Class information for:
Level 1: OHMIC CONTACT//P GAN//P TYPE GAN

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
195 3       GAN//GALLIUM NITRIDE//NITRIDES 53830
22 2             GAN//GALLIUM NITRIDE//INGAN 36458
10609 1                   OHMIC CONTACT//P GAN//P TYPE GAN 1078

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 OHMIC CONTACT authKW 960363 17% 18% 180
2 P GAN authKW 393455 4% 35% 39
3 P TYPE GAN authKW 228329 2% 46% 17
4 N GAN authKW 127097 1% 43% 10
5 SPECIFIC CONTACT RESISTANCE authKW 123062 2% 21% 20
6 GAN authKW 102023 12% 3% 133
7 TI AL NI AU authKW 87704 0% 100% 3
8 AUGER ELECTRON MICROSCOPY authKW 81643 1% 31% 9
9 SCHOTTKY BARRIER HEIGHT authKW 77121 3% 9% 28
10 I V AND C V TECHNIQUES authKW 65777 0% 75% 3

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Physics, Applied 13252 70% 0% 752
2 Physics, Condensed Matter 2147 25% 0% 265
3 Engineering, Electrical & Electronic 1983 27% 0% 288
4 Materials Science, Multidisciplinary 1596 29% 0% 313
5 Materials Science, Coatings & Films 1083 8% 0% 82
6 Nanoscience & Nanotechnology 478 8% 0% 88
7 Microscopy 132 1% 0% 14
8 Physics, Multidisciplinary 71 5% 0% 59
9 Electrochemistry 20 2% 0% 20
10 Crystallography 18 2% 0% 19

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ENIWA RD 58470 0% 100% 2
2 ARTIFICIAL MICROSTRUCT MESOSCOP PH 56215 0% 38% 5
3 CORP ADV TECHNOL GRP 56215 0% 38% 5
4 AG ELEKTR MAT 38978 0% 67% 2
5 CHIP DEV GRP 38970 1% 22% 6
6 ADVANCED PHOTONICS 29235 0% 100% 1
7 COMPONENT TECHNOL RADIAT BRANCH 29235 0% 100% 1
8 CRISMAT UMR 6508 CNRS 29235 0% 100% 1
9 ENGN ELE CHIKUSA KU 29235 0% 100% 1
10 EPITECH TECHNOL CORP 29235 0% 100% 1

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH 13153 1% 3% 15
2 JOURNAL OF ELECTRONIC MATERIALS 12322 6% 1% 66
3 APPLIED PHYSICS LETTERS 10072 18% 0% 197
4 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 6571 4% 1% 43
5 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 4458 5% 0% 51
6 SOLID-STATE ELECTRONICS 4399 4% 0% 39
7 JOURNAL OF APPLIED PHYSICS 3293 10% 0% 112
8 JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS 2987 1% 1% 8
9 ELECTROCHEMICAL AND SOLID STATE LETTERS 2704 2% 0% 20
10 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 2204 4% 0% 40

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 OHMIC CONTACT 960363 17% 18% 180 Search OHMIC+CONTACT Search OHMIC+CONTACT
2 P GAN 393455 4% 35% 39 Search P+GAN Search P+GAN
3 P TYPE GAN 228329 2% 46% 17 Search P+TYPE+GAN Search P+TYPE+GAN
4 N GAN 127097 1% 43% 10 Search N+GAN Search N+GAN
5 SPECIFIC CONTACT RESISTANCE 123062 2% 21% 20 Search SPECIFIC+CONTACT+RESISTANCE Search SPECIFIC+CONTACT+RESISTANCE
6 GAN 102023 12% 3% 133 Search GAN Search GAN
7 TI AL NI AU 87704 0% 100% 3 Search TI+AL+NI+AU Search TI+AL+NI+AU
8 AUGER ELECTRON MICROSCOPY 81643 1% 31% 9 Search AUGER+ELECTRON+MICROSCOPY Search AUGER+ELECTRON+MICROSCOPY
9 SCHOTTKY BARRIER HEIGHT 77121 3% 9% 28 Search SCHOTTKY+BARRIER+HEIGHT Search SCHOTTKY+BARRIER+HEIGHT
10 I V AND C V TECHNIQUES 65777 0% 75% 3 Search I+V+AND+C+V+TECHNIQUES Search I+V+AND+C+V+TECHNIQUES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1


rank cluster_id2 link
1 19124 SOCIOTECHNO SCI TECHNOL//MAT STUDY TESTING//NAT MAT STUDY TESTING
2 22197 DISORDER ACCUMULATION//PIXE CHANNELING//SB DOPED GE
3 26023 ALGAN GAN HBT//BULK GALLIUM NITRIDE GAN//BULK GAN SUBSTRATES
4 71 ALGAN GAN//CURRENT COLLAPSE//HIGH ELECTRON MOBILITY TRANSISTOR HEMT
5 10447 ULTRAVIOLET DETECTORS//PHOTODETECTORS//ALGAN
6 1789 LIGHT EXTRACTION EFFICIENCY//LIGHT EXTRACTION//LIGHT EMITTING DIODES
7 11995 GALLIUM NITRIDE//GAN0001//CAICISS
8 1572 GAN//YELLOW LUMINESCENCE//MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH
9 6323 OHMIC CONTACT//PD GE//SOLID PHASE REGROWTH
10 2197 SERIES RESISTANCE//BARRIER INHOMOGENEITY//IDEALITY FACTOR

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