Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 1116 | 2 | SILICON OXYNITRIDE//BORON PENETRATION//SILICON NITRIDE | 10021 |
| 29260 | 1 | MSOS O P STRUCTURE//SEMI INSULATING POLYCRYSTALLINE SILICON//SIPOS | 207 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | MSOS O P STRUCTURE | authKW | 304511 | 1% | 100% | 2 |
| 2 | SEMI INSULATING POLYCRYSTALLINE SILICON | authKW | 274057 | 1% | 60% | 3 |
| 3 | SIPOS | authKW | 195753 | 1% | 43% | 3 |
| 4 | CARRIER TRANSPORTATION MECHANISM | authKW | 152255 | 0% | 100% | 1 |
| 5 | CCMOGRP MICROELECT VISUALISAT | address | 152255 | 0% | 100% | 1 |
| 6 | COMBINATION OXIDES | authKW | 152255 | 0% | 100% | 1 |
| 7 | CV CHARACTERISATION | authKW | 152255 | 0% | 100% | 1 |
| 8 | CV CHARACTERIZATION | authKW | 152255 | 0% | 100% | 1 |
| 9 | GAUSSIAN TRAP DISTRIBUTION | authKW | 152255 | 0% | 100% | 1 |
| 10 | GRP MICROELE ON VISUALIZAT | address | 152255 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 1689 | 57% | 0% | 119 |
| 2 | Materials Science, Coatings & Films | 1385 | 19% | 0% | 39 |
| 3 | Electrochemistry | 561 | 14% | 0% | 30 |
| 4 | COMPUTER APPLICATIONS & CYBERNETICS | 517 | 1% | 0% | 3 |
| 5 | Engineering, Electrical & Electronic | 510 | 30% | 0% | 63 |
| 6 | Physics, Condensed Matter | 240 | 19% | 0% | 40 |
| 7 | Materials Science, Multidisciplinary | 129 | 20% | 0% | 42 |
| 8 | Nanoscience & Nanotechnology | 33 | 5% | 0% | 11 |
| 9 | Instruments & Instrumentation | 2 | 2% | 0% | 4 |
| 10 | Telecommunications | 2 | 1% | 0% | 3 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CCMOGRP MICROELECT VISUALISAT | 152255 | 0% | 100% | 1 |
| 2 | GRP MICROELE ON VISUALIZAT | 152255 | 0% | 100% | 1 |
| 3 | IC FAILURE ANAL RE IL | 152255 | 0% | 100% | 1 |
| 4 | MAT FOTON OPTOELETRON | 152255 | 0% | 100% | 1 |
| 5 | SEMICOND TECHNOL PL STAR GRP | 152255 | 0% | 100% | 1 |
| 6 | CNRSURA 1648 | 76127 | 0% | 50% | 1 |
| 7 | MODELING CONCEPT CIRCUITS ELECT | 76127 | 0% | 50% | 1 |
| 8 | URA 1648 | 76127 | 0% | 50% | 1 |
| 9 | ENSIGC GENIE CHIM | 50750 | 0% | 33% | 1 |
| 10 | MICROELE ON PL | 38062 | 0% | 25% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | RCA REVIEW | 7131 | 1% | 2% | 3 |
| 2 | PROCEEDINGS OF THE SID | 4871 | 1% | 1% | 3 |
| 3 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 3870 | 14% | 0% | 28 |
| 4 | EDN MAGAZINE-ELECTRICAL DESIGN NEWS | 3308 | 0% | 2% | 1 |
| 5 | ELECTRON DEVICE LETTERS | 2019 | 1% | 1% | 2 |
| 6 | JOURNAL OF APPLIED PHYSICS | 1924 | 18% | 0% | 37 |
| 7 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 1622 | 6% | 0% | 13 |
| 8 | ELECTRONICS | 1542 | 1% | 1% | 2 |
| 9 | IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE | 1448 | 0% | 1% | 1 |
| 10 | SOLID-STATE ELECTRONICS | 965 | 4% | 0% | 8 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |