Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
893 | 2 | SIGE//STRAINED SI//GERMANIUM | 11547 |
2006 | 1 | STRAINED SI//STRAINED SILICON//SIGE | 2431 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | STRAINED SI | authKW | 1326125 | 6% | 65% | 158 |
2 | STRAINED SILICON | authKW | 749449 | 4% | 54% | 107 |
3 | SIGE | authKW | 729533 | 11% | 21% | 269 |
4 | VIRTUAL SUBSTRATE | authKW | 328606 | 2% | 69% | 37 |
5 | SILICON NANOSCI | address | 288680 | 2% | 48% | 46 |
6 | SIGE ON INSULATOR | authKW | 225434 | 1% | 87% | 20 |
7 | GE CONDENSATION | authKW | 219860 | 1% | 81% | 21 |
8 | SGOI | authKW | 187173 | 1% | 76% | 19 |
9 | CRYSTAL SCI TECHNOL | address | 183412 | 2% | 26% | 54 |
10 | STRAIN RELAXATION | authKW | 180607 | 3% | 21% | 67 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 26993 | 66% | 0% | 1616 |
2 | Engineering, Electrical & Electronic | 8992 | 37% | 0% | 890 |
3 | Physics, Condensed Matter | 8852 | 32% | 0% | 787 |
4 | Materials Science, Coatings & Films | 5231 | 11% | 0% | 265 |
5 | Materials Science, Multidisciplinary | 2266 | 24% | 0% | 581 |
6 | Nanoscience & Nanotechnology | 882 | 7% | 0% | 182 |
7 | Crystallography | 268 | 3% | 0% | 84 |
8 | Physics, Multidisciplinary | 252 | 6% | 0% | 155 |
9 | Microscopy | 45 | 1% | 0% | 14 |
10 | Electrochemistry | 13 | 1% | 0% | 32 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SILICON NANOSCI | 288680 | 2% | 48% | 46 |
2 | CRYSTAL SCI TECHNOL | 183412 | 2% | 26% | 54 |
3 | ADV S | 159972 | 2% | 24% | 52 |
4 | WIDE BAND G SEMICOND MAT DEVICES | 86142 | 2% | 13% | 51 |
5 | INTEGRIERTE SYST | 37487 | 0% | 32% | 9 |
6 | HALBLEITERTECH | 35143 | 1% | 8% | 33 |
7 | PALAZ | 34565 | 0% | 67% | 4 |
8 | ADV LSI TECHNOL | 32705 | 1% | 11% | 24 |
9 | MICROELECT | 31351 | 9% | 1% | 209 |
10 | SILICON NANO SCI | 29626 | 0% | 57% | 4 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SOLID-STATE ELECTRONICS | 28680 | 6% | 2% | 149 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 25666 | 7% | 1% | 177 |
3 | IEEE ELECTRON DEVICE LETTERS | 19615 | 5% | 1% | 119 |
4 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 14219 | 4% | 1% | 95 |
5 | APPLIED PHYSICS LETTERS | 10378 | 12% | 0% | 303 |
6 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 9103 | 2% | 1% | 50 |
7 | THIN SOLID FILMS | 8860 | 7% | 0% | 160 |
8 | JOURNAL OF COMPUTATIONAL ELECTRONICS | 7015 | 1% | 2% | 25 |
9 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 5054 | 2% | 1% | 54 |
10 | JOURNAL OF APPLIED PHYSICS | 4672 | 8% | 0% | 202 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | STRAINED SI | 1326125 | 6% | 65% | 158 | Search STRAINED+SI | Search STRAINED+SI |
2 | STRAINED SILICON | 749449 | 4% | 54% | 107 | Search STRAINED+SILICON | Search STRAINED+SILICON |
3 | SIGE | 729533 | 11% | 21% | 269 | Search SIGE | Search SIGE |
4 | VIRTUAL SUBSTRATE | 328606 | 2% | 69% | 37 | Search VIRTUAL+SUBSTRATE | Search VIRTUAL+SUBSTRATE |
5 | SIGE ON INSULATOR | 225434 | 1% | 87% | 20 | Search SIGE+ON+INSULATOR | Search SIGE+ON+INSULATOR |
6 | GE CONDENSATION | 219860 | 1% | 81% | 21 | Search GE+CONDENSATION | Search GE+CONDENSATION |
7 | SGOI | 187173 | 1% | 76% | 19 | Search SGOI | Search SGOI |
8 | STRAIN RELAXATION | 180607 | 3% | 21% | 67 | Search STRAIN+RELAXATION | Search STRAIN+RELAXATION |
9 | MOBILITY ENHANCEMENT | 155776 | 1% | 48% | 25 | Search MOBILITY+ENHANCEMENT | Search MOBILITY+ENHANCEMENT |
10 | SILICON GERMANIUM | 140756 | 3% | 15% | 72 | Search SILICON+GERMANIUM | Search SILICON+GERMANIUM |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |