Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
1733 | 2 | HETEROJUNCTION BIPOLAR TRANSISTORS//SIGEHBT//HBT | 6879 |
7746 | 1 | SIGEHBT//A AMA MICROELECT SCI TECHNOL//BIPOLAR TRANSISTORS | 1357 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SIGEHBT | authKW | 1846858 | 10% | 58% | 137 |
2 | A AMA MICROELECT SCI TECHNOL | address | 564478 | 4% | 48% | 51 |
3 | BIPOLAR TRANSISTORS | authKW | 431812 | 7% | 20% | 93 |
4 | MIXED MODE STRESS | authKW | 278684 | 1% | 100% | 12 |
5 | SIGE HETEROJUNCTION BIPOLAR TRANSISTOR | authKW | 237506 | 1% | 68% | 15 |
6 | SILICON GERMANIUM SIGE | authKW | 210682 | 3% | 26% | 35 |
7 | BASE TRANSIT TIME | authKW | 209007 | 1% | 75% | 12 |
8 | BASE RESISTANCE | authKW | 199592 | 1% | 45% | 19 |
9 | SIGE HETEROJUNCTION BIPOLAR TRANSISTORS HBTS | authKW | 188110 | 1% | 90% | 9 |
10 | HETEROJUNCTION BIPOLAR TRANSISTOR HBT | authKW | 159410 | 3% | 17% | 40 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 27118 | 81% | 0% | 1100 |
2 | Physics, Applied | 9947 | 55% | 0% | 742 |
3 | Physics, Condensed Matter | 2586 | 24% | 0% | 327 |
4 | Nuclear Science & Technology | 1219 | 9% | 0% | 127 |
5 | Nanoscience & Nanotechnology | 191 | 5% | 0% | 69 |
6 | Computer Science, Hardware & Architecture | 112 | 2% | 0% | 26 |
7 | Physics, Multidisciplinary | 108 | 6% | 0% | 79 |
8 | Materials Science, Coatings & Films | 48 | 2% | 0% | 25 |
9 | Materials Science, Multidisciplinary | 17 | 6% | 0% | 88 |
10 | Computer Science, Interdisciplinary Applications | 11 | 1% | 0% | 20 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | A AMA MICROELECT SCI TECHNOL | 564478 | 4% | 48% | 51 |
2 | MIKROELEKT ZENTRUM A | 92895 | 0% | 100% | 4 |
3 | PHYS THIN FILMS MAT ELECT LPCMME | 46447 | 0% | 100% | 2 |
4 | SMMC | 46447 | 0% | 100% | 2 |
5 | TSINGHUA INFORMAT TECHNOL | 34833 | 0% | 50% | 3 |
6 | MUSASHINO OFF | 34145 | 0% | 29% | 5 |
7 | ADVANCE TECHOL DEV | 23224 | 0% | 100% | 1 |
8 | AYUNDANRTE | 23224 | 0% | 100% | 1 |
9 | BIPOLAR DEVICE DESIGN MODELING | 23224 | 0% | 100% | 1 |
10 | CDMA FEM TEAM | 23224 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 149815 | 23% | 2% | 318 |
2 | SOLID-STATE ELECTRONICS | 108661 | 16% | 2% | 216 |
3 | IEEE ELECTRON DEVICE LETTERS | 17553 | 6% | 1% | 84 |
4 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 15937 | 8% | 1% | 108 |
5 | MICROELECTRONICS RELIABILITY | 4029 | 3% | 0% | 36 |
6 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2946 | 1% | 1% | 12 |
7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2865 | 2% | 0% | 32 |
8 | INTERNATIONAL JOURNAL OF ELECTRONICS | 2679 | 2% | 0% | 24 |
9 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2594 | 2% | 0% | 31 |
10 | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2389 | 0% | 2% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |