Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | HIGH SIDE | authKW | 718103 | 4% | 60% | 6 |
2 | MINIMUM ACCELERATION LENGTH | authKW | 598423 | 2% | 100% | 3 |
3 | RETARDED LANGEVIN EQUATION RLE | authKW | 598423 | 2% | 100% | 3 |
4 | ULTRASHALLOW JUNCTIONS | authKW | 598417 | 4% | 50% | 6 |
5 | BCDMOS | authKW | 453346 | 3% | 45% | 5 |
6 | BORON CHEMICAL VAPOR DEPOSITION | authKW | 398949 | 1% | 100% | 2 |
7 | CENTER CHANNEL OPERATION | authKW | 398949 | 1% | 100% | 2 |
8 | DIBORANE B2H6 | authKW | 398949 | 1% | 100% | 2 |
9 | GE DIODES | authKW | 398949 | 1% | 100% | 2 |
10 | HIGH OHMIC RESISTORS | authKW | 398949 | 1% | 100% | 2 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 1294 | 58% | 0% | 91 |
2 | Materials Science, Coatings & Films | 331 | 11% | 0% | 17 |
3 | Engineering, Electrical & Electronic | 319 | 28% | 0% | 44 |
4 | Physics, Condensed Matter | 300 | 24% | 0% | 38 |
5 | Nanoscience & Nanotechnology | 115 | 10% | 0% | 16 |
6 | Instruments & Instrumentation | 89 | 8% | 0% | 13 |
7 | Nuclear Science & Technology | 59 | 6% | 0% | 10 |
8 | Physics, Multidisciplinary | 56 | 10% | 0% | 16 |
9 | Physics, Nuclear | 47 | 6% | 0% | 9 |
10 | Materials Science, Multidisciplinary | 36 | 14% | 0% | 22 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | F ALLGEMEINE PHYS | 199474 | 1% | 100% | 1 |
2 | SILICON DEVICE INTEGRAT GRP | 199474 | 1% | 100% | 1 |
3 | ZEMRIS | 199474 | 1% | 100% | 1 |
4 | ITRC COMPUTAT ELECT | 99736 | 1% | 50% | 1 |
5 | ECTM DIMES | 99732 | 2% | 17% | 3 |
6 | SIMULAT SCI | 59358 | 3% | 6% | 5 |
7 | ELECT ENGN EWI | 49867 | 1% | 25% | 1 |
8 | MICRO SENSOR SYST | 42547 | 3% | 5% | 4 |
9 | ADV LSI TECHNOL S | 39893 | 1% | 20% | 1 |
10 | MICROELECT CHALMERS | 33244 | 1% | 17% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2489 | 9% | 0% | 14 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 2134 | 8% | 0% | 13 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 763 | 7% | 0% | 11 |
4 | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 758 | 5% | 0% | 8 |
5 | SOLID-STATE ELECTRONICS | 711 | 4% | 0% | 6 |
6 | JOURNAL OF COMPUTATIONAL ELECTRONICS | 692 | 1% | 0% | 2 |
7 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 671 | 3% | 0% | 5 |
8 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 538 | 1% | 0% | 2 |
9 | IEEE ELECTRON DEVICE LETTERS | 529 | 3% | 0% | 5 |
10 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 494 | 6% | 0% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |