Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
22158 | 1 | GAN ON DIAMOND//DEVICE THERMOG RELIABIL//BUILT IN POLARIZATION FIELD | 415 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | GAN ON DIAMOND | authKW | 341742 | 1% | 75% | 6 |
2 | DEVICE THERMOG RELIABIL | address | 313017 | 3% | 32% | 13 |
3 | BUILT IN POLARIZATION FIELD | authKW | 227830 | 1% | 100% | 3 |
4 | CHANNEL TEMPERATURE | authKW | 220916 | 2% | 36% | 8 |
5 | THERMAL BOUNDARY RESISTANCE TBR | authKW | 172593 | 1% | 45% | 5 |
6 | RAMAN THERMOGRAPHY | authKW | 170871 | 1% | 75% | 3 |
7 | GAN HETEROJUNCTION FIELD EFFECT TRANSISTORS HFETS | authKW | 151886 | 0% | 100% | 2 |
8 | GANHFETS | authKW | 151886 | 0% | 100% | 2 |
9 | GATE METAL THERMOMETRY | authKW | 151886 | 0% | 100% | 2 |
10 | QUASI MONOLITHIC INTEGRATION TECHNOLOGY | authKW | 151886 | 0% | 100% | 2 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3459 | 58% | 0% | 241 |
2 | Engineering, Electrical & Electronic | 2035 | 42% | 0% | 173 |
3 | Nanoscience & Nanotechnology | 301 | 10% | 0% | 42 |
4 | Physics, Condensed Matter | 294 | 16% | 0% | 65 |
5 | Materials Science, Multidisciplinary | 272 | 21% | 0% | 86 |
6 | Engineering, Manufacturing | 49 | 2% | 0% | 9 |
7 | Materials Science, Coatings & Films | 23 | 2% | 0% | 9 |
8 | Thermodynamics | 21 | 2% | 0% | 10 |
9 | Engineering, Mechanical | 8 | 2% | 0% | 10 |
10 | Physics, Multidisciplinary | 6 | 4% | 0% | 15 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | DEVICE THERMOG RELIABIL | 313017 | 3% | 32% | 13 |
2 | SEMICOND DEVICE RELIABIL PHYS | 151882 | 1% | 50% | 4 |
3 | DEF POWER BUSINESS UNIT | 101256 | 0% | 67% | 2 |
4 | GAAS | 101256 | 0% | 67% | 2 |
5 | CENT LILLECNRS | 75943 | 0% | 100% | 1 |
6 | COMMON TRT IEMN | 75943 | 0% | 100% | 1 |
7 | DIRECTORATE PHYS ELECT | 75943 | 0% | 100% | 1 |
8 | ELECT DEVICES CIRCUITS EBS | 75943 | 0% | 100% | 1 |
9 | ELECT SOLID STATE SCI PROGRAM | 75943 | 0% | 100% | 1 |
10 | EXPT SOLID STATE PHYS MATH COMP SCI 3 | 75943 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 8498 | 10% | 0% | 42 |
2 | MICROELECTRONICS RELIABILITY | 4521 | 5% | 0% | 21 |
3 | IEEE ELECTRON DEVICE LETTERS | 3931 | 5% | 0% | 22 |
4 | DIAMOND AND RELATED MATERIALS | 2293 | 4% | 0% | 15 |
5 | APPLIED PHYSICS LETTERS | 1519 | 12% | 0% | 48 |
6 | JOURNAL OF APPLIED PHYSICS | 1086 | 10% | 0% | 40 |
7 | SOLID-STATE ELECTRONICS | 1077 | 3% | 0% | 12 |
8 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 1071 | 1% | 0% | 4 |
9 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 933 | 1% | 0% | 4 |
10 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 842 | 1% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |