Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
195 | 3 | GAN//GALLIUM NITRIDE//NITRIDES | 53830 |
22 | 2 | GAN//GALLIUM NITRIDE//INGAN | 36458 |
19124 | 1 | SOCIOTECHNO SCI TECHNOL//MAT STUDY TESTING//NAT MAT STUDY TESTING | 543 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | SOCIOTECHNO SCI TECHNOL | address | 438927 | 2% | 69% | 11 |
2 | MAT STUDY TESTING | address | 127797 | 3% | 16% | 14 |
3 | NAT MAT STUDY TESTING | address | 116082 | 0% | 100% | 2 |
4 | PHOTO ENHANCED WET ETCHING | authKW | 116082 | 0% | 100% | 2 |
5 | SEMICOND TECHNOL SCI | address | 116082 | 0% | 100% | 2 |
6 | SEMICONDUCTOR MEMBRANES | authKW | 116082 | 0% | 100% | 2 |
7 | TWO BODY INTERATOMIC POTENTIAL | authKW | 116082 | 0% | 100% | 2 |
8 | PHOTOELECTROCHEMICAL ETCHING | authKW | 101561 | 1% | 25% | 7 |
9 | GAN | authKW | 96983 | 17% | 2% | 92 |
10 | N GAN | authKW | 90838 | 1% | 26% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 6137 | 67% | 0% | 364 |
2 | Materials Science, Coatings & Films | 2921 | 17% | 0% | 92 |
3 | Engineering, Electrical & Electronic | 792 | 24% | 0% | 131 |
4 | Materials Science, Multidisciplinary | 773 | 29% | 0% | 155 |
5 | Physics, Condensed Matter | 744 | 21% | 0% | 113 |
6 | Nanoscience & Nanotechnology | 378 | 10% | 0% | 54 |
7 | Electrochemistry | 153 | 5% | 0% | 28 |
8 | Physics, Multidisciplinary | 9 | 4% | 0% | 20 |
9 | Crystallography | 7 | 2% | 0% | 9 |
10 | Microscopy | 3 | 0% | 0% | 2 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SOCIOTECHNO SCI TECHNOL | 438927 | 2% | 69% | 11 |
2 | MAT STUDY TESTING | 127797 | 3% | 16% | 14 |
3 | NAT MAT STUDY TESTING | 116082 | 0% | 100% | 2 |
4 | SEMICOND TECHNOL SCI | 116082 | 0% | 100% | 2 |
5 | COBRA INTERUNIV COMMUN TECHNOL | 84418 | 1% | 36% | 4 |
6 | ELECT ENGN NANOTECHNOL | 70764 | 2% | 12% | 10 |
7 | ABT OPRTOELEKTRON | 58041 | 0% | 100% | 1 |
8 | ARMAMENT TECH PROD | 58041 | 0% | 100% | 1 |
9 | CHUNG CHENG TEHNOL | 58041 | 0% | 100% | 1 |
10 | DOT METR TECHNOL | 58041 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 29746 | 3% | 3% | 16 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 7142 | 8% | 0% | 42 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3955 | 6% | 0% | 34 |
4 | JOURNAL OF ELECTRONIC MATERIALS | 2957 | 4% | 0% | 23 |
5 | GEC JOURNAL OF TECHNOLOGY | 2320 | 0% | 4% | 1 |
6 | SOLID-STATE ELECTRONICS | 2072 | 3% | 0% | 19 |
7 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1997 | 3% | 0% | 16 |
8 | APPLIED PHYSICS LETTERS | 1935 | 11% | 0% | 62 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1373 | 3% | 0% | 14 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS | 1244 | 3% | 0% | 19 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PHOTO ENHANCED WET ETCHING | 116082 | 0% | 100% | 2 | Search PHOTO+ENHANCED+WET+ETCHING | Search PHOTO+ENHANCED+WET+ETCHING |
2 | SEMICONDUCTOR MEMBRANES | 116082 | 0% | 100% | 2 | Search SEMICONDUCTOR+MEMBRANES | Search SEMICONDUCTOR+MEMBRANES |
3 | TWO BODY INTERATOMIC POTENTIAL | 116082 | 0% | 100% | 2 | Search TWO+BODY+INTERATOMIC+POTENTIAL | Search TWO+BODY+INTERATOMIC+POTENTIAL |
4 | PHOTOELECTROCHEMICAL ETCHING | 101561 | 1% | 25% | 7 | Search PHOTOELECTROCHEMICAL+ETCHING | Search PHOTOELECTROCHEMICAL+ETCHING |
5 | GAN | 96983 | 17% | 2% | 92 | Search GAN | Search GAN |
6 | N GAN | 90838 | 1% | 26% | 6 | Search N+GAN | Search N+GAN |
7 | GALLIUM HYDROXIDE | 77386 | 0% | 67% | 2 | Search GALLIUM+HYDROXIDE | Search GALLIUM+HYDROXIDE |
8 | TWICE DEPOSITED MASK | 77386 | 0% | 67% | 2 | Search TWICE+DEPOSITED+MASK | Search TWICE+DEPOSITED+MASK |
9 | DRY ETCHING | 60895 | 4% | 5% | 22 | Search DRY+ETCHING | Search DRY+ETCHING |
10 | 1100 PLANE | 58041 | 0% | 100% | 1 | Search 1100+PLANE | Search 1100+PLANE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |