Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
396 | 3 | LEAD FREE SOLDER//SOLDER//ELECTROMIGRATION | 32184 |
1011 | 2 | ATOMIC LAYER DEPOSITION//DIFFUSION BARRIER//CU METALLIZATION | 10645 |
14190 | 1 | CVD W//BLANKET TUNGSTEN//TUNGSTEN THIN FILMS | 817 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | CVD W | authKW | 224431 | 1% | 73% | 8 |
2 | BLANKET TUNGSTEN | authKW | 115725 | 0% | 100% | 3 |
3 | TUNGSTEN THIN FILMS | authKW | 115725 | 0% | 100% | 3 |
4 | CVD IRON | authKW | 77150 | 0% | 100% | 2 |
5 | EFFECTIVE REACTIVITY MAP | authKW | 77150 | 0% | 100% | 2 |
6 | FOCUS NEW YORK RENSSELAER INTERCONNECT GIGASC | address | 77150 | 0% | 100% | 2 |
7 | REACTOR SCALE MODEL | authKW | 77150 | 0% | 100% | 2 |
8 | SUBMICROMETER TRENCHES | authKW | 77150 | 0% | 100% | 2 |
9 | FOCUS NEW YORK | address | 59057 | 1% | 22% | 7 |
10 | BEREICH BAUELEMENTETECHNOL | address | 57859 | 0% | 50% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 25554 | 40% | 0% | 328 |
2 | Physics, Applied | 7679 | 61% | 0% | 502 |
3 | Physics, Condensed Matter | 2195 | 28% | 0% | 230 |
4 | Electrochemistry | 1932 | 14% | 0% | 111 |
5 | Materials Science, Multidisciplinary | 939 | 26% | 0% | 213 |
6 | Engineering, Electrical & Electronic | 580 | 18% | 0% | 145 |
7 | Nanoscience & Nanotechnology | 504 | 9% | 0% | 77 |
8 | Chemistry, Physical | 110 | 11% | 0% | 89 |
9 | Metallurgy & Metallurgical Engineering | 35 | 3% | 0% | 26 |
10 | Engineering, Manufacturing | 8 | 1% | 0% | 7 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | FOCUS NEW YORK RENSSELAER INTERCONNECT GIGASC | 77150 | 0% | 100% | 2 |
2 | FOCUS NEW YORK | 59057 | 1% | 22% | 7 |
3 | BEREICH BAUELEMENTETECHNOL | 57859 | 0% | 50% | 3 |
4 | GEN PHYS LASER SPECT | 43393 | 0% | 38% | 3 |
5 | ABT MA INENBAU HBEREICH INGN WISSEN | 38575 | 0% | 100% | 1 |
6 | ALLGEMEINE ELEKTROTECH QUANTENELEKT | 38575 | 0% | 100% | 1 |
7 | AUSTRALIAN KEY MICROSCOPY MICROANAAL | 38575 | 0% | 100% | 1 |
8 | CHEM REACTOR TECHNOL | 38575 | 0% | 100% | 1 |
9 | CNRSURA 0022 | 38575 | 0% | 100% | 1 |
10 | CNS TCS | 38575 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 12742 | 12% | 0% | 101 |
2 | THIN SOLID FILMS | 8272 | 11% | 0% | 89 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 6439 | 6% | 0% | 49 |
4 | SOLID STATE TECHNOLOGY | 5280 | 2% | 1% | 16 |
5 | APPLIED SURFACE SCIENCE | 4255 | 8% | 0% | 64 |
6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3621 | 5% | 0% | 40 |
7 | CHEMICAL VAPOR DEPOSITION | 3126 | 1% | 1% | 9 |
8 | MICROELECTRONIC ENGINEERING | 1314 | 2% | 0% | 19 |
9 | JOURNAL OF THE INSTITUTE OF ENVIRONMENTAL SCIENCES | 1167 | 0% | 3% | 1 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 928 | 3% | 0% | 28 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CVD W | 224431 | 1% | 73% | 8 | Search CVD+W | Search CVD+W |
2 | BLANKET TUNGSTEN | 115725 | 0% | 100% | 3 | Search BLANKET+TUNGSTEN | Search BLANKET+TUNGSTEN |
3 | TUNGSTEN THIN FILMS | 115725 | 0% | 100% | 3 | Search TUNGSTEN+THIN+FILMS | Search TUNGSTEN+THIN+FILMS |
4 | CVD IRON | 77150 | 0% | 100% | 2 | Search CVD+IRON | Search CVD+IRON |
5 | EFFECTIVE REACTIVITY MAP | 77150 | 0% | 100% | 2 | Search EFFECTIVE+REACTIVITY+MAP | Search EFFECTIVE+REACTIVITY+MAP |
6 | REACTOR SCALE MODEL | 77150 | 0% | 100% | 2 | Search REACTOR+SCALE+MODEL | Search REACTOR+SCALE+MODEL |
7 | SUBMICROMETER TRENCHES | 77150 | 0% | 100% | 2 | Search SUBMICROMETER+TRENCHES | Search SUBMICROMETER+TRENCHES |
8 | FEATURE SCALE | 57859 | 0% | 50% | 3 | Search FEATURE+SCALE | Search FEATURE+SCALE |
9 | TUNGSTEN FILMS | 57859 | 0% | 50% | 3 | Search TUNGSTEN+FILMS | Search TUNGSTEN+FILMS |
10 | SINGLE WAFER REACTOR | 51432 | 0% | 67% | 2 | Search SINGLE+WAFER+REACTOR | Search SINGLE+WAFER+REACTOR |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |