Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
174 | 2 | SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//VERTICAL CAVITY SURFACE EMITTING LASERS | 21466 |
33560 | 1 | STRAIN INDUCED OPTICAL WAVEGUIDE//DIEE INFM//FOURIER TRANSFORM FT METHOD | 137 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | STRAIN INDUCED OPTICAL WAVEGUIDE | authKW | 460102 | 1% | 100% | 2 |
2 | DIEE INFM | address | 414090 | 2% | 60% | 3 |
3 | FOURIER TRANSFORM FT METHOD | authKW | 306733 | 1% | 67% | 2 |
4 | OPTICAL WAVEGUIDE ANALYSIS | authKW | 258804 | 2% | 38% | 3 |
5 | APERIODIC WAVEGUIDE | authKW | 230051 | 1% | 100% | 1 |
6 | COBRA INTERUNIV COMMUN TECHNOL BASIC | address | 230051 | 1% | 100% | 1 |
7 | FABRY PEROT DIODE LASER | authKW | 230051 | 1% | 100% | 1 |
8 | FABRY PEROT FP LASER DIODES | authKW | 230051 | 1% | 100% | 1 |
9 | FABRY PEROT FP SEMICONDUCTOR LASER | authKW | 230051 | 1% | 100% | 1 |
10 | HAKKI PAOLI | authKW | 230051 | 1% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Optics | 1564 | 45% | 0% | 61 |
2 | Engineering, Electrical & Electronic | 1342 | 58% | 0% | 79 |
3 | Physics, Applied | 1095 | 57% | 0% | 78 |
4 | Telecommunications | 106 | 8% | 0% | 11 |
5 | Nanoscience & Nanotechnology | 86 | 9% | 0% | 13 |
6 | Physics, Condensed Matter | 1 | 4% | 0% | 5 |
7 | Engineering, General | 0 | 1% | 0% | 1 |
8 | Physics, Multidisciplinary | 0 | 2% | 0% | 3 |
9 | Crystallography | 0 | 1% | 0% | 1 |
10 | Spectroscopy | 0 | 1% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | DIEE INFM | 414090 | 2% | 60% | 3 |
2 | COBRA INTERUNIV COMMUN TECHNOL BASIC | 230051 | 1% | 100% | 1 |
3 | TELEMICROSCOPY | 184038 | 1% | 40% | 2 |
4 | SEMICOND PHOTON GRP | 73725 | 4% | 6% | 5 |
5 | MAT DEVICES GRP 3 5 | 57511 | 1% | 25% | 1 |
6 | DIEE | 51341 | 4% | 4% | 5 |
7 | COMMUN TECHNOL BASIC PLICAT | 46009 | 1% | 20% | 1 |
8 | KT 2 | 46009 | 1% | 20% | 1 |
9 | TYNDALL PHOTON GRP | 46009 | 1% | 20% | 1 |
10 | FED STATE ENTERPRISE | 38340 | 1% | 17% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE JOURNAL OF QUANTUM ELECTRONICS | 6863 | 12% | 0% | 16 |
2 | IEE PROCEEDINGS-J OPTOELECTRONICS | 4362 | 2% | 1% | 3 |
3 | MICROELECTRONICS RELIABILITY | 2521 | 7% | 0% | 9 |
4 | IEE PROCEEDINGS-OPTOELECTRONICS | 2501 | 2% | 0% | 3 |
5 | IEEE PHOTONICS TECHNOLOGY LETTERS | 2343 | 9% | 0% | 13 |
6 | ELECTRONICS LETTERS | 1663 | 12% | 0% | 17 |
7 | APPLIED PHYSICS LETTERS | 652 | 13% | 0% | 18 |
8 | JOURNAL OF LIGHTWAVE TECHNOLOGY | 456 | 4% | 0% | 5 |
9 | JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 351 | 1% | 0% | 1 |
10 | MICROELECTRONIC ENGINEERING | 349 | 3% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |