Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 893 | 2 | SIGE//STRAINED SI//GERMANIUM | 11547 |
| 7126 | 1 | STRAINED SI1 XGEX SI QUANTUM WELLS//SI GE INTERFACE//DIFFRACTOMETER OPTIMISATION | 1430 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | STRAINED SI1 XGEX SI QUANTUM WELLS | authKW | 88152 | 0% | 100% | 4 |
| 2 | SI GE INTERFACE | authKW | 70520 | 0% | 80% | 4 |
| 3 | DIFFRACTOMETER OPTIMISATION | authKW | 66114 | 0% | 100% | 3 |
| 4 | HIGH TECHNOL NEW BUSINESS SYST DEV GRP | address | 44076 | 0% | 100% | 2 |
| 5 | SEGREGANT ASSISTED GROWTH | authKW | 44076 | 0% | 100% | 2 |
| 6 | SI BASED NANOSTRUCTURES | authKW | 44076 | 0% | 100% | 2 |
| 7 | SI EFFUSION CELL | authKW | 44076 | 0% | 100% | 2 |
| 8 | SI SIGE SUPERLATTICE | authKW | 44076 | 0% | 100% | 2 |
| 9 | VOLTAGE CONTROLLED EMISSION WAVELENGTH SWITCH | authKW | 44076 | 0% | 100% | 2 |
| 10 | BAND STRUCTURE ENGINEERING | authKW | 31726 | 0% | 24% | 6 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 11573 | 57% | 0% | 819 |
| 2 | Physics, Condensed Matter | 8416 | 40% | 0% | 579 |
| 3 | Materials Science, Coatings & Films | 4500 | 13% | 0% | 187 |
| 4 | Materials Science, Multidisciplinary | 1335 | 24% | 0% | 342 |
| 5 | Engineering, Electrical & Electronic | 723 | 15% | 0% | 221 |
| 6 | Crystallography | 715 | 7% | 0% | 94 |
| 7 | Nanoscience & Nanotechnology | 452 | 7% | 0% | 101 |
| 8 | Physics, Multidisciplinary | 334 | 9% | 0% | 123 |
| 9 | Microscopy | 163 | 1% | 0% | 18 |
| 10 | Electrochemistry | 4 | 1% | 0% | 16 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | HIGH TECHNOL NEW BUSINESS SYST DEV GRP | 44076 | 0% | 100% | 2 |
| 2 | CEM2 ELE ON MICROOPTOELECT MONTPELLIER | 22038 | 0% | 100% | 1 |
| 3 | ENG IV | 22038 | 0% | 100% | 1 |
| 4 | FB ELEKT | 22038 | 0% | 100% | 1 |
| 5 | FOR UNGSZENTRUM ICHT IONENFOR | 22038 | 0% | 100% | 1 |
| 6 | FUKATSU GRP | 22038 | 0% | 100% | 1 |
| 7 | INFM CONDENSED MATTER THEORY | 22038 | 0% | 100% | 1 |
| 8 | INT RADIO PHYS ELECT | 22038 | 0% | 100% | 1 |
| 9 | ISGIT | 22038 | 0% | 100% | 1 |
| 10 | IST FIS G MARCONI CNR GRP NAZL STRUTTURA MAT | 22038 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 8938 | 6% | 0% | 83 |
| 2 | THIN SOLID FILMS | 7693 | 8% | 0% | 114 |
| 3 | APPLIED PHYSICS LETTERS | 7420 | 14% | 0% | 196 |
| 4 | JOURNAL OF CRYSTAL GROWTH | 5558 | 6% | 0% | 90 |
| 5 | SEMICONDUCTORS AND SEMIMETALS | 5029 | 1% | 2% | 11 |
| 6 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 4211 | 1% | 2% | 11 |
| 7 | PHYSICAL REVIEW B | 3711 | 12% | 0% | 173 |
| 8 | SUPERLATTICES AND MICROSTRUCTURES | 2953 | 2% | 0% | 30 |
| 9 | JOURNAL OF APPLIED PHYSICS | 2208 | 7% | 0% | 107 |
| 10 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1925 | 2% | 0% | 27 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |