Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 553 | 3 | BETA FESI2//SILICIDES//ERBIUM | 18376 |
| 685 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 13508 |
| 30846 | 1 | CROSS KELVIN RESISTOR CKR//CROSS BRIDGE KELVIN RESISTOR CBKR//POLYMETAL GATE | 177 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | CROSS KELVIN RESISTOR CKR | authKW | 712247 | 2% | 100% | 4 |
| 2 | CROSS BRIDGE KELVIN RESISTOR CBKR | authKW | 569796 | 2% | 80% | 4 |
| 3 | POLYMETAL GATE | authKW | 400637 | 2% | 75% | 3 |
| 4 | CROSS BRIDGE KELVIN RESISTORS | authKW | 356123 | 1% | 100% | 2 |
| 5 | DIFFUSION BARRIER METAL | authKW | 356123 | 1% | 100% | 2 |
| 6 | DUAL POLYMETAL GATE | authKW | 356123 | 1% | 100% | 2 |
| 7 | LOW RESISTIVITY TUNGSTEN | authKW | 356123 | 1% | 100% | 2 |
| 8 | POLYMETAL | authKW | 237414 | 1% | 67% | 2 |
| 9 | ADV ASSEMBLY PROC TECHNOL AD T | address | 178062 | 1% | 100% | 1 |
| 10 | AL2O3 AND HFO2 | authKW | 178062 | 1% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 2352 | 67% | 0% | 118 |
| 2 | Physics, Applied | 2049 | 68% | 0% | 120 |
| 3 | Materials Science, Coatings & Films | 329 | 10% | 0% | 18 |
| 4 | Nanoscience & Nanotechnology | 183 | 12% | 0% | 21 |
| 5 | Physics, Condensed Matter | 118 | 15% | 0% | 27 |
| 6 | Engineering, Manufacturing | 79 | 4% | 0% | 7 |
| 7 | Electrochemistry | 77 | 6% | 0% | 11 |
| 8 | Materials Science, Multidisciplinary | 37 | 14% | 0% | 24 |
| 9 | Instruments & Instrumentation | 24 | 5% | 0% | 8 |
| 10 | Engineering, Industrial | 12 | 2% | 0% | 3 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ADV ASSEMBLY PROC TECHNOL AD T | 178062 | 1% | 100% | 1 |
| 2 | CHAIR SEMICOND CPDS | 178062 | 1% | 100% | 1 |
| 3 | DR TEAMS | 178062 | 1% | 100% | 1 |
| 4 | MODULE TECHNOL DEV | 178062 | 1% | 100% | 1 |
| 5 | OVENS | 178062 | 1% | 100% | 1 |
| 6 | SEMICOND PROC PROGRAM | 178062 | 1% | 100% | 1 |
| 7 | TRANSMISS DEVICE RD | 178062 | 1% | 100% | 1 |
| 8 | PHYS ENERGY HARVEST | 89030 | 1% | 50% | 1 |
| 9 | TAIWAN SEMICOND MFG CO | 89030 | 1% | 50% | 1 |
| 10 | MEMORY RD | 63296 | 5% | 4% | 8 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 21004 | 24% | 0% | 43 |
| 2 | IEEE ELECTRON DEVICE LETTERS | 5531 | 10% | 0% | 17 |
| 3 | SHARP TECHNICAL JOURNAL | 4341 | 1% | 2% | 1 |
| 4 | MICROELECTRONICS RELIABILITY | 1175 | 4% | 0% | 7 |
| 5 | SOLID-STATE ELECTRONICS | 1131 | 5% | 0% | 8 |
| 6 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 997 | 2% | 0% | 3 |
| 7 | ALTA FREQUENZA | 982 | 1% | 1% | 1 |
| 8 | SOLID STATE PHENOMENA | 723 | 2% | 0% | 3 |
| 9 | CIRP ANNALS-MANUFACTURING TECHNOLOGY | 658 | 2% | 0% | 3 |
| 10 | ELECTRON DEVICE LETTERS | 590 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |