Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
1116 | 2 | SILICON OXYNITRIDE//BORON PENETRATION//SILICON NITRIDE | 10021 |
23492 | 1 | A SIOX IR SPECTROSCOPY//ADV GLASS RD CNT//ASTRONOMICAL TELESCOPE MIRROR | 367 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | A SIOX IR SPECTROSCOPY | authKW | 85876 | 0% | 100% | 1 |
2 | ADV GLASS RD CNT | address | 85876 | 0% | 100% | 1 |
3 | ASTRONOMICAL TELESCOPE MIRROR | authKW | 85876 | 0% | 100% | 1 |
4 | BEIJING SOLAR ENERGY BLDG ENERGY SAVING | address | 85876 | 0% | 100% | 1 |
5 | CATHODE SURFACE SPUTTERING | authKW | 85876 | 0% | 100% | 1 |
6 | CHIM SOLIDES PULVERULENTS | address | 85876 | 0% | 100% | 1 |
7 | DIELECTRIC CONSTANT IN INFRARED RANGE | authKW | 85876 | 0% | 100% | 1 |
8 | ELECTRIC BEAM EVAPORATING | authKW | 85876 | 0% | 100% | 1 |
9 | FORMAL VALENCE STATE | authKW | 85876 | 0% | 100% | 1 |
10 | GAUSSIAN OSCILLATOR MODEL | authKW | 85876 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 2141 | 40% | 0% | 148 |
2 | Materials Science, Multidisciplinary | 1220 | 41% | 0% | 152 |
3 | Materials Science, Coatings & Films | 789 | 11% | 0% | 40 |
4 | Physics, Applied | 748 | 31% | 0% | 112 |
5 | Materials Science, Ceramics | 503 | 8% | 0% | 28 |
6 | Physics, Multidisciplinary | 96 | 9% | 0% | 33 |
7 | Optics | 44 | 6% | 0% | 22 |
8 | Physics, Atomic, Molecular & Chemical | 18 | 4% | 0% | 15 |
9 | Engineering, Electrical & Electronic | 13 | 6% | 0% | 23 |
10 | Electrochemistry | 8 | 2% | 0% | 7 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ADV GLASS RD CNT | 85876 | 0% | 100% | 1 |
2 | BEIJING SOLAR ENERGY BLDG ENERGY SAVING | 85876 | 0% | 100% | 1 |
3 | CHIM SOLIDES PULVERULENTS | 85876 | 0% | 100% | 1 |
4 | MOTOROLA INC | 85876 | 0% | 100% | 1 |
5 | USTU UPI | 85876 | 0% | 100% | 1 |
6 | VYE LASHKAREV SEMICOND PHYS | 85876 | 0% | 100% | 1 |
7 | XRAY EMISS SPECT | 57248 | 1% | 33% | 2 |
8 | PHYS MET URAL | 42937 | 0% | 50% | 1 |
9 | REACT PROTECT MAT | 42937 | 0% | 50% | 1 |
10 | TIANJIN OPT THIN FILM | 38639 | 1% | 15% | 3 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | VESTNIK LENINGRADSKOGO UNIVERSITETA SERIYA FIZIKA KHIMIYA | 6500 | 2% | 1% | 7 |
2 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2782 | 7% | 0% | 26 |
3 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 2296 | 7% | 0% | 25 |
4 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2068 | 6% | 0% | 22 |
5 | JOURNAL OF MATERIALS SCIENCE LETTERS | 1981 | 4% | 0% | 16 |
6 | JOURNAL OF MATERIALS SCIENCE | 1892 | 7% | 0% | 26 |
7 | THIN SOLID FILMS | 1434 | 7% | 0% | 25 |
8 | UKRAINSKII FIZICHESKII ZHURNAL | 644 | 1% | 0% | 5 |
9 | SOLID STATE COMMUNICATIONS | 634 | 4% | 0% | 14 |
10 | REVUE ROUMAINE DE PHYSIQUE | 631 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |