Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
71 | 1 | ALGAN GAN//CURRENT COLLAPSE//HIGH ELECTRON MOBILITY TRANSISTOR HEMT | 4644 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ALGAN GAN | authKW | 1620267 | 7% | 70% | 340 |
2 | CURRENT COLLAPSE | authKW | 725568 | 3% | 91% | 117 |
3 | HIGH ELECTRON MOBILITY TRANSISTOR HEMT | authKW | 680184 | 4% | 51% | 197 |
4 | HEMT | authKW | 642658 | 6% | 33% | 284 |
5 | ALGAN GAN HEMT | authKW | 597292 | 3% | 68% | 129 |
6 | GAN | authKW | 586931 | 14% | 13% | 662 |
7 | NORMALLY OFF | authKW | 460325 | 2% | 79% | 86 |
8 | HIGH ELECTRON MOBILITY TRANSISTORS | authKW | 455060 | 4% | 33% | 201 |
9 | HIGH ELECTRON MOBILITY TRANSISTORS HEMTS | authKW | 303427 | 2% | 54% | 83 |
10 | ALGAN | authKW | 275826 | 4% | 23% | 174 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 42153 | 60% | 0% | 2807 |
2 | Engineering, Electrical & Electronic | 27038 | 45% | 0% | 2097 |
3 | Physics, Condensed Matter | 5112 | 19% | 0% | 878 |
4 | Nanoscience & Nanotechnology | 2723 | 9% | 0% | 428 |
5 | Materials Science, Multidisciplinary | 2049 | 18% | 0% | 824 |
6 | Physics, Multidisciplinary | 703 | 7% | 0% | 339 |
7 | Materials Science, Coatings & Films | 329 | 2% | 0% | 111 |
8 | Crystallography | 152 | 2% | 0% | 102 |
9 | Optics | 2 | 2% | 0% | 88 |
10 | Electrochemistry | 2 | 1% | 0% | 41 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | WIDE BAND G SEMICOND MAT DEVICES | 156459 | 2% | 24% | 95 |
2 | PLICAT SPECIF INTEGRATED CIRCUIT A | 128485 | 1% | 76% | 25 |
3 | NANODEVICE SYST | 104485 | 1% | 36% | 43 |
4 | GAN DEVICE TECHNOL | 91704 | 1% | 52% | 26 |
5 | DISCRETE DEV TEAM | 75151 | 0% | 92% | 12 |
6 | IGBT PART | 75151 | 0% | 92% | 12 |
7 | SEMICOND FUS TECHNOL | 74631 | 0% | 100% | 11 |
8 | MICROELECT | 64738 | 9% | 2% | 415 |
9 | MILLIMETER WAVE ELECT GRP | 63595 | 0% | 63% | 15 |
10 | RCIQE | 54680 | 1% | 24% | 33 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 181733 | 11% | 5% | 499 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 53164 | 8% | 2% | 352 |
3 | SOLID-STATE ELECTRONICS | 26391 | 4% | 2% | 198 |
4 | APPLIED PHYSICS EXPRESS | 23168 | 2% | 3% | 115 |
5 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 20547 | 3% | 2% | 158 |
6 | APPLIED PHYSICS LETTERS | 20262 | 13% | 1% | 585 |
7 | MICROELECTRONICS RELIABILITY | 16091 | 3% | 2% | 133 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS | 11520 | 4% | 1% | 169 |
9 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 10612 | 4% | 1% | 182 |
10 | CHINESE PHYSICS B | 7537 | 2% | 1% | 109 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ALGAN GAN | 1620267 | 7% | 70% | 340 | Search ALGAN+GAN | Search ALGAN+GAN |
2 | CURRENT COLLAPSE | 725568 | 3% | 91% | 117 | Search CURRENT+COLLAPSE | Search CURRENT+COLLAPSE |
3 | HIGH ELECTRON MOBILITY TRANSISTOR HEMT | 680184 | 4% | 51% | 197 | Search HIGH+ELECTRON+MOBILITY+TRANSISTOR+HEMT | Search HIGH+ELECTRON+MOBILITY+TRANSISTOR+HEMT |
4 | HEMT | 642658 | 6% | 33% | 284 | Search HEMT | Search HEMT |
5 | ALGAN GAN HEMT | 597292 | 3% | 68% | 129 | Search ALGAN+GAN+HEMT | Search ALGAN+GAN+HEMT |
6 | GAN | 586931 | 14% | 13% | 662 | Search GAN | Search GAN |
7 | NORMALLY OFF | 460325 | 2% | 79% | 86 | Search NORMALLY+OFF | Search NORMALLY+OFF |
8 | HIGH ELECTRON MOBILITY TRANSISTORS | 455060 | 4% | 33% | 201 | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS |
9 | HIGH ELECTRON MOBILITY TRANSISTORS HEMTS | 303427 | 2% | 54% | 83 | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS+HEMTS | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS+HEMTS |
10 | ALGAN | 275826 | 4% | 23% | 174 | Search ALGAN | Search ALGAN |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |