIL | 3702 | 1% | 1% | 1 |
| 9 | IRA A FULTON ENGN | 2541 | 2% | 1% | 2 |
| 10 | FOCK PHYS | 2337 | 2% | 0% | 2 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | DOKLADY AKADEMII NAUK BELARUSI | 5522 | 6% | 0% | 8 |
| 2 | SEMICONDUCTORS | 4316 | 9% | 0% | 11 |
| 3 | SOVIET MICROELECTRONICS | 3316 | 2% | 1% | 2 |
| 4 | PHYSICS OF THE SOLID STATE | 2383 | 7% | 0% | 9 |
| 5 | IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA | 1799 | 5% | 0% | 6 |
| 6 | SCANNING | 1303 | 2% | 0% | 3 |
| 7 | VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 2 KHIMIYA | 1128 | 2% | 0% | 3 |
| 8 | SOLID STATE PHENOMENA | 1010 | 2% | 0% | 3 |
| 9 | ACTA PHYSICA HUNGARICA | 960 | 1% | 0% | 1 |
| 10 | JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 786 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |