Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
1733 | 2 | HETEROJUNCTION BIPOLAR TRANSISTORS//SIGEHBT//HBT | 6879 |
16004 | 1 | PASSIVATED CONTACT//PASSIVATING CONTACT//POLYSILICON EMITTER | 705 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | PASSIVATED CONTACT | authKW | 357619 | 2% | 67% | 12 |
2 | PASSIVATING CONTACT | authKW | 223517 | 1% | 100% | 5 |
3 | POLYSILICON EMITTER | authKW | 212863 | 1% | 48% | 10 |
4 | POLYSILICON EMITTER TRANSISTOR | authKW | 89407 | 0% | 100% | 2 |
5 | INTERFACIAL OXIDE | authKW | 69842 | 1% | 31% | 5 |
6 | TUNNEL OXIDE | authKW | 66522 | 1% | 19% | 8 |
7 | CARRIER SELECTIVE CONTACT | authKW | 57472 | 0% | 43% | 3 |
8 | IEEE TRANSACTIONS ON ELECTRON DEVICES | journal | 51921 | 19% | 1% | 135 |
9 | PHYS MECAN MAT MET | address | 50288 | 0% | 38% | 3 |
10 | ABNORMAL FILM GROWTH | authKW | 44703 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 8041 | 62% | 0% | 437 |
2 | Physics, Applied | 4278 | 50% | 0% | 353 |
3 | Physics, Condensed Matter | 322 | 13% | 0% | 92 |
4 | Materials Science, Coatings & Films | 279 | 5% | 0% | 35 |
5 | Telecommunications | 128 | 4% | 0% | 30 |
6 | Materials Science, Multidisciplinary | 98 | 12% | 0% | 83 |
7 | Electrochemistry | 73 | 3% | 0% | 24 |
8 | Energy & Fuels | 56 | 4% | 0% | 27 |
9 | Microscopy | 47 | 1% | 0% | 7 |
10 | Computer Science, Hardware & Architecture | 35 | 2% | 0% | 11 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PHYS MECAN MAT MET | 50288 | 0% | 38% | 3 |
2 | BIPOLAR DEVICES CIRCUITS GRP | 44703 | 0% | 100% | 1 |
3 | COMP AIDED DEVICE DESIGN | 44703 | 0% | 100% | 1 |
4 | DEVICE TECHNOL EKT | 44703 | 0% | 100% | 1 |
5 | ELE DEVICE RELIABIL SECT | 44703 | 0% | 100% | 1 |
6 | INTER UNIV MICRO ELECT REG LYONNAISE | 44703 | 0% | 100% | 1 |
7 | ITRT ELECT SERV ORG | 44703 | 0% | 100% | 1 |
8 | MICROELECT TECHNOL SPECIAL PUR MAT | 44703 | 0% | 100% | 1 |
9 | PHD PROGRAM IND ENGN | 44703 | 0% | 100% | 1 |
10 | SECURE MOBILE SYST | 44703 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 51921 | 19% | 1% | 135 |
2 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 28982 | 10% | 1% | 74 |
3 | IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE | 27233 | 1% | 8% | 8 |
4 | IEEE ELECTRON DEVICE LETTERS | 10585 | 7% | 1% | 47 |
5 | SOLID-STATE ELECTRONICS | 7855 | 6% | 0% | 42 |
6 | SOVIET MICROELECTRONICS | 7312 | 1% | 2% | 7 |
7 | ISSCC DIGEST OF TECHNICAL PAPERS | 4060 | 0% | 5% | 2 |
8 | SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 4039 | 1% | 2% | 5 |
9 | IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA | 3228 | 1% | 1% | 8 |
10 | IEEE JOURNAL OF PHOTOVOLTAICS | 2233 | 1% | 1% | 8 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |