Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | POST ETCHING TREATMENTS | authKW | 150796 | 0% | 100% | 2 |
| 2 | 111 SPLIT INTERSTITIAL | authKW | 75398 | 0% | 100% | 1 |
| 3 | AL1 WT PERCENT SI | authKW | 75398 | 0% | 100% | 1 |
| 4 | B DEACTIVATION | authKW | 75398 | 0% | 100% | 1 |
| 5 | C AND O RELATED DEFECTS | authKW | 75398 | 0% | 100% | 1 |
| 6 | CARBON CPDS CONTAINING HETEROATOM | address | 75398 | 0% | 100% | 1 |
| 7 | CDE WITH NF3 GAS | authKW | 75398 | 0% | 100% | 1 |
| 8 | CIRCUIT TECHNOL DEV | address | 75398 | 0% | 100% | 1 |
| 9 | CURRENT TRANSPORT IN METAL SEMICONDUCTOR INTERFACE | authKW | 75398 | 0% | 100% | 1 |
| 10 | DONOR LIKE DEFECTS | authKW | 75398 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 3710 | 60% | 0% | 250 |
| 2 | Materials Science, Coatings & Films | 3194 | 20% | 0% | 84 |
| 3 | Physics, Condensed Matter | 749 | 23% | 0% | 98 |
| 4 | Electrochemistry | 662 | 11% | 0% | 47 |
| 5 | Engineering, Electrical & Electronic | 433 | 21% | 0% | 87 |
| 6 | Nanoscience & Nanotechnology | 197 | 8% | 0% | 35 |
| 7 | Materials Science, Multidisciplinary | 114 | 15% | 0% | 62 |
| 8 | Nuclear Science & Technology | 40 | 4% | 0% | 15 |
| 9 | Instruments & Instrumentation | 16 | 3% | 0% | 12 |
| 10 | Physics, Nuclear | 9 | 2% | 0% | 9 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | CARBON CPDS CONTAINING HETEROATOM | 75398 | 0% | 100% | 1 |
| 2 | CIRCUIT TECHNOL DEV | 75398 | 0% | 100% | 1 |
| 3 | INNOVAT MAT DEV ISOHARA PLANT | 75398 | 0% | 100% | 1 |
| 4 | INTERDISCIPLINARY MAT PROGRAM | 75398 | 0% | 100% | 1 |
| 5 | JUNGWON GU | 75398 | 0% | 100% | 1 |
| 6 | SEMICONDUCTOR MFG EQUIPMENT | 75398 | 0% | 100% | 1 |
| 7 | ELE MAT DEVICES | 37698 | 0% | 50% | 1 |
| 8 | SEMICONDUCTOR BUSINESS UNIT | 37698 | 0% | 50% | 1 |
| 9 | SEMICONDUCTOR TECHNOL DEV GRP | 37698 | 0% | 50% | 1 |
| 10 | NANO DEVICE ELE | 25131 | 0% | 33% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 5385 | 11% | 0% | 47 |
| 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 4283 | 7% | 0% | 31 |
| 3 | JOURNAL OF APPLIED PHYSICS | 2234 | 14% | 0% | 57 |
| 4 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2089 | 5% | 0% | 20 |
| 5 | PHYSICS OF METALS | 1729 | 0% | 1% | 2 |
| 6 | SOLID-STATE ELECTRONICS | 1257 | 3% | 0% | 13 |
| 7 | SOLID STATE PHENOMENA | 1222 | 1% | 0% | 6 |
| 8 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1009 | 2% | 0% | 10 |
| 9 | SOLID STATE TECHNOLOGY | 1004 | 1% | 0% | 5 |
| 10 | IEEE ELECTRON DEVICE LETTERS | 795 | 2% | 0% | 10 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |