Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
22197 | 1 | DISORDER ACCUMULATION//PIXE CHANNELING//SB DOPED GE | 413 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | DISORDER ACCUMULATION | authKW | 152622 | 0% | 100% | 2 |
2 | PIXE CHANNELING | authKW | 152622 | 0% | 100% | 2 |
3 | SB DOPED GE | authKW | 152622 | 0% | 100% | 2 |
4 | UV VISIBLE OPTICAL TRANSMISSION SPECTRUM | authKW | 152622 | 0% | 100% | 2 |
5 | DEFECT MICROSTRUCTURES | authKW | 137357 | 1% | 60% | 3 |
6 | GAN | authKW | 116709 | 21% | 2% | 88 |
7 | ALUMINIUM GALLIUM NITRIDE ALXGA1 XN | authKW | 76311 | 0% | 100% | 1 |
8 | ANNEAL CAP | authKW | 76311 | 0% | 100% | 1 |
9 | ANNEALING DONORS AND ACCEPTORS | authKW | 76311 | 0% | 100% | 1 |
10 | AU GAN SCHOTTKY CONTACT | authKW | 76311 | 0% | 100% | 1 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 2063 | 46% | 0% | 189 |
2 | Nuclear Science & Technology | 1936 | 20% | 0% | 84 |
3 | Physics, Nuclear | 1664 | 19% | 0% | 78 |
4 | Instruments & Instrumentation | 1373 | 19% | 0% | 77 |
5 | Physics, Condensed Matter | 868 | 25% | 0% | 104 |
6 | Physics, Atomic, Molecular & Chemical | 849 | 19% | 0% | 77 |
7 | Materials Science, Multidisciplinary | 467 | 26% | 0% | 107 |
8 | Engineering, Electrical & Electronic | 136 | 13% | 0% | 54 |
9 | Materials Science, Coatings & Films | 69 | 3% | 0% | 14 |
10 | Physics, Multidisciplinary | 25 | 5% | 0% | 22 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | AUSTRALIAN KEY MICROSCOPY MIROANAL | 76311 | 0% | 100% | 1 |
2 | CEA INAC MEM NRS | 76311 | 0% | 100% | 1 |
3 | COUNCIL POSTDOCTORAL FELLOW IDING | 76311 | 0% | 100% | 1 |
4 | ENSICAEN CEA CNRS | 76311 | 0% | 100% | 1 |
5 | ETUD RECH LASERS PLICAT SPE OCHIM | 76311 | 0% | 100% | 1 |
6 | FA FA IND DIST | 76311 | 0% | 100% | 1 |
7 | FAK PHYS H M621 | 76311 | 0% | 100% | 1 |
8 | FEI UK LTD | 76311 | 0% | 100% | 1 |
9 | IST ITN TECNOL NUCL | 76311 | 0% | 100% | 1 |
10 | SCI PLIQUEES CHERBOURG | 76311 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 44163 | 4% | 3% | 17 |
2 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 13436 | 18% | 0% | 75 |
3 | ELECTRONIC PRODUCTS MAGAZINE | 2933 | 0% | 4% | 1 |
4 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 1853 | 1% | 0% | 6 |
5 | JOURNAL OF APPLIED PHYSICS | 1729 | 12% | 0% | 50 |
6 | JOURNAL OF ELECTRONIC MATERIALS | 1649 | 4% | 0% | 15 |
7 | APPLIED PHYSICS LETTERS | 1217 | 10% | 0% | 43 |
8 | SEMICONDUCTORS | 1083 | 2% | 0% | 10 |
9 | RADIATION EFFECTS AND DEFECTS IN SOLIDS | 786 | 2% | 0% | 7 |
10 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 743 | 2% | 0% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |