Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 893 | 2 | SIGE//STRAINED SI//GERMANIUM | 11547 |
| 22953 | 1 | POLY SIGE//SIGE OXIDE//SILICON THIN FILM SOLAR CELL PROJECT | 385 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | POLY SIGE | authKW | 297105 | 4% | 26% | 14 |
| 2 | SIGE OXIDE | authKW | 184186 | 1% | 75% | 3 |
| 3 | SILICON THIN FILM SOLAR CELL PROJECT | address | 163722 | 1% | 100% | 2 |
| 4 | MEMS POST PROCESSING | authKW | 122789 | 1% | 50% | 3 |
| 5 | POLY SI1 XGEX | authKW | 122789 | 1% | 50% | 3 |
| 6 | AUGER PROFILE | authKW | 109147 | 1% | 67% | 2 |
| 7 | OXIDE STRUCTURE OF SILICON | authKW | 109147 | 1% | 67% | 2 |
| 8 | SIGE | authKW | 96820 | 10% | 3% | 39 |
| 9 | AE STZI SENSORTECHNOL ZENTRUM | address | 81861 | 0% | 100% | 1 |
| 10 | ALUMINIUM INTERCONNECTS | authKW | 81861 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 3346 | 59% | 0% | 228 |
| 2 | Materials Science, Coatings & Films | 1928 | 16% | 0% | 63 |
| 3 | Engineering, Electrical & Electronic | 1075 | 32% | 0% | 124 |
| 4 | Physics, Condensed Matter | 635 | 23% | 0% | 87 |
| 5 | Materials Science, Multidisciplinary | 368 | 24% | 0% | 93 |
| 6 | Nanoscience & Nanotechnology | 248 | 10% | 0% | 37 |
| 7 | Electrochemistry | 201 | 7% | 0% | 26 |
| 8 | Instruments & Instrumentation | 138 | 7% | 0% | 26 |
| 9 | Nuclear Science & Technology | 31 | 3% | 0% | 13 |
| 10 | Physics, Multidisciplinary | 29 | 6% | 0% | 22 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SILICON THIN FILM SOLAR CELL PROJECT | 163722 | 1% | 100% | 2 |
| 2 | AE STZI SENSORTECHNOL ZENTRUM | 81861 | 0% | 100% | 1 |
| 3 | ANALYT ELE ON MICROSCOPE | 81861 | 0% | 100% | 1 |
| 4 | CHEM ENGN MIC 110 | 81861 | 0% | 100% | 1 |
| 5 | DEVICE CHARACTERIZAT | 81861 | 0% | 100% | 1 |
| 6 | DEVICE TECH | 81861 | 0% | 100% | 1 |
| 7 | ELE ECE | 81861 | 0% | 100% | 1 |
| 8 | ELE ON ECE | 81861 | 0% | 100% | 1 |
| 9 | ENGN PARTICLE SCI TECHNOL MAT SCI ENG | 81861 | 0% | 100% | 1 |
| 10 | FV FLD CORP MICROSYST | 81861 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE ELECTRON DEVICE LETTERS | 2524 | 4% | 0% | 17 |
| 2 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1678 | 3% | 0% | 13 |
| 3 | MICROELECTRONIC ENGINEERING | 1529 | 4% | 0% | 14 |
| 4 | RADIATION EFFECTS LETTERS | 1478 | 1% | 1% | 2 |
| 5 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1379 | 6% | 0% | 23 |
| 6 | APPLIED PHYSICS LETTERS | 1249 | 11% | 0% | 42 |
| 7 | SOLID-STATE ELECTRONICS | 1163 | 3% | 0% | 12 |
| 8 | JOURNAL OF APPLIED PHYSICS | 1116 | 10% | 0% | 39 |
| 9 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | 1053 | 2% | 0% | 6 |
| 10 | THIN SOLID FILMS | 866 | 5% | 0% | 20 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | POLY SIGE | 297105 | 4% | 26% | 14 | Search POLY+SIGE | Search POLY+SIGE |
| 2 | SIGE OXIDE | 184186 | 1% | 75% | 3 | Search SIGE+OXIDE | Search SIGE+OXIDE |
| 3 | MEMS POST PROCESSING | 122789 | 1% | 50% | 3 | Search MEMS+POST+PROCESSING | Search MEMS+POST+PROCESSING |
| 4 | POLY SI1 XGEX | 122789 | 1% | 50% | 3 | Search POLY+SI1+XGEX | Search POLY+SI1+XGEX |
| 5 | AUGER PROFILE | 109147 | 1% | 67% | 2 | Search AUGER+PROFILE | Search AUGER+PROFILE |
| 6 | OXIDE STRUCTURE OF SILICON | 109147 | 1% | 67% | 2 | Search OXIDE+STRUCTURE+OF+SILICON | Search OXIDE+STRUCTURE+OF+SILICON |
| 7 | SIGE | 96820 | 10% | 3% | 39 | Search SIGE | Search SIGE |
| 8 | ALUMINIUM INTERCONNECTS | 81861 | 0% | 100% | 1 | Search ALUMINIUM+INTERCONNECTS | Search ALUMINIUM+INTERCONNECTS |
| 9 | ALUMINUM INTERCONNECTIONS | 81861 | 0% | 100% | 1 | Search ALUMINUM+INTERCONNECTIONS | Search ALUMINUM+INTERCONNECTIONS |
| 10 | AS IMPLANTED SILICON | 81861 | 0% | 100% | 1 | Search AS+IMPLANTED+SILICON | Search AS+IMPLANTED+SILICON |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |