Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
893 | 2 | SIGE//STRAINED SI//GERMANIUM | 11547 |
20348 | 1 | CERAM PHYS//RIN//SINGLE WAFER FURNACE SWF | 487 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | CERAM PHYS | address | 1215412 | 14% | 28% | 67 |
2 | RIN | address | 374031 | 3% | 34% | 17 |
3 | SINGLE WAFER FURNACE SWF | authKW | 258861 | 1% | 100% | 4 |
4 | CONCENTRATED STRESS | authKW | 207087 | 1% | 80% | 4 |
5 | SUSCEPTOR BASED RTP | authKW | 194146 | 1% | 100% | 3 |
6 | ISOTHERMAL CAVITY | authKW | 129430 | 0% | 100% | 2 |
7 | UBM RELIABILITY | authKW | 129430 | 0% | 100% | 2 |
8 | TOP CUT STRESS LINER | authKW | 86286 | 0% | 67% | 2 |
9 | RAPID THERMAL PROCESSING RTP | authKW | 79636 | 2% | 15% | 8 |
10 | DAMASCENE GATE | authKW | 72801 | 1% | 38% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 4096 | 58% | 0% | 284 |
2 | Physics, Condensed Matter | 398 | 17% | 0% | 81 |
3 | Materials Science, Multidisciplinary | 396 | 23% | 0% | 110 |
4 | Nanoscience & Nanotechnology | 219 | 8% | 0% | 40 |
5 | Spectroscopy | 218 | 6% | 0% | 31 |
6 | Instruments & Instrumentation | 215 | 7% | 0% | 36 |
7 | Engineering, Electrical & Electronic | 191 | 14% | 0% | 68 |
8 | Materials Science, Ceramics | 139 | 4% | 0% | 18 |
9 | Materials Science, Coatings & Films | 126 | 4% | 0% | 20 |
10 | Materials Science, Characterization, Testing | 89 | 2% | 0% | 9 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | CERAM PHYS | 1215412 | 14% | 28% | 67 |
2 | RIN | 374031 | 3% | 34% | 17 |
3 | 3ME PME | 64715 | 0% | 100% | 1 |
4 | BUBAL EUB | 64715 | 0% | 100% | 1 |
5 | ELECT OPTOELECT GRP | 64715 | 0% | 100% | 1 |
6 | HIROSHIMA NEC LTD | 64715 | 0% | 100% | 1 |
7 | INTERDISCIPLINARY RUMENTAT | 64715 | 0% | 100% | 1 |
8 | LEHRSTUHL KONTINUUMSMECH MAT | 64715 | 0% | 100% | 1 |
9 | MIRAI NANOELECT | 64715 | 0% | 100% | 1 |
10 | NAZL MAT DISPOSITIVI MICROELETTRON MDM | 64715 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 5294 | 2% | 1% | 11 |
2 | JOURNAL OF APPLIED PHYSICS | 4209 | 17% | 0% | 84 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS | 2048 | 5% | 0% | 23 |
4 | JOURNAL OF RAMAN SPECTROSCOPY | 1833 | 3% | 0% | 13 |
5 | SPECTROSCOPY | 1649 | 1% | 1% | 5 |
6 | ECS SOLID STATE LETTERS | 1616 | 1% | 1% | 3 |
7 | JOURNAL OF SPECTROSCOPY | 1411 | 1% | 1% | 3 |
8 | APPLIED PHYSICS LETTERS | 1120 | 9% | 0% | 45 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 777 | 2% | 0% | 10 |
10 | SOLID STATE TECHNOLOGY | 549 | 1% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |