Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
1718 | 2 | IGBT//LDMOS//POWER MOSFET | 6942 |
19217 | 1 | SELF HEATING//CHARACTERISTIC THERMAL LENGTH//BALLASTING RESISTORS | 539 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SELF HEATING | authKW | 393332 | 11% | 11% | 61 |
2 | CHARACTERISTIC THERMAL LENGTH | authKW | 292358 | 1% | 100% | 5 |
3 | BALLASTING RESISTORS | authKW | 243630 | 1% | 83% | 5 |
4 | SELF HEATING EFFECT SHE | authKW | 233878 | 1% | 50% | 8 |
5 | ELECTROTHERMAL EFFECTS | authKW | 222320 | 3% | 22% | 17 |
6 | HEATSPREADER | authKW | 187108 | 1% | 80% | 4 |
7 | MULTIFINGER TRANSISTOR | authKW | 187108 | 1% | 80% | 4 |
8 | SILICON ON GLASS SOG | authKW | 187108 | 1% | 80% | 4 |
9 | THERMAL RESISTANCE | authKW | 171026 | 12% | 5% | 63 |
10 | SILICON GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTORS SIGE HBTS | authKW | 155922 | 1% | 67% | 4 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 11558 | 84% | 0% | 452 |
2 | Physics, Applied | 3170 | 49% | 0% | 266 |
3 | Physics, Condensed Matter | 297 | 14% | 0% | 76 |
4 | Engineering, Manufacturing | 210 | 4% | 0% | 20 |
5 | Nanoscience & Nanotechnology | 203 | 8% | 0% | 41 |
6 | Computer Science, Hardware & Architecture | 140 | 3% | 0% | 17 |
7 | Telecommunications | 62 | 4% | 0% | 19 |
8 | Computer Science, Interdisciplinary Applications | 18 | 2% | 0% | 12 |
9 | Materials Science, Multidisciplinary | 17 | 8% | 0% | 42 |
10 | Film, Radio, Television | 6 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MICROELECT COMPUTAT | 116943 | 0% | 100% | 2 |
2 | MICROELECT IXL | 77957 | 1% | 33% | 4 |
3 | ADV RELIABIL GRP | 58472 | 0% | 100% | 1 |
4 | BU MOBILE PERSONAL | 58472 | 0% | 100% | 1 |
5 | CHENEY MANOR | 58472 | 0% | 100% | 1 |
6 | COMMUN TCC | 58472 | 0% | 100% | 1 |
7 | CROLLES2 ALLIANCE RD | 58472 | 0% | 100% | 1 |
8 | DIPARTIMENTO INGN ELETTR DEIS | 58472 | 0% | 100% | 1 |
9 | EA PST VILLE AVRAY 4415 | 58472 | 0% | 100% | 1 |
10 | ENERGY SYST ENGN PROGRAM | 58472 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 55507 | 23% | 1% | 122 |
2 | SOLID-STATE ELECTRONICS | 21073 | 11% | 1% | 60 |
3 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 10161 | 3% | 1% | 15 |
4 | IEEE MICROWAVE AND GUIDED WAVE LETTERS | 6941 | 2% | 1% | 10 |
5 | IEEE ELECTRON DEVICE LETTERS | 4222 | 5% | 0% | 26 |
6 | MICROELECTRONICS RELIABILITY | 3471 | 4% | 0% | 21 |
7 | MICROELECTRONICS JOURNAL | 3327 | 3% | 0% | 15 |
8 | MICROWAVE JOURNAL | 2638 | 2% | 1% | 9 |
9 | JOURNAL OF ELECTRONIC PACKAGING | 2249 | 1% | 1% | 7 |
10 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1977 | 3% | 0% | 17 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |