Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | FUJIMI KU | address | 163498 | 1% | 100% | 8 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 140152 | 22% | 2% | 339 |
3 | DRY ETCHING | authKW | 110742 | 3% | 11% | 50 |
4 | REACTIVE ION BEAM ETCHING | authKW | 84069 | 1% | 34% | 12 |
5 | GAAS OXIDE | authKW | 65397 | 0% | 80% | 4 |
6 | IN SITU EB LITHOGRAPHY | authKW | 61312 | 0% | 100% | 3 |
7 | INSITU PROCESS | authKW | 61312 | 0% | 100% | 3 |
8 | ECR RIBE | authKW | 46710 | 0% | 57% | 4 |
9 | NANO TECHNOL PLICAT | address | 45982 | 0% | 75% | 3 |
10 | SOLID SOURCE | authKW | 45982 | 0% | 75% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 19454 | 71% | 0% | 1089 |
2 | Nanoscience & Nanotechnology | 8102 | 25% | 0% | 391 |
3 | Engineering, Electrical & Electronic | 6846 | 40% | 0% | 614 |
4 | Materials Science, Coatings & Films | 5073 | 13% | 0% | 206 |
5 | Physics, Condensed Matter | 1373 | 17% | 0% | 266 |
6 | Electrochemistry | 357 | 5% | 0% | 73 |
7 | Materials Science, Multidisciplinary | 222 | 12% | 0% | 184 |
8 | Optics | 82 | 5% | 0% | 70 |
9 | Chemistry, Physical | 43 | 7% | 0% | 108 |
10 | Physics, Fluids & Plasmas | 32 | 2% | 0% | 26 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | FUJIMI KU | 163498 | 1% | 100% | 8 |
2 | NANO TECHNOL PLICAT | 45982 | 0% | 75% | 3 |
3 | IMAGING ADV NANOTECHNOL | 40874 | 0% | 100% | 2 |
4 | SEMICOND MEMS PROC | 31889 | 1% | 20% | 8 |
5 | NANO ENG | 27248 | 0% | 67% | 2 |
6 | BIOMAT ANAL | 22988 | 0% | 38% | 3 |
7 | PLASMAS COUCHES MINCES | 22945 | 1% | 11% | 10 |
8 | FESTKORPERPHYS LOTHARSTR | 20437 | 0% | 100% | 1 |
9 | GENE PHYS | 20437 | 0% | 100% | 1 |
10 | IONENSTRAHLTECH | 20437 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 140152 | 22% | 2% | 339 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 8620 | 5% | 1% | 78 |
3 | APPLIED PHYSICS LETTERS | 3946 | 10% | 0% | 150 |
4 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 3590 | 5% | 0% | 75 |
5 | SOLID-STATE ELECTRONICS | 3546 | 3% | 0% | 42 |
6 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 3342 | 5% | 0% | 72 |
7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 3190 | 2% | 0% | 36 |
8 | PLASMA CHEMISTRY AND PLASMA PROCESSING | 3057 | 1% | 1% | 15 |
9 | MICROELECTRONIC ENGINEERING | 2940 | 3% | 0% | 39 |
10 | VACUUM | 2372 | 2% | 0% | 34 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | DRY ETCHING | 110742 | 3% | 11% | 50 | Search DRY+ETCHING | Search DRY+ETCHING |
2 | REACTIVE ION BEAM ETCHING | 84069 | 1% | 34% | 12 | Search REACTIVE+ION+BEAM+ETCHING | Search REACTIVE+ION+BEAM+ETCHING |
3 | GAAS OXIDE | 65397 | 0% | 80% | 4 | Search GAAS+OXIDE | Search GAAS+OXIDE |
4 | IN SITU EB LITHOGRAPHY | 61312 | 0% | 100% | 3 | Search IN+SITU+EB+LITHOGRAPHY | Search IN+SITU+EB+LITHOGRAPHY |
5 | INSITU PROCESS | 61312 | 0% | 100% | 3 | Search INSITU+PROCESS | Search INSITU+PROCESS |
6 | ECR RIBE | 46710 | 0% | 57% | 4 | Search ECR+RIBE | Search ECR+RIBE |
7 | SOLID SOURCE | 45982 | 0% | 75% | 3 | Search SOLID+SOURCE | Search SOLID+SOURCE |
8 | AS VACANCY | 40874 | 0% | 100% | 2 | Search AS+VACANCY | Search AS+VACANCY |
9 | BCL3 N 2 | 40874 | 0% | 100% | 2 | Search BCL3+N+2 | Search BCL3+N+2 |
10 | CL 2 XE | 40874 | 0% | 100% | 2 | Search CL+2+XE | Search CL+2+XE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |